| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
Int. J. Syst. Assur. Eng. Manag.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Turkish J. Electr. Eng. Comput. Sci.
|
| 2016 | J | jnl |
Int. J. Syst. Assur. Eng. Manag.
|
| 2015 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2014 | J | jnl |
J. Electron. Test.
|
| 2011 | J | jnl |
J. Sens. Technol.
|
| 2007 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2007 | J | jnl |
Int. J. Comput.
|