| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2024 | — | conf |
NorCAS
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
LATS
|
| 2023 | — | conf |
DFT
|
| 2023 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2019 | C | conf |
IOLTS
|
| 2018 | — | conf |
PATMOS
|
| 2018 | — | conf |
MIXDES
|
| 2017 | J | jnl |
IEEE Des. Test
|
| 2017 | A | conf |
ITC
|
| 2017 | J | jnl |
IEEE Instrum. Meas. Mag.
|
| 2016 | A | conf |
ITC
|
| 2016 | C | conf |
FDL
|
| 2016 | B | conf |
ETS
|
| 2016 | — | conf |
LATS
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2015 | C | conf |
ISCAS
|
| 2015 | A | conf |
DATE
|
| 2015 | J | jnl |
Microprocess. Microsystems
|
| 2015 | J | jnl |
Microprocess. Microsystems
|
| 2015 | — | conf |
LATS
|
| 2014 | — | conf |
NATW
|
| 2014 | C | conf |
DSD
|
| 2014 | — | conf |
ATS
|
| 2013 | — | conf |
NORCHIP
|
| 2013 | J | jnl |
IEEE Des. Test
|
| 2013 | — | conf |
MIXDES
|
| 2012 | B | conf |
ETS
|
| 2012 | A | conf |
ITC
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | J | jnl |
Scalable Comput. Pract. Exp.
|
| 2011 | — | conf |
ReCoSoC
|
| 2011 | C | conf |
DSD
|
| 2010 | — | conf |
BASYS
|
| 2010 | Misc | conf |
IDC
|
| 2010 | — | conf |
DELTA
|
| 2010 | A | conf |
DATE
|
| 2010 | C | conf |
DSD
|
| 2010 | — | conf |
EWDTS
|
| 2009 | A | conf |
ITC
|
| 2009 | — | conf |
LATW
|
| 2008 | — | conf |
DELTA
|
| 2008 | — | conf |
ASP-DAC
|
| 2007 | J | jnl |
Int. J. Online Eng.
|
| 2007 | B | conf |
ETS
|
| 2006 | — | conf |
LATW
|
| 2005 | Misc | conf |
EDCC
|