Sergei Kostin - RankMe

24 papers C 8Journal 4Unranked 11

Year	Rank	Type	Title / Venue / Authors
2018	J	`jnl`	Fast identification of true critical paths in sequential circuits. Microelectron. Reliab. Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Lembit Jürimägi
2018	—	`conf`	Hierarchical Timing-Critical Paths Analysis in Sequential Circuits. PATMOS Lembit Jurimagi, Raimund Ubar, Maksim Jenihhin, Jaan Raik, Sergei Devadze, Sergei Kostin
2018	—	`conf`	Parallel Critical Path Tracing Fault Simulation in Sequential Circuits. MIXDES Jaak Kousaar, Raimund Ubar, Sergei Kostin, Sergei Devadze, Jaan Raik
2017	C	`conf`	A scalable technique to identify true critical paths in sequential circuits. DDECS Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik
2017	—	`ed.`	VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability - 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers VLSI-SoC (Selected Papers) Thomas Hollstein, Jaan Raik, Sergei Kostin, Anton Tsertov, Ian O'Connor, Ricardo Reis
2016	—	`conf`	A novel random approach to diagnostic test generation. NORCAS Emmanuel Ovie Osimiry, Raimund Ubar, Sergei Kostin, Jaan Raik
2016	—	`conf`	A tool set for teaching design-for-testability of digital circuits. EWME Sergei Kostin, Elmet Orasson, Raimund Ubar
2016	—	`conf`	Gate-level modelling of NBTI-induced delays under process variations. LATS Thiago Copetti, Guilherme Medeiros Machado, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar
2016	J	`jnl`	Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. J. Electron. Test. Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros
2015	—	`conf`	Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG. LATS N. Palermo, Valentin Tihhomirov, Thiago Santos Copetti, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Marco Gaudesi, Giovanni Squillero, Matteo Sonza Reorda, Fabian Vargas, Letícia Maria Bolzani Pöhls
2015	C	`conf`	SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic. DDECS Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Pöhls
2014	—	`conf`	Hierarchical identification of NBTI-critical gates in nanoscale logic. LATW Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Fabian Vargas, Letícia Maria Bolzani Poehls, Thiago Santos Copetti
2013	J	`jnl`	Accurate Dialysis Dose Evaluation and Extrapolation Algorithms During Online Optical Dialysis Monitoring. IEEE Trans. Biomed. Eng. Ivo Fridolin, Deniss Karai, Sergei Kostin, Raimund Ubar
2013	C	`conf`	Identifying NBTI-Critical Paths in Nanoscale Logic. DSD Raimund Ubar, Fabian Vargas, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Letícia Maria Bolzani Poehls
2013	—	`conf`	Synthesis of multiple fault oriented test groups from single fault test sets. DTIS Raimund Ubar, Sergei Kostin, Jaan Raik
2012	—	`conf`	About robustness of test patterns regarding multiple faults. LATW Raimund Ubar, Sergei Kostin, Jaan Raik
2012	C	`conf`	How to Prove that a Circuit is Fault-Free? DSD Raimund Ubar, Sergei Kostin, Jaan Raik
2012	C	`conf`	Multiple stuck-at-fault detection theorem. DDECS Raimund Ubar, Sergei Kostin, Jaan Raik
2011	C	`conf`	Defect-oriented module-level fault diagnosis in digital circuits. DDECS Sergei Kostin, Raimund Ubar, Jaan Raik
2009	C	`conf`	Block-Level Fault Model-Free Debug and Diagnosis in Digital Systems. DSD Raimund Ubar, Sergei Kostin, Jaan Raik
2009	—	`conf`	Diagnozer: A laboratory tool for teaching research in diagnosis of electronic systems. MSE Raimund Ubar, Artur Jutman, Jaan Raik, Sergei Kostin, Heinz-Dietrich Wuttke
2009	—	`conf`	Investigations of the diagnosibility of digital networks with BIST. LATW Raimund Ubar, Sergei Kostin, Jaan Raik
2008	J	`jnl`	Embedded fault diagnosis in digital systems with BIST. Microprocess. Microsystems Raimund Ubar, Sergei Kostin, Jaan Raik
2007	C	`conf`	Fault Diagnosis in Integrated Circuits with BIST. DSD Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evartson, Harri Lensen