Shravan K. Chaganti

26 papers A 4B 2C 4Misc 4Journal 7Unranked 5
YearRankTypeTitle / Venue / Authors
2024 J jnl
A BIST Approach to Approximate Co-Testing of Embedded Data Converters.
IEEE Des. Test
Kushagra Bhatheja, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen
2023 J jnl
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing.
J. Electron. Test.
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2023 — conf
An Improved Single-Temperature Trim Technique for 1
MWSCAS
Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger, Shravan K. Chaganti, Dhyey Desai, Jerry Doorenbos, Jim Todsen
2023 J jnl
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction.
IEEE Des. Test
Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 J jnl
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing.
J. Electron. Test.
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 — conf
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing.
DFT
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 B conf
Graph Theory Approach for Multi-site ATE Board Parameter Extraction.
ETS
Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 A conf
Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing.
ITC
Kushagra Bhatheja, Shravan K. Chaganti, Degang Chen, Xiankun Robert Jin, Chris C. Dao, Juxiang Ren, Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R. Knight, Allan Dobbin, Scott W. Herrin, Doug Garrity
2022 A conf
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing.
ITC
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 Misc conf
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing.
VTS
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021 B conf
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study.
ETS
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021 J jnl
Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing.
IEEE Trans. Instrum. Meas.
Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021 — conf
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation.
DTIS
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021 A conf
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing.
ITC
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2020 J jnl
An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method.
IEEE Trans. Instrum. Meas.
Tao Chen, Chulhyun Park, Shravan K. Chaganti, José Silva-Martínez, Randall L. Geiger, Degang Chen
2020 Misc conf
Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing.
VTS
Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2018 C conf
A low-cost jitter separation and ADC spectral testing method without requiring coherent sampling.
ISCAS
Shravan K. Chaganti, Li Xu, Degang Chen
2018 C conf
Concurrent Sampling with Local Digitization - An Alternative to Analog Test Bus.
ISCAS
Nanqi Liu, Shravan K. Chaganti, Zhiqiang Liu, Degang Chen, Amitava Majumdar
2018 A conf
Fast and accurate linearity test for DACs with various architectures using segmented models.
ITC
Shravan K. Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal, Degang Chen
2018 J jnl
Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit.
IEEE Trans. Circuits Syst. I Regul. Pap.
Zhiqiang Liu, Shravan K. Chaganti, Degang Chen
2018 — conf
Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME).
I2MTC
Shravan K. Chaganti, Tao Chen, Yuming Zhuang, Degang Chen
2017 C conf
A digital clock-less pulse stretcher with application in deep sub-nanosecond pulse detection.
ISCAS
Zhiqiang Liu, Nanqi Liu, Shravan K. Chaganti, Degang Chen, Amitava Majumdar
2017 Misc conf
A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter.
VTS
Shravan K. Chaganti, Li Xu, Degang Chen
2016 Misc conf
Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise.
VTS
Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen
2016 C conf
Toward complete analog fault coverage with minimal observation points using a fault propagation graph.
ISCAS
Zhiqiang Liu, Shravan K. Chaganti, Degang Chen
2015 — conf
Effect of flicker noise on SEIR for accurate ADC linearity testing.
MWSCAS
Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen