Shichang Zou

37 papers Journal 35Unranked 2
YearRankTypeTitle / Venue / Authors
2025 J jnl
High-precision single-event transient hardened comparator with the sensitive node transient detection feedback latch technique.
Int. J. Circuit Theory Appl.
Yuqiao Xie, Tao Xu, Zhongyang Liu, Guoji Qiu, Dawei Bi, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou
2023 J jnl
A highly stable and low-cost 12T radiation hardened SRAM cell design for aerospace application.
Int. J. Circuit Theory Appl.
Zhongyang Liu, Yuqiao Xie, Tao Xu, Qing Liu, Dawei Bi, Zhiyuan Hu, Shichang Zou, Zhengxuan Zhang
2023 J jnl
A novel high-precision single-event transient hardened voltage comparator design.
Int. J. Circuit Theory Appl.
Yuqiao Xie, Zhongyang Liu, Tao Xu, Dawei Bi, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou
2022 J jnl
A High-Performance and Low-Cost Single-Event Multiple-Node-Upsets Resilient Latch Design.
IEEE Trans. Very Large Scale Integr. Syst.
Zhongyang Liu, Haineng Zhang, Jianwei Jiang, Yanjie Jia, Yuqiao Xie, Shichang Zou, Zhengxuan Zhang
2020 J jnl
A Wide-Range-Supply-Voltage Sense Amplifier Circuit for Embedded Flash Memory.
IEEE Trans. Circuits Syst. II Express Briefs
Wenyi Zhu, Jianwei Jiang, Haineng Zhang, Yiran Xu, Jun Xiao, Guangjun Yang, Shichang Zou
2020 J jnl
Electrical performance of 130 nm PD-SOI MOSFET with diamond layout.
Microelectron. J.
Xiaonian Liu, Lihua Dai, Pingliang Li, Shichang Zou
2020 J jnl
Substrate effect on radiation-induced charge trapping in buried oxide for partially-depleted SOI NMOSFET.
IEICE Electron. Express
Huilong Zhu, Dawei Bi, Xin Xie, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou
2019 J jnl
A charge pump system with new regulation and clocking scheme.
IEICE Electron. Express
Wenyi Zhu, Jianwei Jiang, Dianpeng Lin, Jun Xiao, Guangjun Yang, Xiaoyun Li, Shichang Zou
2019 J jnl
Demonstration of improvement of specific on-resistance versus breakdown voltage tradeoff for low-voltage power LDMOS.
Microelectron. J.
Zhaozhao Xu, Donghua Liu, Jun Hu, Feng Jin, Xinjie Yang, Wenting Duan, Wei Yue, Ziquan Fang, Wensheng Qian, Weiran Kong, Shichang Zou
2019 J jnl
Quadruple Cross-Coupled Latch-Based 10T and 12T SRAM Bit-Cell Designs for Highly Reliable Terrestrial Applications.
IEEE Trans. Circuits Syst. I Regul. Pap.
Jianwei Jiang, Yiran Xu, Wenyi Zhu, Jun Xiao, Shichang Zou
2019 J jnl
Radiation-enhanced channel length modulation induced by trapped charges in buried oxide layer.
IEICE Electron. Express
Xin Xie, Huilong Zhu, Mengying Zhang, Dawei Bi, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou
2019 — conf
Soft-Error-Tolerant Ultralow-Leakage 12T SRAM Bitcell Design.
ICICDT
Jianwei Jiang, Dianpeng Lin, Jun Xiao, Shichang Zou
2018 J jnl
A 280-KBytes Twin-Bit-Cell Embedded NOR Flash Memory With a Novel Sensing Current Protection Enhanced Technique and High-Voltage Generating Systems.
IEEE Trans. Circuits Syst. II Express Briefs
Yiran Xu, Wenyi Zhu, Jun Xiao, Guangjun Yang, Jian Hu, Shengbo Zhang, Mingyong Huang, Weiran Kong, Shichang Zou
2018 J jnl
A novel SEU tolerant memory cell for space applications.
IEICE Electron. Express
Dianpeng Lin, Yiran Xu, Xiaoyun Li, Xin Xie, Jianwei Jiang, Jiangchuan Ren, Huilong Zhu, Zhengxuan Zhang, Shichang Zou
2018 J jnl
A novel highly reliable and low-power radiation hardened SRAM bit-cell design.
IEICE Electron. Express
Dianpeng Lin, Yiran Xu, Xiaonian Liu, Wenyi Zhu, Lihua Dai, Mengying Zhang, Xiaoyun Li, Xin Xie, Jianwei Jiang, Huilong Zhu, Zhengxuan Zhang, Shichang Zou
2018 J jnl
A novel self-recoverable and triple nodes upset resilience DICE latch.
IEICE Electron. Express
Dianpeng Lin, Yiran Xu, Xiaoyun Li, Xin Xie, Jianwei Jiang, Jiangchuan Ren, Huilong Zhu, Zhengxuan Zhang, Shichang Zou
2018 J jnl
Investigation and impact of LDD variations on the drain disturb in normally-on SONOS NOR flash device.
Microelectron. Reliab.
Zhaozhao Xu, Donghua Liu, Wei Xiong, Jun Hu, Wenting Duan, Hualun Chen, Wensheng Qian, Weiran Kong, Shichang Zou
2018 J jnl
Total dose radiation induced changes of the floating body effects in the partially depleted SOI NMOS with ultrathin gate oxide.
IEICE Electron. Express
Zhiyuan Hu, Lihua Dai, Zhengxuan Zhang, Xiaoyun Li, Shichang Zou
2017 J jnl
A duplex current-reused CMOS LNA with complementary derivative superposition technique.
Int. J. Circuit Theory Appl.
Ruofan Dai, Yunlong Zheng, Jun He, Weiran Kong, Shichang Zou
2017 J jnl
A macro SPICE model for 2-bits/cell split-gate flash memory cell.
Microelectron. J.
Xiaonian Liu, Yiran Xu, Xiangquan Fan, Mengxing Liao, Pingliang Li, Shichang Zou
2017 J jnl
Area-efficient charge pump with local boost technique for embedded flash memory.
IEICE Electron. Express
Yiran Xu, Wenyi Zhu, Jun Xiao, Guangjun Yang, Jian Hu, Xiaoyun Li, Weiran Kong, Shichang Zou
2017 J jnl
Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs.
Microelectron. Reliab.
Lihua Dai, Xiaonian Liu, Mengying Zhang, Leqing Zhang, Zhiyuan Hu, Dawei Bi, Zhengxuan Zhang, Shichang Zou
2017 J jnl
Influences of silicon-rich shallow trench isolation on total ionizing dose hardening and gate oxide integrity in a 130 nm partially depleted SOI CMOS technology.
Microelectron. Reliab.
Lei Song, Zhiyuan Hu, Mengying Zhang, Xiaonian Liu, Lihua Dai, Zhengxuan Zhang, Shichang Zou
2017 J jnl
Investigation of read disturb in split-gate memory and its feasible solution.
Microelectron. Reliab.
Wenyi Zhu, Binghan Li, Tao Yu, Weiran Kong, Shichang Zou
2016 J jnl
A 0.5-V novel complementary current-reused CMOS LNA for 2.4 GHz medical application.
Microelectron. J.
Ruofan Dai, Yunlong Zheng, Jun He, Guojun Liu, Weiran Kong, Shichang Zou
2016 J jnl
Comparison of single-event transients of T-gate core and IO device in 130 nm partially depleted silicon-on-insulator technology.
IEICE Electron. Express
Yunlong Zheng, Ruofan Dai, Zhuojun Chen, Shulong Sun, Zheng Wang, Zehua Sang, Min Lin, Shichang Zou
2014 J jnl
A 1.35-V 16-Mb Twin-Bit-Cell Virtual-Ground-Architecture Embedded Flash Memory With a Sensing Current Protection Technique.
IEEE Trans. Circuits Syst. I Regul. Pap.
Shengbo Zhang, Jun Xiao, Guangjun Yang, Jian Hu, Mingyong Huang, Shichang Zou
2014 J jnl
A Novel Sourceline Voltage Compensation Circuit and a Wordline Voltage-Generating System for Embedded nor Flash Memory.
IEEE Trans. Circuits Syst. II Express Briefs
Shengbo Zhang, Jun Xiao, Guangjun Yang, Jian Hu, Shichang Zou
2013 — conf
A compact and CMOS compatible MMI coupler with very low excess loss.
OFC/NFOEC
Zhen Sheng, Zhiqi Wang, Chao Qiu, Le Li, Albert Pang, Aimin Wu, Xi Wang, Shichang Zou, Fuwan Gan
2013 J jnl
Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs.
Microelectron. Reliab.
Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Zhiyuan Hu, Ming Chen, Shichang Zou
2013 J jnl
Comprehensive study on the TID effects of 0.13 μm partially depleted SOI NMOSFETs.
Microelectron. J.
Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Ming Chen, Shichang Zou
2012 J jnl
Radiation-induced shallow trench isolation leakage in 180-nm flash memory technology.
Microelectron. Reliab.
Bingxu Ning, Zhengxuan Zhang, Zhangli Liu, Zhiyuan Hu, Ming Chen, Dawei Bi, Shichang Zou
2011 J jnl
Comparison of TID response in core, input/output and high voltage transistors for flash memory.
Microelectron. Reliab.
Zhangli Liu, Zhiyuan Hu, Zhengxuan Zhang, Hua Shao, Ming Chen, Dawei Bi, Bingxu Ning, Shichang Zou
2011 J jnl
Hole tunneling from valence band and hot-carrier induced hysteresis effect in 0.13 μm partially depleted silicon-on-insulator n-MOSFETs.
Microelectron. Reliab.
Jianhua Zhou, Albert Pang, Steam Cao, Shichang Zou
2011 J jnl
Impact of within-wafer process variability on radiation response.
Microelectron. J.
Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou
2011 J jnl
The impact of total ionizing radiation on body effect.
Microelectron. J.
Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Zhangli Liu, Ming Chen, Dawei Bi, Shichang Zou
2011 J jnl
Total ionizing dose effects in elementary devices for 180-nm flash technologies.
Microelectron. Reliab.
Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou