| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Proc. ACM Meas. Anal. Comput. Syst.
|
| 2025 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
Proc. ACM Manag. Data
|
| 2024 | — | conf |
BigComp
|
| 2024 | — | conf |
BigComp
|
| 2024 | — | conf |
RACS
|
| 2024 | J | jnl |
Softw. Pract. Exp.
|
| 2023 | — | conf |
DSN-S
|
| 2023 | — | conf |
NVMSA
|
| 2023 | Misc | conf |
SYSTOR
|
| 2023 | J | jnl |
IEEE Access
|
| 2022 | — | conf |
NVMSA
|
| 2022 | — | conf |
ICTC
|
| 2022 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
CoRR
|
| 2021 | — | conf |
DSN (Supplements)
|
| 2021 | J | jnl |
CoRR
|
| 2021 | — | conf |
ICTC
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | — | conf |
ICTC
|
| 2020 | B | conf |
RTCSA
|
| 2018 | — | conf |
ICOIN
|
| 2018 | — | conf |
SysTEX@CCS
|
| 2018 | — | conf |
STM
|
| 2017 | J | jnl |
Multim. Tools Appl.
|
| 2016 | — | conf |
MobiSys (Companion Volume)
|
| 2015 | — | conf |
HotPower@SOSP
|
| 2015 | J | jnl |
IEICE Electron. Express
|
| 2015 | C | conf |
ICCE
|
| 2015 | C | conf |
Test-driven development of consumer electronics device drivers: A user-level device driver approach.
ICCE
|
| 2011 | — | conf |
CCNC
|
| 2009 | — | conf |
CCNC
|