Sheriff Sadiqbatcha

26 papers A* 1A 3B 2C 1Journal 13Unranked 5
YearRankTypeTitle / Venue / Authors
2023 J jnl
Hot-Trim: Thermal and Reliability Management for Commercial Multicore Processors Considering Workload Dependent Hot Spots.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jinwei Zhang, Sheriff Sadiqbatcha, Sheldon X.-D. Tan
2023 J jnl
Hot-spot aware thermoelectric array based cooling for multicore processors.
Integr.
Jinwei Zhang, Sheriff Sadiqbatcha, Liang Chen, Cuong Thi, Sachin Sachdeva, Hussam Amrouch, Sheldon X.-D. Tan
2022 J jnl
Electrothermal Simulation and Optimal Design of Thermoelectric Cooler Using Analytical Approach.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Liang Chen, Sheriff Sadiqbatcha, Hussam Amrouch, Sheldon X.-D. Tan
2022 J jnl
Full-Chip Power Density and Thermal Map Characterization for Commercial Microprocessors Under Heat Sink Cooling.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jinwei Zhang, Sheriff Sadiqbatcha, Michael O'Dea, Hussam Amrouch, Sheldon X.-D. Tan
2022 J jnl
Real-Time Full-Chip Thermal Tracking: A Post-Silicon, Machine Learning Perspective.
IEEE Trans. Computers
Sheriff Sadiqbatcha, Jinwei Zhang, Hussam Amrouch, Sheldon X.-D. Tan
2021 A* conf
EMGraph: Fast Learning-Based Electromigration Analysis for Multi-Segment Interconnect Using Graph Convolution Networks.
DAC
Wentian Jin, Liang Chen, Sheriff Sadiqbatcha, Shaoyi Peng, Sheldon X.-D. Tan
2021 J jnl
Post-Silicon Heat-Source Identification and Machine-Learning-Based Thermal Modeling Using Infrared Thermal Imaging.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Sheriff Sadiqbatcha, Jinwei Zhang, Hengyang Zhao, Hussam Amrouch, Jörg Henkel, Sheldon X.-D. Tan
2021 — —
Towards Addressing Thermal and Reliability Challenges in Nanometer Integrated Circuits
Sheriff Sadiqbatcha
2020 J jnl
Accelerating Electromigration Aging: Fast Failure Detection for Nanometer ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan
2020 A conf
Accurate Power Density Map Estimation for Commercial Multi-Core Microprocessors.
DATE
Jinwei Zhang, Sheriff Sadiqbatcha, Wentian Jin, Sheldon X.-D. Tan
2020 C conf
EM-GAN: Data-Driven Fast Stress Analysis for Multi-Segment Interconnects.
ICCD
Wentian Jin, Sheriff Sadiqbatcha, Zeyu Sun, Han Zhou, Sheldon X.-D. Tan
2020 J jnl
EM-GAN: Fast Stress Analysis for Multi-Segment Interconnect Using Generative Adversarial Networks.
CoRR
Wentian Jin, Sheriff Sadiqbatcha, Jinwei Zhang, Sheldon X.-D. Tan
2020 A conf
Full-Chip Thermal Map Estimation for Commercial Multi-Core CPUs with Generative Adversarial Learning.
ICCAD
Wentian Jin, Sheriff Sadiqbatcha, Jinwei Zhang, Sheldon X.-D. Tan
2020 — conf
HAT-DRL: Hotspot-Aware Task Mapping for Lifetime Improvement of Multicore System using Deep Reinforcement Learning.
MLCAD
Jinwei Zhang, Sheriff Sadiqbatcha, Yuanqi Gao, Michael O'Dea, Nanpeng Yu, Sheldon X.-D. Tan
2020 J jnl
Interconnect Electromigration Modeling and Analysis for Nanometer ICs: From Physics to Full-Chip.
IPSJ Trans. Syst. LSI Des. Methodol.
Sheldon X.-D. Tan, Zeyu Sun, Sheriff Sadiqbatcha
2020 — conf
Machine Learning Based Online Full-Chip Heatmap Estimation.
ASP-DAC
Sheriff Sadiqbatcha, Yue Zhao, Jinwei Zhang, Hussam Amrouch, Jörg Henkel, Sheldon X.-D. Tan
2019 J jnl
EM-Aware and Lifetime-Constrained Optimization for Multisegment Power Grid Networks.
IEEE Trans. Very Large Scale Integr. Syst.
Han Zhou, Zeyu Sun, Sheriff Sadiqbatcha, Naehyuck Chang, Sheldon X.-D. Tan
2019 A conf
Hot Spot Identification and System Parameterized Thermal Modeling for Multi-Core Processors Through Infrared Thermal Imaging.
DATE
Sheriff Sadiqbatcha, Hengyang Zhao, Hussam Amrouch, Jörg Henkel, Sheldon X.-D. Tan
2019 J jnl
Reliability based hardware Trojan design using physics-based electromigration models.
Integr.
Chase Cook, Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan
2019 J jnl
Saturation-Volume Estimation for Multisegment Copper Interconnect Wires.
IEEE Trans. Very Large Scale Integr. Syst.
Zeyu Sun, Sheriff Sadiqbatcha, Hengyang Zhao, Sheldon X.-D. Tan
2018 — conf
Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires.
SMACD
Sheriff Sadiqbatcha, Chase Cook, Zeyu Sun, Sheldon X.-D. Tan
2018 — conf
Accelerating electromigration aging for fast failure detection for nanometer ICs.
ASP-DAC
Zeyu Sun, Sheriff Sadiqbatcha, Hengyang Zhao, Sheldon X.-D. Tan
2018 J jnl
Particle Swarm Optimization for Solving a Class of Type-1 and Type-2 Fuzzy Nonlinear Equations.
J. Artif. Intell. Soft Comput. Res.
Sheriff Sadiqbatcha, Saeed Jafarzadeh, Yiannis Ampatzidis
2018 — conf
Reliability Based Hardware Trojan Design Using Physics-Based Electromigration Models.
SMACD
Chase Cook, Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan
2017 B conf
Particle swarm optimization for solving a class of type-1 and type-2 fuzzy nonlinear equations.
FUZZ-IEEE
Sheriff Sadiqbatcha, Saeed Jafarzadeh, Yiannis Ampatzidis
2016 B conf
An analytical approach for solving type-1 and type-2 fully fuzzy linear systems of equations.
FUZZ-IEEE
Sheriff Sadiqbatcha, Saeed Jafarzadeh