| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Access
|
| 2026 | — | conf |
AMC
|
| 2025 | J | jnl |
J. Robotics Mechatronics
|
| 2025 | J | jnl |
Adv. Robotics
|
| 2025 | — | conf |
ROBIO
|
| 2025 | — | conf |
ICM
|
| 2025 | J | jnl |
CoRR
|
| 2024 | — | conf |
ISIE
|
| 2024 | — | conf |
AMC
|
| 2024 | — | conf |
AMC
|
| 2024 | — | conf |
AMC
|
| 2024 | C | conf |
HSI
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | C | conf |
IECON
|
| 2024 | — | conf |
ISIE
|
| 2024 | J | jnl |
Adv. Robotics
|
| 2024 | C | conf |
IECON
|
| 2024 | C | conf |
IECON
|
| 2024 | — | conf |
AMC
|
| 2023 | — | conf |
ICM
|
| 2023 | — | conf |
ICM
|
| 2023 | — | conf |
ISIE
|
| 2023 | — | conf |
ICIT
|
| 2023 | — | conf |
AIM
|
| 2023 | — | conf |
ICM
|
| 2023 | C | conf |
IECON
|
| 2023 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2023 | C | conf |
IECON
|
| 2023 | — | conf |
ISIE
|
| 2023 | C | conf |
IECON
|
| 2022 | C | conf |
IECON
|
| 2022 | C | conf |
IECON
|
| 2022 | C | conf |
HSI
|
| 2022 | J | jnl |
CoRR
|
| 2022 | C | conf |
HSI
|
| 2022 | C | conf |
IECON
|
| 2022 | C | conf |
IECON
|
| 2022 | C | conf |
HSI
|
| 2021 | — | conf |
ICM
|
| 2021 | — | conf |
ISIE
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | — | conf |
ISIE
|
| 2021 | — | conf |
AMC
|
| 2021 | — | conf |
AMC
|
| 2021 | — | conf |
ISIE
|
| 2021 | C | conf |
IECON
|
| 2021 | — | conf |
AIM
|
| 2020 | J | jnl |
CoRR
|
| 2020 | — | conf |
ISIE
|
| 2020 | — | conf |
AMC
|
| 2020 | — | conf |
BioRob
|
| 2020 | — | conf |
AMC
|
| 2020 | — | conf |
ISIE
|
| 2020 | — | conf |
AIM
|
| 2020 | C | conf |
IECON
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | — | conf |
ICIT
|
| 2019 | — | conf |
ISIE
|
| 2019 | — | conf |
ICIT
|
| 2019 | — | conf |
ICIT
|
| 2019 | — | conf |
ICM
|
| 2019 | — | conf |
ICIT
|
| 2019 | — | conf |
ICIT
|
| 2019 | C | conf |
IECON
|
| 2019 | — | conf |
SII
|
| 2019 | C | conf |
IECON
|
| 2019 | J | jnl |
Autom.
|
| 2018 | — | conf |
ICIT
|
| 2018 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2018 | — | conf |
ISIE
|
| 2018 | — | conf |
ICIT
|
| 2018 | — | conf |
ICIT
|
| 2018 | — | conf |
AMC
|
| 2018 | — | conf |
ISIE
|
| 2018 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2018 | — | conf |
ICIT
|
| 2018 | — | conf |
ICIT
|
| 2018 | J | jnl |
Adv. Robotics
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | C | conf |
IECON
|
| 2017 | — | conf |
ICIT
|
| 2017 | — | conf |
ISIE
|
| 2017 | C | conf |
IECON
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | C | conf |
IECON
|
| 2017 | B | conf |
ICSR
|
| 2017 | — | conf |
AIM
|
| 2017 | C | conf |
IECON
|
| 2017 | — | conf |
ICM
|
| 2017 | — | conf |
ISIE
|
| 2017 | J | jnl |
Prod. Eng.
|
| 2017 | — | conf |
ISIE
|
| 2017 | — | conf |
ICM
|
| 2017 | — | conf |
ICM
|
| 2017 | — | conf |
AIM
|
| 2017 | C | conf |
IECON
|
| 2017 | C | conf |
IECON
|
| 2017 | — | conf |
ICM
|
| 2017 | — | conf |
SII
|
| 2016 | C | conf |
IECON
|
| 2016 | C | conf |
IECON
|
| 2016 | — | conf |
AMC
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | — | conf |
AIM
|
| 2016 | — | conf |
AMC
|
| 2016 | — | conf |
ISIE
|
| 2016 | C | conf |
IECON
|
| 2016 | — | conf |
ISIE
|
| 2016 | C | conf |
IECON
|
| 2015 | C | conf |
IECON
|
| 2015 | C | conf |
IECON
|
| 2015 | — | conf |
ICIT
|
| 2015 | C | conf |
IECON
|
| 2015 | C | conf |
IECON
|
| 2015 | — | conf |
ICM
|
| 2015 | C | conf |
IECON
|
| 2015 | — | conf |
ICM
|
| 2015 | C | conf |
IECON
|
| 2015 | — | conf |
URAI
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | C | conf |
Filtering of jitter based on inverse related filters and error corrector in network control systems.
IECON
|
| 2015 | C | conf |
INDIN
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | C | conf |
IECON
|
| 2015 | C | conf |
IECON
|
| 2015 | — | conf |
SII
|
| 2015 | — | conf |
ICM
|
| 2015 | — | conf |
ICM
|
| 2015 | — | conf |
ICM
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | — | conf |
ICM
|
| 2015 | C | conf |
IECON
|
| 2015 | C | conf |
IECON
|
| 2015 | — | conf |
ICM
|
| 2015 | — | conf |
ICM
|
| 2015 | — | conf |
AIM
|
| 2014 | — | conf |
ISIE
|
| 2014 | C | conf |
IECON
|
| 2014 | — | conf |
AMC
|
| 2014 | C | conf |
IECON
|
| 2014 | C | conf |
IECON
|
| 2014 | C | conf |
IECON
|
| 2014 | C | conf |
IECON
|
| 2014 | — | conf |
AMC
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | — | conf |
AMC
|
| 2014 | C | conf |
IECON
|
| 2014 | — | conf |
AMC
|
| 2014 | — | conf |
AMC
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | — | conf |
ISIE
|
| 2014 | — | conf |
AMC
|
| 2014 | C | conf |
IECON
|
| 2014 | — | conf |
AMC
|
| 2014 | — | conf |
AMC
|
| 2014 | — | conf |
ISIE
|
| 2014 | — | conf |
AMC
|
| 2014 | C | conf |
IECON
|
| 2014 | — | conf |
AMC
|
| 2014 | C | conf |
IECON
|
| 2014 | — | conf |
AMC
|
| 2014 | — | conf |
AMC
|
| 2013 | J | jnl |
Adv. Robotics
|
| 2013 | — | conf |
ICM
|
| 2013 | — | conf |
ICM
|
| 2013 | — | conf |
ICM
|
| 2013 | C | conf |
IECON
|
| 2013 | — | conf |
ISIE
|
| 2013 | — | conf |
ISIE
|
| 2013 | — | conf |
ISIE
|
| 2013 | C | conf |
IECON
|
| 2013 | — | conf |
ICM
|
| 2013 | C | conf |
IECON
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | C | conf |
IECON
|
| 2013 | — | conf |
ICM
|
| 2013 | — | conf |
ICM
|
| 2013 | — | conf |
ICM
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | — | conf |
ICM
|
| 2013 | — | conf |
ISIE
|
| 2013 | — | conf |
ISIE
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
IECON
|
| 2013 | — | conf |
ICM
|
| 2013 | C | conf |
IECON
|
| 2013 | — | conf |
ICM
|
| 2012 | — | conf |
ISIE
|
| 2012 | — | conf |
ISIE
|
| 2012 | — | conf |
AMC
|
| 2012 | — | conf |
AMC
|
| 2012 | C | conf |
IECON
|
| 2012 | — | conf |
AMC
|
| 2012 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2012 | — | conf |
AMC
|
| 2012 | C | conf |
IECON
|
| 2012 | C | conf |
IECON
|
| 2012 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2012 | C | conf |
IECON
|
| 2012 | — | conf |
SII
|
| 2012 | C | conf |
IECON
|
| 2012 | — | conf |
SII
|
| 2012 | — | conf |
AMC
|
| 2012 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2012 | — | conf |
SII
|
| 2012 | — | conf |
AMC
|
| 2012 | C | conf |
IECON
|
| 2012 | C | conf |
IECON
|
| 2012 | — | conf |
AMC
|
| 2012 | C | conf |
IECON
|
| 2012 | — | conf |
AMC
|
| 2012 | — | conf |
AMC
|
| 2012 | C | conf |
IECON
|
| 2012 | — | conf |
AMC
|
| 2012 | C | conf |
HSI
|
| 2012 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2012 | — | conf |
HAPTICS
|
| 2012 | C | conf |
IECON
|
| 2012 | — | conf |
AMC
|
| 2011 | J | jnl |
Int. J. Autom. Technol.
|
| 2011 | J | jnl |
Adv. Robotics
|
| 2010 | — | conf |
AMC
|
| 2010 | — | conf |
AMC
|
| 2010 | — | conf |
AMC
|
| 2010 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2010 | — | conf |
AMC
|
| 2010 | — | conf |
AMC
|
| 2010 | J | jnl |
Robotics Auton. Syst.
|
| 2010 | — | conf |
AMC
|
| 2010 | — | conf |
Stiffness modeling across transition temperatures in virtual environments by B-spline interpolation.
AMC
|
| 2010 | — | conf |
AMC
|
| 2010 | — | conf |
AMC
|
| 2009 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2009 | J | jnl |
Int. J. Autom. Technol.
|
| 2009 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2008 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2006 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2006 | B | conf |
SMC
|
| 2006 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2006 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2006 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2005 | J | jnl |
Annu. Rev. Control.
|
| 2005 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2004 | J | jnl |
IEEE Trans. Ind. Electron.
|