| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
J. Electron. Test.
|
| 2022 | J | jnl |
J. Electron. Test.
|
| 2022 | J | jnl |
Sensors
|
| 2021 | J | jnl |
IEEE Access
|
| 2020 | — | conf |
CCRIS
|
| 2018 | J | jnl |
Appl. Math. Comput.
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
IEEE CAA J. Autom. Sinica
|
| 2016 | J | jnl |
Neurocomputing
|
| 2002 | — | conf |
ICECS
|