Sergej Deutsch

27 papers A* 1A 8B 1C 3Journal 9Unranked 5
YearRankTypeTitle / Venue / Authors
2021 A* conf
Cryptographic Capability Computing.
MICRO
Michael LeMay, Joydeep Rakshit, Sergej Deutsch, David M. Durham, Santosh Ghosh, Anant Nori, Jayesh Gaur, Andrew Weiler, Salmin Sultana, Karanvir Grewal, Sreenivas Subramoney
2020 J jnl
Gimli Encryption in 715.9 psec.
IACR Cryptol. ePrint Arch.
Santosh Ghosh, Michael E. Kounavis, Sergej Deutsch
2020 C conf
K-Cipher: A Low Latency, Bit Length Parameterizable Cipher.
ISCC
Michael E. Kounavis, Sergej Deutsch, Santosh Ghosh, David Durham
2020 J jnl
Security definitions, entropy measures and constructions for implicitly detecting data corruption.
Comput. Commun.
Michael E. Kounavis, David Durham, Sergej Deutsch, Ken Grewal
2020 J jnl
The MAGIC Mode for Simultaneously Supporting Encryption, Message Authentication and Error Correction.
IACR Cryptol. ePrint Arch.
Michael E. Kounavis, David Durham, Sergej Deutsch, Krystian Matusiewicz, David Wheeler
2020 J jnl
Κ-Cipher: A Low Latency, Bit Length Parameterizable Cipher.
IACR Cryptol. ePrint Arch.
Michael E. Kounavis, Sergej Deutsch, Santosh Ghosh, David Durham
2019 C conf
IVP: A Three Level Confusion-Diffusion Network Supporting Implicit Data Integrity.
ISCC
Michael E. Kounavis, David Durham, Sergej Deutsch, Ken Grewal
2018 J jnl
Cryptographic Constructions Supporting Implicit Data Integrity.
IACR Cryptol. ePrint Arch.
Michael E. Kounavis, David Durham, Sergej Deutsch, Antonios Papadimitriou, Amitabh Das
2018 — conf
Implicit Data Integrity: Protecting User Data without MACs.
ICETE (2)
Michael E. Kounavis, David Durham, Sergej Deutsch, Saeedeh Komijani
2018 — conf
There is No Need to Waste Communication Bandwidth on MACs.
GIIS
Michael E. Kounavis, David Durham, Sergej Deutsch, Saeedeh Komijani, Antonios Papadimitriou, Ken Grewal
2017 C conf
Non-recursive computation of the probability of more than two people having the same birthday.
ISCC
Michael E. Kounavis, Sergej Deutsch, David Durham, Saeedeh Komijani
2016 A conf
The hype, myths, and realities of testing 3D integrated circuits.
ICCAD
Ran Wang, Sergej Deutsch, Mukesh Agrawal, Krishnendu Chakrabarty
2015 A conf
Contactless pre-bond TSV fault diagnosis using duty-cycle detectors and ring oscillators.
ITC
Sergej Deutsch, Krishnendu Chakrabarty
2015 J jnl
Robust Optimization of Test-Access Architectures Under Realistic Scenarios.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Sergej Deutsch, Krishnendu Chakrabarty, Erik Jan Marinissen
2015 — conf
Software-based test and diagnosis of SoCs using embedded and wide-I/O DRAM.
ASP-DAC
Sergej Deutsch, Krishnendu Chakrabarty
2015 A conf
Test and debug solutions for 3D-stacked integrated circuits.
ITC
Sergej Deutsch, Krishnendu Chakrabarty
2014 J jnl
Contactless Pre-Bond TSV Test and Diagnosis Using Ring Oscillators and Multiple Voltage Levels.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Sergej Deutsch, Krishnendu Chakrabarty
2014 A conf
Massive signal tracing using on-chip DRAM for in-system silicon debug.
ITC
Sergej Deutsch, Krishnendu Chakrabarty
2014 J jnl
Test and Design-for-Testability Solutions for 3D Integrated Circuits.
Inf. Media Technol.
Krishnendu Chakrabarty, Mukesh Agrawal, Sergej Deutsch, Brandon Noia, Ran Wang, Fangming Ye
2014 J jnl
Test and Design-for-Testability Solutions for 3D Integrated Circuits.
IPSJ Trans. Syst. LSI Des. Methodol.
Krishnendu Chakrabarty, Mukesh Agrawal, Sergej Deutsch, Brandon Noia, Ran Wang, Fangming Ye
2014 A conf
Vesuvius-3D: A 3D-DfT demonstrator.
ITC
Erik Jan Marinissen, Bart De Wachter, Stephen O'Loughlin, Sergej Deutsch, Christos Papameletis, Tobias Burgherr
2013 A conf
Non-invasive pre-bond TSV test using ring oscillators and multiple voltage levels.
DATE
Sergej Deutsch, Krishnendu Chakrabarty
2013 B conf
Robust optimization of test-architecture designs for core-based SoCs.
ETS
Sergej Deutsch, Krishnendu Chakrabarty
2013 A conf
Uncertainty-aware robust optimization of test-access architectures for 3D stacked ICs.
ITC
Sergej Deutsch, Krishnendu Chakrabarty, Erik Jan Marinissen
2012 A conf
DfT architecture and ATPG for Interconnect tests of JEDEC Wide-I/O memory-on-logic die stacks.
ITC
Sergej Deutsch, Brion L. Keller, Vivek Chickermane, Subhasish Mukherjee, Navdeep Sood, Sandeep Kumar Goel, Ji-Jan Chen, Ashok Mehta, Frank Lee, Erik Jan Marinissen
2012 — conf
TSV Stress-Aware ATPG for 3D Stacked ICs.
Asian Test Symposium
Sergej Deutsch, Krishnendu Chakrabarty, Shreepad Panth, Sung Kyu Lim
2011 — conf
Automation of 3D-DfT Insertion.
Asian Test Symposium
Sergej Deutsch, Vivek Chickermane, Brion L. Keller, Subhasish Mukherjee, Mario Konijnenburg, Erik Jan Marinissen, Sandeep Kumar Goel