Shifu Yan

12 papers A* 1Journal 11
YearRankTypeTitle / Venue / Authors
2026 J jnl
Beyond Single Prompts: Synergistic Fusion and Arrangement for VICL.
CoRR
Wenwen Liao, Jianbo Yu, Yuansong Wang, Shifu Yan, Xiaofeng Yang
2024 J jnl
Fluid catalytic cracking process quality-driven fault detection based on partial least squares and deep feedforward neural network.
Trans. Inst. Meas. Control
Jiandong Yang, Jiangsheng Li, Shifu Yan, Yangfeng Wang, Ying Zhang, Xuefeng Yan
2024 J jnl
Learning Output Relevant Features by Joint Autoencoder.
IEEE Trans. Cybern.
Shifu Yan, Xuefeng Yan
2024 J jnl
Physically-guided temporal diffusion transformer for long-term time series forecasting.
Knowl. Based Syst.
Zeqi Ren, Jianbo Yu, Jian Huang, Xiaofeng Yang, Siyang Leng, Yuping Liu, Shifu Yan
2023 J jnl
Data-Driven Soft Sensing for Batch Processes Using Neural Network-Based Deep Quality-Relevant Representation Learning.
IEEE Trans. Artif. Intell.
Qingchao Jiang, Ziwen Wang, Shifu Yan, Zhixing Cao
2023 J jnl
Neural representations for quality-related kernel learning and fault detection.
Soft Comput.
Shifu Yan, Lihua Lv, Xuefeng Yan
2022 A* conf
CMMD: Cross-Metric Multi-Dimensional Root Cause Analysis.
KDD
Shifu Yan, Caihua Shan, Wenyi Yang, Bixiong Xu, Dongsheng Li, Lili Qiu, Jie Tong, Qi Zhang
2022 J jnl
CMMD: Cross-Metric Multi-Dimensional Root Cause Analysis.
CoRR
Shifu Yan, Caihua Shan, Wenyi Yang, Bixiong Xu, Dongsheng Li, Lili Qiu, Jie Tong, Qi Zhang
2021 J jnl
Local-Global Modeling and Distributed Computing Framework for Nonlinear Plant-Wide Process Monitoring With Industrial Big Data.
IEEE Trans. Neural Networks Learn. Syst.
Qingchao Jiang, Shifu Yan, Hui Cheng, Xuefeng Yan
2021 J jnl
Nonlinear quality-relevant process monitoring based on maximizing correlation neural network.
Neural Comput. Appl.
Shifu Yan, Xuefeng Yan
2020 J jnl
Data-Driven Two-Dimensional Deep Correlated Representation Learning for Nonlinear Batch Process Monitoring.
IEEE Trans. Ind. Informatics
Qingchao Jiang, Shifu Yan, Xuefeng Yan, Hui Yi, Furong Gao
2019 J jnl
Design teacher and supervised dual stacked auto-encoders for quality-relevant fault detection in industrial process.
Appl. Soft Comput.
Shifu Yan, Xuefeng Yan