| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2022 | J | jnl |
CoRR
|
| 2020 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2019 | J | jnl |
CoRR
|
| 2019 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2019 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2019 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2019 | J | jnl |
IEEE Trans. Computers
|
| 2017 | — | conf |
HLDVT
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
J. Parallel Distributed Comput.
|
| 2017 | J | jnl |
IEEE Trans. Parallel Distributed Syst.
|
| 2017 | J | jnl |
Microprocess. Microsystems
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
IEEE Trans. Multi Scale Comput. Syst.
|
| 2017 | — | conf |
DFT
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | A | conf |
ISLPED
|
| 2017 | — | conf |
ASP-DAC
|
| 2016 | Misc | conf |
EDCC
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | C | conf |
IOLTS
|
| 2016 | J | jnl |
IEEE Trans. Computers
|
| 2016 | Misc | conf |
EDCC
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
Microprocess. Microsystems
|
| 2015 | B | conf |
IM
|
| 2015 | C | conf |
PRDC
|
| 2015 | — | conf |
ICA3PP (3)
|
| 2015 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2015 | Misc | conf |
EDCC
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
CIT/IUCC/DASC/PICom
|
| 2015 | — | conf |
ReCoSoC
|
| 2014 | — | conf |
DFT
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
J. Electron. Test.
|
| 2014 | C | conf |
PRDC
|
| 2014 | A | conf |
DATE
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2013 | — | conf |
FPT
|
| 2013 | — | conf |
ISSoC
|
| 2013 | A | conf |
DSN
|
| 2013 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | Misc | conf |
Memory Mapped SPM: Protecting Instruction Scratchpad Memory in Embedded Systems against Soft Errors.
EDCC
|
| 2012 | A | conf |
DATE
|
| 2012 | C | conf |
DSD
|
| 2011 | — | conf |
ICECS
|
| 2011 | J | jnl |
Microprocess. Microsystems
|
| 2011 | J | jnl |
Microelectron. J.
|
| 2011 | C | conf |
EUC
|
| 2011 | C | conf |
DSD
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2011 | A | conf |
DATE
|
| 2011 | A | conf |
DATE
|
| 2011 | C | conf |
IOLTS
|
| 2010 | C | conf |
DSD
|
| 2010 | A | conf |
DSN
|
| 2010 | J | jnl |
Integr.
|
| 2010 | C | conf |
DSD
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2010 | J | jnl |
Microprocess. Microsystems
|
| 2010 | C | conf |
ICCD
|
| 2010 | — | conf |
BMAS
|
| 2010 | C | conf |
PRDC
|
| 2010 | C | conf |
ISORC
|
| 2010 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2009 | B | conf |
ARES
|
| 2009 | — | conf |
LADC
|
| 2009 | B | conf |
ARES
|
| 2009 | C | conf |
IOLTS
|
| 2009 | Misc | ed. |
|
| 2009 | A | conf |
DSN
|
| 2009 | B | conf |
ETS
|
| 2009 | B | conf |
ARES
|
| 2009 | — | conf |
ISQED
|
| 2009 | J | jnl |
Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies.
IET Comput. Digit. Tech.
|
| 2009 | C | conf |
PDP
|
| 2008 | — | conf |
HASE
|
| 2008 | — | conf |
EUC (1)
|
| 2008 | Misc | conf |
VLSI Design
|
| 2008 | — | conf |
DFT
|
| 2008 | — | conf |
DFT
|
| 2008 | B | conf |
ARES
|
| 2008 | — | conf |
EUC (1)
|
| 2008 | J | jnl |
J. Electron. Test.
|
| 2008 | J | jnl |
Microelectron. Reliab.
|
| 2008 | B | conf |
FEDC: Control Flow Error Detection and Correction for Embedded Systems without Program Interruption.
ARES
|
| 2008 | — | conf |
SSIRI
|
| 2008 | B | conf |
ARES
|
| 2008 | B | conf |
SAFECOMP
|
| 2007 | C | conf |
PRDC
|
| 2007 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2007 | C | conf |
PRDC
|
| 2007 | C | conf |
ISCAS
|
| 2007 | C | conf |
ISCAS
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2007 | — | conf |
CNSR
|
| 2007 | A | conf |
IPDPS
|
| 2007 | A | conf |
IPDPS
|
| 2007 | A | conf |
DSN
|
| 2007 | — | conf |
ICN
|
| 2007 | A | conf |
DATE
|
| 2007 | — | conf |
ICECS
|
| 2007 | — | conf |
ISQED
|
| 2007 | C | conf |
ISCAS
|
| 2007 | C | conf |
AICCSA
|
| 2006 | — | conf |
DFT
|
| 2006 | C | conf |
DASC
|
| 2006 | J | jnl |
Microelectron. Reliab.
|
| 2006 | J | jnl |
Microelectron. Reliab.
|
| 2006 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2006 | J | jnl |
J. Circuits Syst. Comput.
|
| 2006 | — | conf |
SASN
|
| 2006 | C | conf |
IES
|
| 2006 | J | jnl |
Microelectron. Reliab.
|
| 2005 | — | conf |
LADC
|
| 2005 | C | conf |
PRDC
|
| 2005 | — | conf |
DFT
|
| 2005 | — | conf |
Parallel and Distributed Computing and Networks
|
| 2005 | C | conf |
PRDC
|
| 2005 | — | conf |
Systems Communications
|
| 2005 | A | conf |
ISLPED
|
| 2005 | — | conf |
Parallel and Distributed Computing and Networks
|
| 2005 | — | conf |
ECBS
|
| 2005 | — | conf |
Parallel and Distributed Computing and Networks
|
| 2005 | — | conf |
LADC
|
| 2004 | B | conf |
SAFECOMP
|
| 2004 | — | conf |
ESA/VLSI
|
| 2004 | C | conf |
PRDC
|
| 2004 | J | jnl |
J. Electron. Test.
|
| 2004 | C | conf |
PRDC
|
| 2004 | C | conf |
IOLTS
|
| 2004 | J | jnl |
Microelectron. Reliab.
|
| 2004 | J | jnl |
Microprocess. Microsystems
|
| 2004 | C | conf |
IOLTS
|
| 2004 | — | conf |
MSV/AMCS
|
| 2003 | A | conf |
DSN
|
| 2003 | — | conf |
DFT
|
| 2003 | C | conf |
ISPDC
|
| 2003 | — | conf |
FPT
|
| 2003 | B | conf |
FPL
|
| 2003 | A* | conf |
DAC
|
| 2002 | B | conf |
FPL
|
| 2002 | — | conf |
FPT
|
| 1992 | — | conf |
FTCS
|