Seongmoon Wang

40 papers A* 2A 16B 1C 1Misc 4Journal 11Unranked 5

Year	Rank	Type	Title / Venue / Authors
2011	Misc	`conf`	An efficient method to screen resistive opens under presence of process variation. VTS Seongmoon Wang
2010	J	`jnl`	A Low Hardware Overhead Self-Diagnosis Technique Using Reed-Solomon Codes for Self-Repairing Chips. IEEE Trans. Computers Xiangyu Tang, Seongmoon Wang
2010	J	`jnl`	A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support. IEEE Trans. Very Large Scale Integr. Syst. Seongmoon Wang, Wenlong Wei, Zhanglei Wang
2009	A	`conf`	A self-diagnosis technique using Reed-Solomon codes for self-repairing chips. DSN Xiangyu Tang, Seongmoon Wang
2009	J	`jnl`	Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang
2009	A	`conf`	Machine learning-based volume diagnosis. DATE Seongmoon Wang, Wenlong Wei
2008	J	`jnl`	An Efficient Unknown BlockingScheme for Low Control Data Volume and High Observability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Seongmoon Wang, Wenlong Wei
2008	—	`conf`	Cost Efficient Methods to Improve Performance of Broadcast Scan. ATS Seongmoon Wang, Wenlong Wei
2008	B	`conf`	Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. ETS Seongmoon Wang, Wenlong Wei
2008	J	`jnl`	X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors. IEEE Trans. Computers Seongmoon Wang, Kedarnath J. Balakrishnan, Wenlong Wei
2007	J	`jnl`	A BIST TPG for Low Power Dissipation and High Fault Coverage. IEEE Trans. Very Large Scale Integr. Syst. Seongmoon Wang
2007	—	`conf`	A High Compression and Short Test Sequence Test Compression Technique to Enhance Compressions of LFSR Reseeding. ATS Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar
2007	—	`conf`	A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture. ASP-DAC Seongmoon Wang, Wenlong Wei
2007	A	`conf`	A hybrid scheme for compacting test responses with unknown values. ICCAD Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei
2007	A	`conf`	A low cost test data compression technique for high n-detection fault coverage. ITC Seongmoon Wang, Zhanglei Wang, Wenlong Wei, Srimat T. Chakradhar
2007	A	`conf`	SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling. DATE Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang
2007	A	`conf`	Unknown blocking scheme for low control data volume and high observability. DATE Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar
2007	Misc	`conf`	Zero Cost Test Point Insertion Technique for Structured ASICs. VLSI Design Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell
2006	J	`jnl`	A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Seongmoon Wang, Srimat T. Chakradhar
2006	A	`conf`	Coverage loss by using space compactors in presence of unknown values. DATE Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei, Kwang-Ting Cheng
2006	A	`conf`	Efficient unknown blocking using LFSR reseeding. DATE Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar
2006	J	`jnl`	LT-RTPG: a new test-per-scan BIST TPG for low switching activity. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Seongmoon Wang, Sandeep K. Gupta
2006	Misc	`conf`	PIDISC: Pattern Independent Design Independent Seed Compression Technique. VLSI Design Kedarnath J. Balakrishnan, Seongmoon Wang, Srimat T. Chakradhar
2006	A*	`conf`	Unknown-tolerance analysis and test-quality control for test response compaction using space compactors. DAC Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei
2006	—	`conf`	Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test Generation Time for Structured ASICs. ATS Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell
2005	C	`conf`	ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values. ICCD Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng
2005	Misc	`conf`	Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage. VLSI Design Wei Li, Seongmoon Wang, Srimat T. Chakradhar, Sudhakar M. Reddy
2005	A	`conf`	Response shaper: a novel technique to enhance unknown tolerance for output response compaction. ICCAD Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng
2005	A	`conf`	XWRC: externally-loaded weighted random pattern testing for input test data compression. ITC Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar
2004	A	`conf`	Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets. DATE Seongmoon Wang, Xiao Liu, Srimat T. Chakradhar
2004	—	`conf`	Re-configurable embedded core test protocol. ASP-DAC Seongmoon Wang, Srimat T. Chakradhar, Kedarnath J. Balakrishnan
2003	A	`conf`	A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan Designs. ITC Seongmoon Wang, Srimat T. Chakradhar
2002	J	`jnl`	An automatic test pattern generator for minimizing switching activity during scan testing activity. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Seongmoon Wang, Sandeep K. Gupta
2002	J	`jnl`	DS-LFSR: a BIST TPG for low switching activity. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Seongmoon Wang, Sandeep K. Gupta
2002	A	`conf`	Generation of Low Power Dissipation and High Fault Coverage Patterns for Scan-Based BIST. ITC Seongmoon Wang
1999	A	`conf`	LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation. ITC Seongmoon Wang, Sandeep K. Gupta
1998	J	`jnl`	ATPG for Heat Dissipation Minimization During Test Application. IEEE Trans. Computers Seongmoon Wang, Sandeep K. Gupta
1997	A*	`conf`	ATPG for Heat Dissipation Minimization During Scan Testing. DAC Seongmoon Wang, Sandeep K. Gupta
1997	A	`conf`	DS-LFSR: A New BIST TPG for Low Heat Dissipation. ITC Seongmoon Wang, Sandeep K. Gupta
1994	A	`conf`	ATPG for Heat Dissipation Minimization During Test Application. ITC Seongmoon Wang, Sandeep K. Gupta