Sheng-Tsaing Tseng

20 papers Journal 20
YearRankTypeTitle / Venue / Authors
2023 J jnl
Neural ordinary differential equation for sequential optimal design of fatigue test under accelerated life test analysis.
Reliab. Eng. Syst. Saf.
Marzieh Khakifirooz, Mahdi Fathi, I-Chen Lee, Sheng-Tsaing Tseng
2020 J jnl
Model Misspecification of Generalized Gamma Distribution for Accelerated Lifetime-Censored Data.
Technometrics
Marzieh Khakifirooz, Sheng-Tsaing Tseng, Mahdi Fathi
2019 J jnl
Stability conditions and robustness analysis of a general MMSE run-to-run controller.
IISE Trans.
Sheng-Tsaing Tseng, Fugee Tsung, Jo-Hua Wu
2018 J jnl
Sequential Bayesian Design for Accelerated Life Tests.
Technometrics
I-Chen Lee, Yili Hong, Sheng-Tsaing Tseng, Tirthankar Dasgupta
2017 J jnl
A Generalized Quasi-MMSE Controller for Run-to-Run Dynamic Models.
Technometrics
Sheng-Tsaing Tseng, Pei-Yu Chen
2016 J jnl
A Multivariate EWMA Controller for Linear Dynamic Processes.
Technometrics
Sheng-Tsaing Tseng, Hsin-Chao Mi, I-Chen Lee
2016 J jnl
Optimum Allocation Rule for Accelerated Degradation Tests With a Class of Exponential-Dispersion Degradation Models.
Technometrics
Sheng-Tsaing Tseng, I-Chen Lee
2015 J jnl
Adaptive Warranty Prediction for Highly Reliable Products.
IEEE Trans. Reliab.
Nan-Jung Hsu, Sheng-Tsaing Tseng, Ming-Wei Chen
2013 J jnl
Statistical Lifetime Inference With Skew-Wiener Linear Degradation Models.
IEEE Trans. Reliab.
Chien-Yu Peng, Sheng-Tsaing Tseng
2012 J jnl
Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects.
IEEE Trans. Reliab.
Chih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan
2011 J jnl
Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process.
IEEE Trans. Reliab.
Chih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan
2010 J jnl
Fault Detection based on Statistical Multivariate Analysis and Microarray-type Visualization.
IEEE Trans. Ind. Informatics
Ming-Da Ma, David Shan-Hill Wong, Shi-Shang Jang, Sheng-Tsaing Tseng
2010 J jnl
Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products.
IEEE Trans. Reliab.
Chien-Yu Peng, Sheng-Tsaing Tseng
2009 J jnl
A Technical Note on "Sample Size Determination for Achieving Stability of Double Multivariate Exponentially Weighted Moving Average Controller".
Technometrics
Sheng-Tsaing Tseng, Bo-Yan Jou
2009 J jnl
Mis-Specification Analysis of Linear Degradation Models.
IEEE Trans. Reliab.
Chien-Yu Peng, Sheng-Tsaing Tseng
2009 J jnl
Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes.
IEEE Trans. Reliab.
Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan, Chih-Chun Tsai
2007 J jnl
Sample Size Determination for Achieving Stability of Double Multivariate Exponentially Weighted Moving Average Controller.
Technometrics
Sheng-Tsaing Tseng, Jen Tang, Chien-Hua Lin
2006 J jnl
Optimal design for step-stress accelerated degradation tests.
IEEE Trans. Reliab.
Chen-Mao Liao, Sheng-Tsaing Tseng
2000 J jnl
Optimal production run length for products sold with warranty.
Eur. J. Oper. Res.
Ruey-Huei Yeh, Wen-Tsung Ho, Sheng-Tsaing Tseng
1992 J jnl
Use of variable range in solving multiple criteria scheduling problems.
Comput. Oper. Res.
Ching-Jong Liao, Rong-Hwa Huang, Sheng-Tsaing Tseng