| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
IEEE Internet Things J.
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
Sensors
|
| 2021 | Misc | conf |
RoViSP
|
| 2021 | J | jnl |
J. Big Data
|
| 2021 | J | jnl |
Sensors
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | — | conf |
I2MTC
|
| 2020 | — | conf |
I2MTC
|
| 2020 | — | conf |
I2MTC
|
| 2020 | J | jnl |
IEEE Instrum. Meas. Mag.
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2019 | — | conf |
I2MTC
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Instrum. Meas. Mag.
|
| 2019 | — | conf |
I2MTC
|
| 2019 | — | conf |
I2MTC
|
| 2018 | — | conf |
I2MTC
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | — | conf |
I2MTC
|
| 2018 | — | conf |
I2MTC
|
| 2017 | — | conf |
I2MTC
|
| 2017 | — | conf |
I2MTC
|
| 2017 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2017 | — | conf |
I2MTC
|
| 2016 | — | conf |
I2MTC
|
| 2016 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2016 | — | conf |
I2MTC
|
| 2016 | J | jnl |
Pattern Recognit.
|
| 2015 | — | ed. |
ICARA
|
| 2015 | J | jnl |
IEEE Access
|
| 2015 | — | conf |
I2MTC
|
| 2015 | — | conf |
ICARA
|
| 2015 | — | conf |
I2MTC
|
| 2015 | — | conf |
ICARA
|
| 2014 | B | conf |
SAS
|
| 2013 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2013 | J | jnl |
IEEE Des. Test
|
| 2013 | — | ed. |
ICARA (selected extended papers)
|
| 2013 | — | conf |
I2MTC
|
| 2011 | — | ed. |
VECIMS
|
| 2011 | — | conf |
DELTA
|
| 2011 | — | conf |
DELTA
|
| 2011 | — | conf |
DELTA
|
| 2011 | — | conf |
DELTA
|
| 2011 | J | jnl |
Pattern Recognit. Lett.
|
| 2011 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2011 | — | conf |
ICARA
|
| 2011 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2010 | — | conf |
DELTA
|
| 2010 | — | conf |
DELTA
|
| 2010 | — | conf |
DELTA
|
| 2010 | — | conf |
DELTA
|
| 2009 | J | jnl |
Int. J. Intell. Syst. Technol. Appl.
|
| 2009 | J | jnl |
Int. J. Intell. Syst. Technol. Appl.
|
| 2009 | — | conf |
ICARA
|
| 2008 | — | conf |
DELTA
|
| 2007 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2007 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2007 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2006 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2006 | — | conf |
DELTA
|
| 2006 | — | conf |
DELTA
|
| 2006 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2006 | J | jnl |
IEEE Des. Test Comput.
|
| 2006 | — | conf |
ICN/ICONS/MCL
|
| 2005 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2005 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2004 | — | conf |
DELTA
|
| 2003 | — | conf |
ICECS
|
| 2003 | J | jnl |
IEEE Trans. Reliab.
|
| 2002 | J | jnl |
Neurocomputing
|
| 2002 | — | conf |
DELTA
|
| 2002 | — | conf |
DELTA
|
| 2002 | — | conf |
DELTA
|
| 2002 | — | conf |
DELTA
|
| 2001 | — | conf |
Asian Test Symposium
|
| 2000 | J | jnl |
J. Electron. Test.
|
| 2000 | — | conf |
DFT
|
| 1999 | — | conf |
Asian Test Symposium
|
| 1998 | — | conf |
DFT
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1996 | — | conf |
Asian Test Symposium
|
| 1995 | — | conf |
Asian Test Symposium
|