Seong-Joon Kim

11 papers Journal 10Unranked 1
YearRankTypeTitle / Venue / Authors
2022 — conf
Multi-Label Facial Emotion Recognition Using Korean Drama Video Clips.
BigComp
Heeryon Cho, Woo Kyu Kang, Youn-Soo Park, Sun Geu Chae, Seong-Joon Kim
2019 J jnl
A cost-driven reliability demonstration plan based on accelerated degradation tests.
Reliab. Eng. Syst. Saf.
Seong-Joon Kim, Byeong Min Mun, Suk Joo Bae
2019 J jnl
Assessment of watershed health, vulnerability and resilience for determining protection and restoration Priorities.
Environ. Model. Softw.
So-Ra Ahn, Seong-Joon Kim
2019 J jnl
Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects.
IEEE Access
Seong-Joon Kim, Man Soo Kim, Suk Joo Bae
2016 J jnl
A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides.
IEEE Trans. Reliab.
Seong-Joon Kim, Tao Yuan, Suk Joo Bae
2016 J jnl
Bayesian degradation modeling for reliability prediction of organic light-emitting diodes.
J. Comput. Sci.
Suk Joo Bae, Tao Yuan, Seong-Joon Kim
2013 J jnl
Cost-effective degradation test plan for a nonlinear random-coefficients model.
Reliab. Eng. Syst. Saf.
Seong-Joon Kim, Suk Joo Bae
2013 J jnl
Simulation of a Geiger-Mode Imaging LADAR System for Performance Assessment.
Sensors
Seong-Joon Kim, Impyeong Lee, Yong Joon Kwon
2010 J jnl
Experiment and CFD simulation of hybrid SNCR-SCR using urea solution in a pilot-scale reactor.
Comput. Chem. Eng.
Thanh D. B. Nguyen, Young-Il Lim, Won-Hyeon Eom, Seong-Joon Kim, Kyung-Seun Yoo
2008 J jnl
Degradation Analysis of Nano-Contamination in Plasma Display Panels.
IEEE Trans. Reliab.
Suk Joo Bae, Seong-Joon Kim, Man Soo Kim, Bae Jin Lee, Chang Wook Kang
2007 J jnl
Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices.
IEEE Trans. Reliab.
Suk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam