| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | J | jnl |
IEEE Des. Test
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | — | — |
|
| 2018 | Misc | conf |
VLSID
|
| 2018 | A | conf |
ICCAD
|
| 2018 | A | conf |
ITC
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | A | conf |
ITC
|
| 2017 | Misc | conf |
CODES+ISSS
|
| 2017 | A | conf |
ITC
|
| 2016 | A | conf |
ITC
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | — | conf |
Asian Test Symposium
|