| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
Int. J. Syst. Sci.
|
| 2024 | J | jnl |
Int. J. Model. Identif. Control.
|
| 2023 | C | conf |
ACC
|
| 2023 | C | conf |
ACC
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
Int. J. Syst. Sci.
|
| 2014 | — | conf |
ISIE
|
| 2013 | C | conf |
IECON
|
| 2011 | J | jnl |
Soft Comput.
|
| 2011 | — | conf |
CDC/ECC
|
| 2011 | — | conf |
CCE
|
| 2011 | — | conf |
Fault Tolerant Computing Paradigm for Random Molecular Phenomena: Hopfield Gates and Logic Networks.
ISMVL
|
| 2011 | — | conf |
CCE
|
| 2011 | — | conf |
CDC/ECC
|
| 2007 | — | conf |
CDC
|
| 2007 | — | conf |
CDC
|
| 2005 | — | conf |
ISMVL
|
| 2005 | — | conf |
ISMVL
|
| 2004 | C | conf |
ACC
|
| 2004 | C | conf |
ACC
|
| 2003 | — | conf |
CDC
|
| 2003 | — | conf |
CDC
|
| 2002 | J | jnl |
Autom.
|
| 2002 | J | jnl |
Int. J. Comput. Their Appl.
|
| 2002 | — | conf |
CDC
|
| 2002 | — | conf |
CDC
|
| 2002 | — | conf |
CDC
|
| 2002 | — | conf |
CDC
|
| 2002 | — | conf |
CDC
|
| 2002 | — | conf |
CDC
|
| 2002 | — | conf |
CDC
|
| 2002 | J | jnl |
Int. J. Syst. Sci.
|
| 2001 | C | conf |
ACC
|
| 2001 | C | conf |
ACC
|
| 2001 | C | conf |
ACC
|
| 2001 | C | conf |
ACC
|
| 2001 | C | conf |
ACC
|
| 2001 | C | conf |
ACC
|
| 2001 | C | conf |
ACC
|
| 2001 | C | conf |
ACC
|
| 2001 | C | conf |
ACC
|
| 2001 | C | conf |
ACC
|
| 2001 | — | conf |
CDC
|
| 2001 | C | conf |
ACC
|
| 2001 | C | conf |
ACC
|
| 2001 | J | jnl |
Int. J. Comput. Their Appl.
|
| 2001 | — | conf |
CDC
|
| 2000 | C | conf |
ACC
|
| 2000 | C | conf |
ACC
|
| 2000 | C | conf |
ACC
|
| 2000 | C | conf |
ACC
|
| 2000 | C | conf |
ACC
|
| 2000 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2000 | C | conf |
ACC
|
| 2000 | J | jnl |
Int. J. Syst. Sci.
|
| 2000 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2000 | C | conf |
ACC
|
| 2000 | C | conf |
ACC
|
| 2000 | C | conf |
ACC
|
| 1999 | J | jnl |
Int. J. Syst. Sci.
|
| 1998 | J | jnl |
Autom.
|
| 1998 | J | jnl |
Autom.
|