Seokjun Jang

13 papers Journal 8Unranked 5
YearRankTypeTitle / Venue / Authors
2025 J jnl
A Novel Prediction-Based Two-Tiered ECC for Mitigating SWD Errors in HBM.
IEEE Trans. Very Large Scale Integr. Syst.
Youngki Moon, Seung Ho Shin, Seokjun Jang, Duyeon Won, Sungho Kang
2025 J jnl
Low Cost TSV Repair Architecture Using Switch-Based Matrix for Highly Clustered Faults.
IEEE Access
Seokjun Jang, Donghyun Han, Sunghoon Kim, Dayoung Kim, Sungho Kang
2025 J jnl
PASS: Pattern-Sequence-Authentication-Based Secure Scan Against Reverse Engineering Attacks.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Seokjun Jang, Youngki Moon, Duyeon Won, Sungho Kang
2023 — conf
LOTS: Low Overhead TSV Repair Method Using IEEE-1838 Standard Architecture.
ISOCC
Sunghoon Kim, Donghyun Han, Seokjun Jang, Sungho Kang
2023 J jnl
Scan Chain Architecture With Data Duplication for Multiple Scan Cell Fault Diagnosis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Sunghoon Kim, Seokjun Jang, Sungho Kang
2023 J jnl
Shift Left Quality Management System (QMS) Using a 3-D Matrix Scanning Method on System on a Chip.
IEEE Trans. Circuits Syst. II Express Briefs
Yong Lee, Seokjun Jang, Sungho Kang
2022 — conf
Pair-Grouping Scan Chain Architecture for Multiple Scan Cell Fault Diagnosis.
ISOCC
Sunghoon Kim, Seokjun Jang, Youngki Moon, Sungho Kang
2021 J jnl
A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key.
IEEE Access
Hyungil Woo, Seokjun Jang, Sungho Kang
2021 J jnl
Reconfigurable Scan Architecture for High Diagnostic Resolution.
IEEE Access
Seokjun Jang, Jihye Kim, Sungho Kang
2021 — conf
Secure Scan Design through Pseudo Fault Injection.
ISOCC
Seokjun Jang, Hyungil Woo, Sunghoon Kim, Sungho Kang
2020 J jnl
Fine-Grained Defect Diagnosis for CMOL FPGA Circuits.
IEEE Access
Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang
2020 — conf
Memory-like Defect Diagnosis for CMOL FPGAs.
ISOCC
Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, Sungho Kang
2018 — conf
A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain.
ISOCC
Hyeonchan Lim, Seokjun Jang, Sungho Kang