| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | C | conf |
EDUCON
|
| 2024 | — | conf |
ASCC
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Artif. Intell.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2020 | J | jnl |
J. Intell. Manuf.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | C | conf |
INDIN
|
| 2019 | C | conf |
INDIN
|
| 2019 | J | jnl |
Int. J. Neural Syst.
|
| 2019 | — | conf |
ICCA
|
| 2017 | A | conf |
SIGCSE
|
| 2017 | J | jnl |
Int. J. Simul. Process. Model.
|
| 2014 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2014 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2009 | J | jnl |
Simul. Model. Pract. Theory
|
| 2008 | J | jnl |
IET Commun.
|