| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2026 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
ACM Trans. Graph.
|
| 2024 | — | conf |
SIGGRAPH (Conference Paper Track)
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Comput. Appl. Math.
|
| 2023 | J | jnl |
Sensors
|
| 2023 | J | jnl |
Math. Comput. Simul.
|
| 2023 | A* | conf |
ACM Multimedia
|
| 2023 | J | jnl |
CoRR
|
| 2022 | — | conf |
ACIT
|
| 2022 | — | conf |
ACIT
|
| 2022 | J | jnl |
Neurocomputing
|
| 2022 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
Mob. Inf. Syst.
|
| 2019 | — | conf |
ACIT
|
| 2019 | — | conf |
ACIT
|
| 2016 | J | jnl |
Int. J. Comput. Sci. Eng.
|
| 2015 | — | conf |
ICIG (3)
|
| 2015 | B | conf |
ETS
|
| 2013 | J | jnl |
IEICE Trans. Electron.
|
| 2013 | C | conf |
SNPD
|
| 2013 | C | conf |
SNPD
|
| 2013 | Misc | conf |
ICMLC
|
| 2013 | C | conf |
ISCAS
|
| 2012 | B | conf |
ETS
|
| 2012 | — | conf |
ASP-DAC
|
| 2012 | J | jnl |
JOCN
|
| 2012 | A | conf |
DATE
|
| 2012 | — | conf |
SII
|
| 2012 | — | conf |
SII
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
J. Comput.
|
| 2011 | J | jnl |
Pattern Recognit. Lett.
|
| 2011 | J | jnl |
J. Adv. Comput. Intell. Intell. Informatics
|
| 2011 | J | jnl |
J. Softw.
|
| 2010 | — | conf |
ICCSA (2)
|
| 2010 | J | jnl |
J. Comput.
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | B | conf |
ETS
|
| 2009 | Misc | conf |
IRI
|
| 2008 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2007 | J | jnl |
J. Inf. Sci. Eng.
|
| 2007 | — | conf |
SIS
|
| 2007 | J | jnl |
Inf. Process. Lett.
|
| 2006 | J | jnl |
Microelectron. Reliab.
|
| 2005 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2005 | — | conf |
IbPRIA (2)
|
| 2005 | — | conf |
ISCAS (3)
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2004 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2004 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2004 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2002 | — | conf |
Asian Test Symposium
|
| 2002 | J | jnl |
Sci. China Ser. F Inf. Sci.
|
| 1999 | J | jnl |
J. Comput. Sci. Technol.
|
| 1999 | J | jnl |
J. Comput. Sci. Technol.
|
| 1999 | — | conf |
Asian Test Symposium
|
| 1997 | — | conf |
Asian Test Symposium
|
| 1997 | J | jnl |
J. Comput. Sci. Technol.
|
| 1997 | J | jnl |
Neural Comput.
|
| 1996 | — | conf |
ICNN
|
| 1996 | J | jnl |
J. Comput. Sci. Technol.
|
| 1996 | — | conf |
Asian Test Symposium
|
| 1993 | J | jnl |
SIGIR Forum
|