| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
IEEE Access
|
| 2022 | C | conf |
IECON
|
| 2022 | — | conf |
ICSRS
|
| 2022 | — | conf |
ISIE
|
| 2021 | C | conf |
IECON
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | — | conf |
CDC
|
| 2016 | J | jnl |
IEEE Trans. Robotics
|
| 2016 | — | conf |
MS
|
| 2016 | C | conf |
ACC
|
| 2016 | — | conf |
CDC
|
| 2015 | C | conf |
IAS
|
| 2015 | — | conf |
ECC
|
| 2015 | — | conf |
EUROCON
|
| 2015 | J | jnl |
Eur. J. Control
|
| 2015 | C | conf |
IAS
|
| 2014 | J | jnl |
Comparison of temperature limits for Trench silicon IGBT technologies for medium power applications.
Microelectron. Reliab.
|
| 2014 | C | conf |
IAS
|
| 2014 | — | conf |
MED
|
| 2013 | J | jnl |
Sensors
|
| 2013 | — | conf |
MED
|
| 2013 | — | conf |
CDC
|
| 2012 | C | conf |
IECON
|
| 2012 | A | conf |
IROS
|
| 2012 | J | jnl |
IEEE Trans. Autom. Control.
|
| 2010 | C | conf |
IAS
|