| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
AIM
|
| 2023 | — | conf |
AIM
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | C | conf |
IECON
|
| 2022 | J | jnl |
Sensors
|
| 2022 | — | conf |
AIM
|
| 2021 | C | conf |
IECON
|
| 2019 | — | conf |
AIM
|
| 2018 | — | conf |
AIM
|
| 2015 | — | conf |
AIM
|
| 2014 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2012 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2010 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2009 | — | conf |
CCA/ISIC
|
| 2006 | — | conf |
CDC
|
| 2006 | C | conf |
ACC
|
| 2006 | — | conf |
Measuring the Deflection of the Cantilever in Atomic Force Microscope with an Optical Pickup System.
CDC
|
| 2006 | J | jnl |
IEEE Trans. Instrum. Meas.
|