Shin-Young Chung

17 papers Unranked 17
YearRankTypeTitle / Venue / Authors
2025 — conf
Introduction to Voltage-Ramping Wafer Level Electromigration Method and Current Exponent Correction Factor for Co-Capping Metal Lines.
IRPS
Da Yong Shin, Hyunjun Choi, Joosung Kim, Myungsoo Yeo, Miji Lee, Taiki Uemura, Shin-Young Chung, Jong-Ho Lee
2025 — conf
Reliability Impacts of Tapered Nanosheets and Localized Layout Effects in MBCFETs Fabricated with 2NM Logic Technology Featuring GAA.
IRPS
Seongkyung Kim, Eunyu Choi, Jinyoung Kim, Junkyo Jeong, Jihun Ryu, Myungsoo Yeo, Taiki Uemura, Shin-Young Chung, Jong-Ho Lee
2024 — conf
A Systematic Study of HCI Improvement in FinFET with Source/Drain Implant and Geometry Modulation.
IRPS
Rakesh Ranjan, Pavitra R. Perepa, Ki-Don Lee, Ashish Kumar Jha, Kartika Chandra Sahoo, Kayla N. Sanders, Robert Moeller, Prateek Sharma, Minhyo Kang, Peter Kim, Kwanjae Song, Yongwoo Jeon, Seungho Kim, Hyewon Shim, Shin-Young Chung, Ju Kwang Kim
2024 — conf
An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology.
IRPS
Sangmin Oh, Taeyoung Jeong, Junghwan Yum, Minhyuk Lim, Yoohwan Kim, Bongyong Jeong, Jeongmin Jo, Hyewon Shim, Shin-Young Chung, Paul Jung
2024 — conf
Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence.
IRPS
Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae
2024 — conf
Hot-Carrier-Degradation Characterization for Accurate End-of-Life Prediction with 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FET.
VLSI Technology and Circuits
Seongkyung Kim, Junkyo Jeong, Eunyu Choi, Jinyoung Kim, Hyewon Shim, Shin-Young Chung, Paul Jung
2024 — conf
Impacts of Post-Cu CMP Queue Time on Reliability.
IRPS
Yinghong Zhao, Hokyung Park, Ki-Don Lee, Liangshan Chen, Manisha Sharma, Sugento Huandra, Hanson Mao, Brian Filemyr Smith, Wei Xia, Joonah Yoon, Junehwan Kim, Myungsoo Yeo, Shin-Young Chung, Ju Kwang Kim
2024 — conf
Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology.
IRPS
Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae
2023 — conf
Impact of Barrier Metal Thickness on SRAM Reliability.
IRPS
Rakesh Ranjan, Pavitra Ramadevi Perepa, Ki-Don Lee, Hokyung Park, Peter Kim, Ganesh Chakravarthy Yerubandi, Jon Haefner, Caleb Dongkyun Kwon, Minjung Jin, Wenhao Zhou, Hyewon Shim, Shin-Young Chung
2023 — conf
Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM.
IRPS
Taiki Uemura, Byungjin Chung, Shin-Young Chung, Seungbae Lee, Yuchul Hwang, Sangwoo Pae
2023 — conf
Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk.
IRPS
SungMan Rhee, HyunJin Kim, Sangku Park, Taiki Uemura, Yuchul Hwang, Seungjin Choo, Jinju Kim, Hwasung Rhee, Shin-Young Chung
2023 — conf
Polarity Dependency of MOL-TDDB in FinFET.
IRPS
Manisha Sharma, Hokyung Park, Yinghong Zhao, Ki-Don Lee, Liangshan Chen, Joonah Yoon, Rakesh Ranjan, Caleb Dongkyan Kwon, Hyewon Shim, Myungsoo Yeo, Shin-Young Chung, Jon Haefner
2023 — conf
Reliability Assessment of 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FETs.
IRPS
Seongkyung Kim, Hyerim Park, Eunyu Choi, Young Han Kim, Dahyub Kim, Hyewon Shim, Shin-Young Chung, Paul Jung
2022 — conf
Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices.
IRPS
Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
2022 — conf
Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology.
IRPS
Seongkyung Kim, Ukjin Jung, Seungjin Choo, Kihyun Choi, Tae-Jin Chung, Shin-Young Chung, Euncheol Lee, Juhun Park, Deokhan Bae, Myungyoon Um
2022 — conf
Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology.
IRPS
Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
2019 — conf
Advanded Design Verification and Debugging Techniques Based on Optical Fault Isolation Method.
ISOCC
Ghil-Geun Oh, Jong-Ho Eun, Shin-Young Chung, Brandon Lee