Shiho Hagiwara

12 papers A* 1A 1Journal 5Unranked 5
YearRankTypeTitle / Venue / Authors
2023 A* conf
Thermal Scaffolding for Ultra-Dense 3D Integrated Circuits.
DAC
Dennis Rich, Anna Kasperovich, Mohamadali Malakoutian, Robert M. Radway, Shiho Hagiwara, Takahide Yoshikawa, Srabanti Chowdhury, Subhasish Mitra
2014 J jnl
Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis.
IEICE Trans. Electron.
Shiho Hagiwara, Takanori Date, Kazuya Masu, Takashi Sato
2014 J jnl
State-Dependence of On-Chip Power Distribution Network Capacitance.
IEICE Trans. Electron.
Koh Yamanaga, Shiho Hagiwara, Ryo Takahashi, Kazuya Masu, Takashi Sato
2010 J jnl
Linear Time Calculation of On-Chip Power Distribution Network Capacitance Considering State-Dependence.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Shiho Hagiwara, Koh Yamanaga, Ryo Takahashi, Kazuya Masu, Takashi Sato
2010 — conf
Linear time calculation of state-dependent power distribution network capacitance.
ISQED
Shiho Hagiwara, Koh Yamanaga, Ryo Takahashi, Kazuya Masu, Takashi Sato
2010 — conf
Robust importance sampling for efficient SRAM yield analysis.
ISQED
Takanori Date, Shiho Hagiwara, Kazuya Masu, Takashi Sato
2010 A conf
Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis.
ICCAD
Kentaro Katayama, Shiho Hagiwara, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
2009 J jnl
Analytical Estimation of Path-Delay Variation for Multi-Threshold CMOS Circuits.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Shiho Hagiwara, Takashi Sato, Kazuya Masu
2008 J jnl
Application of Correlation-Based Regression Analysis for Improvement of Power Distribution Network.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu
2007 — conf
A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation.
ISQED
Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu
2007 — conf
Improvement of power distribution network using correlation-based regression analysis.
ACM Great Lakes Symposium on VLSI
Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu
2007 — conf
Weakness Identification for Effective Repair of Power Distribution Network.
PATMOS
Takashi Sato, Shiho Hagiwara, Takumi Uezono, Kazuya Masu