Sergey Bychikhin

19 papers Journal 19
YearRankTypeTitle / Venue / Authors
2013 J jnl
Statistics and localisation of vertical breakdown in AlGaN/GaN HEMTs on SiC and Si substrates for power applications.
Microelectron. Reliab.
Clément Fleury, Rimma Zhytnytska, Sergey Bychikhin, Mattia Capriotti, Oliver Hilt, Domenica Visalli, Gaudenzio Meneghesso, Enrico Zanoni, Joachim Würfl, Joff Derluyn, Gottfried Strasser, Dionyz Pogany
2012 J jnl
Electro-thermal characterization and simulation of integrated multi-trenched XtreMOS
Microelectron. J.
J. Rhayem, B. Besbes, Raul Blecic, Sergey Bychikhin, Georg Haberfehlner, Dionyz Pogany, B. Desoete, Renaud Gillon, Aarnout Wieers, Marnix Tack
2012 J jnl
HMM-TLP correlation for system-efficient ESD design.
Microelectron. Reliab.
Guido Notermans, Sergey Bychikhin, Dionyz Pogany, David Johnsson, Dejan M. Maksimovic
2012 J jnl
IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors.
Microelectron. Reliab.
Paul Marko, Matteo Meneghini, Sergey Bychikhin, Denis Marcon, Gaudenzio Meneghesso, Enrico Zanoni, Dionyz Pogany
2011 J jnl
Application of transient interferometric mapping method for ESD and latch-up analysis.
Microelectron. Reliab.
Dionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik
2010 J jnl
Investigation of smart power DMOS devices under repetitive stress conditions using transient thermal mapping and numerical simulation.
Microelectron. Reliab.
Sergey Bychikhin, Georg Haberfehlner, J. Rhayem, Daniel Vanderstraeten, Renaud Gillon, Dionyz Pogany
2009 J jnl
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.
Microelectron. Reliab.
Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany
2007 J jnl
Backside interferometric methods for localization of ESD-induced leakage current and metal shorts.
Microelectron. Reliab.
Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler
2007 J jnl
Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices.
Microelectron. Reliab.
Michael Heer, Sergey Bychikhin, W. Mamanee, Dionyz Pogany, A. Heid, P. Grombach, M. Klaussner, Winfried Soppa, Bernd Ramler
2007 J jnl
Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient interferometric mapping.
Microelectron. Reliab.
Sergey Bychikhin, T. Swietlik, Tadeusz Suski, Sylwester Porowski, Piotr Perlin, Dionyz Pogany
2006 J jnl
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.
Microelectron. Reliab.
Michael Heer, Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Frank, A. Konrad, J. Schulz
2005 J jnl
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectron. Reliab.
Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos
2005 J jnl
Scanning heterodyne interferometer setup for the time-resolved thermal and free-carrier mapping in semiconductor devices.
IEEE Trans. Instrum. Meas.
Martin Litzenberger, Christoph Furböck, Sergey Bychikhin, Dionyz Pogany, Erich Gornik
2004 J jnl
Multiple-time-instant 2D thermal mapping during a single ESD event.
Microelectron. Reliab.
Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik
2004 J jnl
Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress.
Microelectron. Reliab.
Sergey Bychikhin, Viktor Dubec, Dionyz Pogany, Erich Gornik, M. Graf, V. Dudek, Winfried Soppa
2003 J jnl
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.
Microelectron. Reliab.
Viktor Dubec, Sergey Bychikhin, M. Blaho, Dionyz Pogany, Erich Gornik, J. Willemen, Ning Qu, Wolfgang Wilkening, L. Zullino, A. Andreini
2002 J jnl
Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique.
Microelectron. Reliab.
Dionyz Pogany, Ján Kuzmík, Juraj Darmo, Martin Litzenberger, Sergey Bychikhin, Karl Unterrainer, Z. Mozolova, S. Hascik, Tibor Lalinsky, Erich Gornik
2001 J jnl
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices.
Microelectron. Reliab.
Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner
2001 J jnl
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.
Microelectron. Reliab.
Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, Gerhard Groos, Matthias Stecher