| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Comput. Ind. Eng.
|
| 2025 | J | jnl |
Int. J. Prod. Res.
|
| 2025 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2023 | J | jnl |
Inf. Sci.
|
| 2023 | J | jnl |
Appl. Soft Comput.
|
| 2023 | J | jnl |
J. Ambient Intell. Humaniz. Comput.
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
Comput. Ind. Eng.
|
| 2022 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
Int. J. Prod. Res.
|
| 2021 | J | jnl |
Expert Syst. Appl.
|
| 2021 | J | jnl |
Expert Syst. Appl.
|
| 2020 | J | jnl |
Appl. Soft Comput.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
Comput. Ind. Eng.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
Comput. Ind. Eng.
|
| 2019 | J | jnl |
IEICE Trans. Electron.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
Comput. Ind. Eng.
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Comput. Ind. Eng.
|
| 2018 | J | jnl |
Expert Syst. Appl.
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
Int. J. Prod. Res.
|
| 2017 | J | jnl |
Comput. Ind. Eng.
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
Comput. Ind. Eng.
|
| 2017 | J | jnl |
IEEE Access
|
| 2016 | J | jnl |
Comput. Ind. Eng.
|
| 2016 | J | jnl |
Comput. Ind. Eng.
|
| 2016 | J | jnl |
Comput. Oper. Res.
|
| 2015 | J | jnl |
Appl. Soft Comput.
|
| 2015 | J | jnl |
J. Digit. Imaging
|
| 2015 | J | jnl |
Comput. Ind. Eng.
|
| 2015 | J | jnl |
Appl. Soft Comput.
|
| 2014 | J | jnl |
Comput. Oper. Res.
|
| 2014 | — | conf |
CE
|
| 2014 | J | jnl |
Comput. Oper. Res.
|
| 2014 | J | jnl |
J. Oper. Res. Soc.
|
| 2014 | — | conf |
CE
|
| 2014 | J | jnl |
Eur. J. Oper. Res.
|
| 2014 | J | jnl |
Appl. Soft Comput.
|
| 2014 | J | jnl |
Appl. Soft Comput.
|
| 2014 | J | jnl |
Comput. Ind. Eng.
|
| 2013 | — | conf |
SiPS
|
| 2013 | J | jnl |
J. Oper. Res. Soc.
|
| 2013 | J | jnl |
Comput. Oper. Res.
|
| 2013 | J | jnl |
Comput. Oper. Res.
|
| 2013 | J | jnl |
Int. J. Comput. Sci. Eng.
|
| 2013 | J | jnl |
Appl. Soft Comput.
|
| 2012 | J | jnl |
Eur. J. Oper. Res.
|
| 2012 | J | jnl |
Appl. Soft Comput.
|
| 2012 | J | jnl |
Comput. Medical Imaging Graph.
|
| 2012 | J | jnl |
J. Intell. Manuf.
|
| 2012 | J | jnl |
Soft Comput.
|
| 2012 | J | jnl |
Comput. Oper. Res.
|
| 2011 | J | jnl |
Appl. Soft Comput.
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2011 | J | jnl |
Appl. Soft Comput.
|
| 2011 | J | jnl |
Eur. J. Oper. Res.
|
| 2011 | J | jnl |
J. Oper. Res. Soc.
|
| 2011 | J | jnl |
Comput. Oper. Res.
|
| 2011 | J | jnl |
Appl. Soft Comput.
|
| 2010 | J | jnl |
Expert Syst. Appl.
|
| 2010 | J | jnl |
Comput. Ind. Eng.
|
| 2010 | J | jnl |
Appl. Intell.
|
| 2010 | J | jnl |
Expert Syst. Appl.
|
| 2010 | J | jnl |
Expert Syst. Appl.
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2010 | J | jnl |
Appl. Math. Comput.
|
| 2009 | J | jnl |
Expert Syst. Appl.
|
| 2009 | J | jnl |
Expert Syst. Appl.
|
| 2009 | J | jnl |
Knowl. Inf. Syst.
|
| 2009 | J | jnl |
Comput. Oper. Res.
|
| 2009 | J | jnl |
Appl. Soft Comput.
|
| 2009 | J | jnl |
Knowl. Inf. Syst.
|
| 2009 | J | jnl |
Expert Syst. Appl.
|
| 2009 | J | jnl |
Expert Syst. Appl.
|
| 2009 | J | jnl |
Comput. Oper. Res.
|
| 2009 | J | jnl |
Expert Syst. Appl.
|
| 2008 | — | ch. |
Metaheuristics for Scheduling in Industrial and Manufacturing Applications
|
| 2008 | J | jnl |
J. Oper. Res. Soc.
|
| 2008 | J | jnl |
Appl. Soft Comput.
|
| 2008 | J | jnl |
Expert Syst. Appl.
|
| 2008 | J | jnl |
Expert Syst. Appl.
|
| 2008 | J | jnl |
Appl. Soft Comput.
|
| 2008 | J | jnl |
Expert Syst. Appl.
|
| 2007 | J | jnl |
Eur. J. Oper. Res.
|
| 2007 | J | jnl |
Comput. Math. Appl.
|
| 2007 | J | jnl |
J. Heuristics
|
| 2006 | B | conf |
SMC
|
| 2006 | B | conf |
IWCMC
|
| 2006 | B | conf |
SMC
|
| 2006 | B | conf |
SMC
|
| 2006 | B | conf |
SMC
|
| 2006 | B | conf |
SMC
|
| 2006 | B | conf |
SMC
|
| 2002 | J | jnl |
Comput. Oper. Res.
|
| 1999 | J | jnl |
Pattern Recognit. Lett.
|