Shiwei Feng

18 papers Journal 17Unranked 1
YearRankTypeTitle / Venue / Authors
2025 J jnl
Micro-structure damage analysis of GaN HEMTs based on voltage transient trap characterization.
Microelectron. J.
Qian Wen, Chunsheng Guo, Yingchen Du, Xianwei Meng, Shiwei Feng, Yamin Zhang
2025 J jnl
Trapping Behaviors in CNTFETs: Measurement and Analysis of Time Constant, Energy Level, and Trap Location Based on Transient Drain Current.
IEEE Trans. Instrum. Meas.
Shijie Pan, Hui Zhu, Shiwei Feng, Yang Yang, Chao Xu, Shuai Huo, Xiaozhuang Lu, Yamin Zhang, Kun Bai
2025 J jnl
Workload variation compensation optimization of ring oscillator temperature measurement method and its application in field-programmable gate array.
Microelectron. J.
Yaning Wang, Shiwei Feng, Xianliang Lv, Kun Bai, Shijie Pan, Zixuan Feng, Xiaozhuang Lu, Yinqi Zhou, Boyang Zhang
2024 J jnl
A Trap Characterization System for GaN HEMTs Based on Transient Drain Voltage.
IEEE Trans. Instrum. Meas.
Shijie Pan, Shiwei Feng, Xuan Li, Kun Bai, Xiaozhuang Lu, Xiang Zheng, Zixuan Feng, Yamin Zhang
2024 J jnl
Automatic in-situ measurement of thermal resistance for GaN HEMTs.
Microelectron. J.
Zhanwu Yao, Shiwei Feng, Xuan Li, Kun Bai, Xiaozhuang Lu, Binyu You, Shijie Pan, Yamin Zhang
2024 J jnl
Temperature rise detection in GaN high-electron-mobility transistors via gate-drain Schottky junction forward-conduction voltages.
Microelectron. J.
Xiujuan Huang, Chunsheng Guo, Qian Wen, Shiwei Feng, Yamin Zhang
2023 J jnl
A numerical calibration of structure-function transient thermal measurement based on Cauer RC network.
Microelectron. J.
Kun Bai, Shiwei Feng, Xuan Li, Shijie Pan, Xiaozhuang Lu, Zhihong Feng, Yamin Zhang
2023 J jnl
Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection.
IEEE Trans. Instrum. Meas.
Xianwei Meng, Meng Zhang, Kun Duan, Xiang Zheng, Yuwei Zhai, Shiwei Feng, Yamin Zhang
2021 J jnl
Build-in compact and efficient temperature sensor array on field programmable gate array.
Microelectron. J.
Sheng Wang, Shiwei Feng, Yuxuan Xiao, Chaoxu Hu, Shijie Pan
2017 — conf
Influence of heat source size on thermal resistance of AlGaN/GaN HEMT.
ASICON
Chunsheng Guo, Ju Meng, Zhiheng Liao, Shiwei Feng, Xun Wang, Lin Luo
2017 J jnl
Optimized thermal sensor allocation for field-programmable gate array temperature measurements based on self-heating test.
Microelectron. J.
Jingwei Li, Shiwei Feng, Yamin Zhang, Chao Wang, Xin He
2017 J jnl
Thermal evaluation of GaN-based HEMTs with various layer sizes and structural parameters using finite-element thermal simulation.
Microelectron. Reliab.
Zhiheng Liao, Chunsheng Guo, Ju Meng, Boyang Jiang, Li Gao, Ya Su, Ruomin Wang, Shiwei Feng
2016 J jnl
Identifying the spatial position and properties of traps in GaN HEMTs using current transient spectroscopy.
Microelectron. Reliab.
Xiang Zheng, Shiwei Feng, Yamin Zhang, Junwei Yang
2015 J jnl
All-digital thermal distribution measurement on field programmable gate array using ring oscillators.
Microelectron. Reliab.
Yuan Yue, Shiwei Feng, Chunsheng Guo, Xin Yan, Rui-Rui Feng
2015 J jnl
The effect of external stress on the electrical characteristics of AlGaN/GaN HEMTs.
Microelectron. Reliab.
Kun Liu, Hui Zhu, Shiwei Feng, Lei Shi, Yamin Zhang, Chunsheng Guo
2015 J jnl
The effect of external stress on the properties of AlGaAs/GaAs single quantum well laser diodes.
Microelectron. Reliab.
Hui Zhu, Kun Liu, Cong Xiong, Shiwei Feng, Chunsheng Guo
2015 J jnl
Thermal investigation of LED array with multiple packages based on the superposition method.
Microelectron. J.
Dong Shi, Shiwei Feng, Yamin Zhang, Yanbin Qiao, Bing Deng
2013 J jnl
Two-dimensional transient simulations of the self-heating effects in GaN-based HEMTs.
Microelectron. Reliab.
Yamin Zhang, Shiwei Feng, Hui Zhu, Jianwei Zhang, Bing Deng