| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
Int. J. Imaging Syst. Technol.
|
| 2025 | J | jnl |
CoRR
|
| 2024 | — | conf |
ACL (3)
|
| 2024 | J | jnl |
CoRR
|
| 2024 | C | conf |
IGARSS
|
| 2023 | — | conf |
SENSORS
|
| 2022 | J | jnl |
Symmetry
|
| 2021 | B | conf |
IJCNN
|
| 2021 | — | conf |
IEEE SENSORS
|
| 2021 | — | conf |
NEMS
|
| 2021 | — | conf |
NEMS
|
| 2021 | J | jnl |
Sensors
|
| 2020 | — | conf |
NLPIR
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | — | conf |
IEEE SENSORS
|
| 2020 | B | conf |
IJCNN
|
| 2020 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
计算机科学
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2013 | C | conf |
PRDC
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | J | jnl |
Sci. China Inf. Sci.
|
| 2009 | C | conf |
PRDC
|
| 2008 | — | conf |
ATS
|
| 2008 | C | conf |
PRDC
|
| 2007 | C | conf |
PRDC
|
| 2007 | — | conf |
ATS
|
| 2006 | — | conf |
ATS
|
| 2006 | C | conf |
PRDC
|
| 2005 | C | conf |
PRDC
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2004 | J | jnl |
IEEE Des. Test Comput.
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2002 | — | conf |
Asian Test Symposium
|
| 2001 | — | conf |
Asian Test Symposium
|
| 2000 | J | jnl |
J. Comput. Sci. Technol.
|
| 2000 | — | conf |
Asian Test Symposium
|
| 1999 | — | conf |
Asian Test Symposium
|
| 1999 | J | jnl |
J. Comput. Sci. Technol.
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1997 | — | conf |
Asian Test Symposium
|
| 1996 | J | jnl |
J. Comput. Sci. Technol.
|
| 1995 | — | conf |
Asian Test Symposium
|
| 1986 | A* | conf |
MICRO
|
| 1985 | J | jnl |
IEEE Trans. Computers
|