Shi-Jie Wen - RankMe

54 papers A 2B 2C 6Journal 21Unranked 23

Year	Rank	Type	Title / Venue / Authors
2024	—	`conf`	Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems. IRPS Nicholas J. Pieper, M. Chun, Yoni Xiong, H. M. Dattilo, Jenna B. Kronenberg, Sanghyeon Baeg, Shi-Jie Wen, Rita Fung, D. Chan, C. Escobar, Bharat L. Bhuva
2023	—	`conf`	Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components. IRPS Hyeongseok Oh, Myungsun Chun, Jiwon Lee, Shi-Jie Wen, Nick Yu, Byung-Gun Park, Sanghyeon Baeg
2022	J	`jnl`	Generative Anomaly Detection for Time Series Datasets. CoRR Zhuangwei Kang, Ayan Mukhopadhyay, Aniruddha Gokhale, Shi-Jie Wen, Abhishek Dubey
2022	—	`conf`	Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. IRPS Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva
2022	—	`conf`	Traffic Anomaly Detection Via Conditional Normalizing Flow. ITSC Zhuangwei Kang, Ayan Mukhopadhyay, Aniruddha Gokhale, Shi-Jie Wen, Abhishek Dubey
2021	J	`jnl`	Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation. IEEE Access Donghyuk Yun, Myungsang Park, GeunYong Bak, Sanghyeon Baeg, Shi-Jie Wen
2021	—	`conf`	Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node. IRPS Yoni Xiong, Alexandra Feeley, Lloyd W. Massengill, Bharat L. Bhuva, Shi-Jie Wen, Rita Fung
2021	J	`jnl`	Spatio-temporal AI inference engine for estimating hard disk reliability. Pervasive Mob. Comput. Sanchita Basak, Saptarshi Sengupta, Shi-Jie Wen, Abhishek Dubey
2020	—	`conf`	High-Current State triggered by Operating-Frequency Change. IRPS Lyuan Xu, Jingchen Cao, Shi-Jie Wen, Rita Fung, Jamie Markevitch, Dennis R. Ball, Bharat L. Bhuva
2020	—	`conf`	Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology. IRPS Jingchen Cao, Lyuan Xu, Shi-Jie Wen, Rita Fung, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva
2020	—	`conf`	Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. IRPS Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva
2020	—	`conf`	Use of Silicon-based Sensors for System Reliability Prediction. IRPS Dmitry Goloubev, Shi-Jie Wen, Donald Allen, Ranjani Ram, Firdous Bano, Nithin Guruswamy, James Turman
2020	—	`conf`	Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System. IRPS Andrew M. Keller, Jared Anderson, Michael J. Wirthlin, Shi-Jie Wen, Rita Fung, Conner Chambers
2019	J	`jnl`	A Fully Integrated Digital LDO With Built-In Adaptive Sampling and Active Voltage Positioning Using a Beat-Frequency Quantizer. IEEE J. Solid State Circuits Somnath Kundu, Muqing Liu, Shi-Jie Wen, Richard Wong, Chris H. Kim
2019	—	`conf`	Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. IRPS Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill
2019	—	`conf`	Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. IRPS Lyuan Xu, Jingchen Cao, Bharat L. Bhuva, Indranil Chatterjee, Shi-Jie Wen, Richard Wong, Lloyd W. Massengill
2018	—	`conf`	A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning. ISSCC Somnath Kundu, Muqing Liu, Richard Wong, Shi-Jie Wen, Chris H. Kim
2018	J	`jnl`	Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong
2018	—	`conf`	Single-event effects on optical transceiver. IRPS Kurt J. Lezon, Shi-Jie Wen, Y.-F. Dan, Richard Wong, Bharat L. Bhuva
2018	J	`jnl`	Study of proton radiation effect to row hammer fault in DDR4 SDRAMs. Microelectron. Reliab. Chul Seung Lim, Kyungbae Park, GeunYong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
2017	C	`conf`	BPPT - Bulk potential protection technique for hardened sequentials. IOLTS Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong
2017	—	`conf`	IZIP: In-place zero overhead interconnect protection via PIP redundancy. ASICON Yi Luo, Adrian Evans, Shi-Jie Wen, Rick Wong, Gengsheng Chen
2017	J	`jnl`	Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device. Microelectron. Reliab. Hosung Lee, Sanghyeon Baeg, Nelson Hua, Shi-Jie Wen
2016	J	`jnl`	Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation. IEICE Electron. Express Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg
2016	J	`jnl`	Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]. IEICE Electron. Express Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg
2015	—	`conf`	Analysis of advanced circuits for SET measurement. IRPS Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung
2015	—	`conf`	Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams. IRPS GeunYong Bak, Soonyoung Lee, Hosung Lee, Kyungbae Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Charlie Slayman
2015	J	`jnl`	New insights into the impact of SEUs in FPGA CRAMs. IEICE Electron. Express Sheng Wang, Adrian Evans, Shi-Jie Wen, Rick Wong, Gengsheng Chen
2015	—	`conf`	Terrestrial SER characterization for nanoscale technologies: A comparative study. IRPS Nihaar N. Mahatme, Bharat L. Bhuva, Nelson J. Gaspard, T. Assis, Y. Xu, P. Marcoux, M. Vilchis, Balaji Narasimham, A. Shih, Shi-Jie Wen, Rick Wong, N. Tam, M. Shroff, S. Koyoma, A. Oates
2014	J	`jnl`	Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection. Microelectron. Reliab. Jiajia Jiao, Yuzhuo Fu, Shi-Jie Wen
2014	C	`conf`	New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. IOLTS Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong
2014	J	`jnl`	Single Event Resilient Dynamic Logic Designs. J. Electron. Test. Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi
2014	J	`jnl`	Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. J. Electron. Test. Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva
2013	J	`jnl`	A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients. J. Electron. Test. Zhichao Zhang, Yi Ren, Li Chen, Nelson J. Gaspard, Arthur F. Witulski, W. Timothy Holman, Bharat L. Bhuva, Shi-Jie Wen, Ramaswami Sammynaiken
2013	—	`conf`	Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops. ISQED Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Thiago Asis
2013	J	`jnl`	Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller. J. Electron. Test. Yi Ren, Shuting Shi, Li Chen, Haibin Wang, L.-J. Gao, Gang Guo, Shi-Jie Wen, Richard Wong, N. W. van Vonno
2013	A	`conf`	Error detection in ternary CAMs using bloom filters. DATE Salvatore Pontarelli, Marco Ottavi, Adrian Evans, Shi-Jie Wen
2013	—	`conf`	Networking industry trends in ESD protection for high speed IOs. ASICON Richard Wong, Rita Fung, Shi-Jie Wen
2013	A	`conf`	Placement of repair circuits for in-field FPGA repair. FPGA Michael J. Wirthlin, Joshua E. Jensen, Alex Wilson, William Howes, Shi-Jie Wen, Rick Wong
2013	J	`jnl`	Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication. Microprocess. Microsystems Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
2013	C	`conf`	Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance. PRDC Hao Xie, Li Chen, Adrian Evans, Shi-Jie Wen, Rick Wong
2012	—	`conf`	Heterogeneous configuration memory scrubbing for soft error mitigation in FPGAs. FPT Ju-Yueh Lee, Cheng-Ru Chang, Naifeng Jing, Juexiao Su, Shi-Jie Wen, Rick Wong, Lei He
2012	J	`jnl`	Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Richard Wong
2012	C	`conf`	RIIF - Reliability information interchange format. IOLTS Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro
2012	J	`jnl`	Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter. J. Electron. Test. Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva
2011	J	`jnl`	Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS. IEEE J. Solid State Circuits Jian Liu, Xin Wang, Hui Zhao, Qiang Fang, Albert Z. Wang, Lin Lin, He Tang, Siqiang Fan, Bin Zhao, Shi-Jie Wen, Richard Wong
2011	—	`conf`	Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations. ISQED Changmin Jung, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
2011	J	`jnl`	Mitigating the effects of large multiple cell upsets (MCUs) in memories. ACM Trans. Design Autom. Electr. Syst. Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
2011	—	`conf`	Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS. CICC David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Rick Wong
2011	B	`conf`	Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms. FPL Naifeng Jing, Ju-Yueh Lee, Zhe Feng, Weifeng He, Zhigang Mao, Shi-Jie Wen, Rick Wong, Lei He
2011	B	`conf`	Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS. ETS Massoud Mokhtarpour Ghahroodi, Mark Zwolinski, Rick Wong, Shi-Jie Wen
2010	J	`jnl`	Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. IEEE Trans. Circuits Syst. I Regul. Pap. Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
2008	C	`conf`	A Systematical Method of Quantifying SEU FIT. IOLTS Shi-Jie Wen, Dan Alexandrescu, Renaud Perez
2008	C	`conf`	Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. IOLTS Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong