Scott Davidson

148 papers A 17Misc 4Journal 122Unranked 5
YearRankTypeTitle / Venue / Authors
2026 J jnl
On the Origin of AI Species.
IEEE Des. Test
Scott Davidson
2026 J jnl
The Internet Likes to Watch.
IEEE Des. Test
Scott Davidson
2025 J jnl
20 Years of IEEE CEDA and More of EDA.
IEEE Des. Test
Scott Davidson
2025 J jnl
Getting to Know All About Us.
IEEE Des. Test
Scott Davidson
2025 J jnl
Reliability for the Masses.
IEEE Des. Test
Scott Davidson
2025 J jnl
Small Smarts.
IEEE Des. Test
Scott Davidson
2025 J jnl
Stored Programs Restored.
IEEE Des. Test
Scott Davidson
2025 J jnl
This Stuff Is Great - Am I Right?
IEEE Des. Test
Scott Davidson
2024 J jnl
Attack of the AI Papers.
IEEE Des. Test
Scott Davidson
2024 J jnl
IC Phone Home!
IEEE Des. Test
Scott Davidson
2024 J jnl
Losing My Memory.
IEEE Des. Test
Scott Davidson
2024 J jnl
Niklaus Wirth (1934-2024) - An Appreciation.
IEEE Des. Test
Scott Davidson
2024 J jnl
Predictions.
IEEE Des. Test
Scott Davidson
2024 J jnl
The Joys of Open-Source Hardware.
IEEE Des. Test
Scott Davidson
2023 J jnl
Calling Yourself Back.
IEEE Des. Test
Scott Davidson
2023 J jnl
Is There an Answer?
IEEE Des. Test
Scott Davidson
2023 J jnl
Our Gated Community.
IEEE Des. Test
Scott Davidson
2023 J jnl
Training Data Sets: The Source of Our Woes?
IEEE Des. Test
Scott Davidson
2022 J jnl
25 Years (and a Bit More) of The Last Byte.
IEEE Des. Test
Scott Davidson
2022 J jnl
Benchmarking Benchmarking.
IEEE Des. Test
Scott Davidson
2022 J jnl
Security Arms Race.
IEEE Des. Test
Scott Davidson
2022 J jnl
Small Is Good.
IEEE Des. Test
Scott Davidson
2022 J jnl
Standing on the Shoulders of ...
IEEE Des. Test
Scott Davidson
2022 J jnl
The Memory Shuffle.
IEEE Des. Test
Scott Davidson
2021 J jnl
Bad Design Inside of You.
IEEE Des. Test
Scott Davidson
2021 J jnl
Being Learned.
IEEE Des. Test
Scott Davidson
2021 J jnl
Computing in the Real World.
IEEE Des. Test
Scott Davidson
2021 J jnl
Hacking in the Dark.
IEEE Des. Test
Scott Davidson
2021 J jnl
Security Begins at Home.
IEEE Des. Test
Scott Davidson
2021 J jnl
The Road to Open-Source EDA.
IEEE Des. Test
Scott Davidson
2020 J jnl
My Friendly Orange Glow.
IEEE Des. Test
Scott Davidson
2020 J jnl
The Last Byte: 3-D TV? We Got 6-D TV!
IEEE Des. Test
Scott Davidson
2020 J jnl
The Last Byte: Are You Sure You Love That Store?
IEEE Des. Test
Scott Davidson
2020 J jnl
The Last Byte: Big Data, Big Faults.
IEEE Des. Test
Scott Davidson
2020 J jnl
Too Many Cooks Make the Product.
IEEE Des. Test
Scott Davidson
2020 J jnl
Transitional Phones.
IEEE Des. Test
Scott Davidson
2019 J jnl
Is This a System?
IEEE Des. Test
Scott Davidson
2019 J jnl
The Last Byte: I Have Met the IoT Security Enemy and He Is Us.
IEEE Des. Test
Scott Davidson
2019 J jnl
The Last Byte: IoT and That Nagging Feeling.
IEEE Des. Test
Scott Davidson
2019 J jnl
The Last Byte: System Testing Ourselves.
IEEE Des. Test
Scott Davidson
2019 J jnl
The Last Byte: The Internet of People.
IEEE Des. Test
Scott Davidson
2018 J jnl
Computers with Tailfins?
IEEE Des. Test
Scott Davidson
2018 J jnl
Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology and Electronic Design Automation for IC System Design, Verification, and Testing.
IEEE Des. Test
Scott Davidson
2018 J jnl
Running on Empty.
IEEE Des. Test
Scott Davidson
2018 J jnl
Self-Test and Self-Aware.
IEEE Des. Test
Scott Davidson
2018 J jnl
Technobabble.
IEEE Des. Test
Scott Davidson
2018 J jnl
The Joy of Scheduling.
IEEE Des. Test
Scott Davidson
2018 J jnl
The Last Byte: Real Time, Real People.
IEEE Des. Test
Scott Davidson
2017 J jnl
Being Connected.
IEEE Des. Test
Scott Davidson
2017 J jnl
Chips Thinking About Chips.
IEEE Des. Test
Scott Davidson
2017 J jnl
Cyber-Physical System Design With Sensor Networking Technologies.
IEEE Des. Test
Scott Davidson
2017 J jnl
Dark Silicon, Antiparallelism, and Too Much Work.
IEEE Des. Test
Scott Davidson
2017 J jnl
Engineering Secure Internet of Things Systems.
IEEE Des. Test
Scott Davidson
2017 J jnl
Practice Makes Perfect.
IEEE Des. Test
Scott Davidson
2017 J jnl
Research Is Its Own Reward.
IEEE Des. Test
Scott Davidson
2017 J jnl
To Verification Infinity and Beyond.
IEEE Des. Test
Scott Davidson
2016 J jnl
And He Built a Crooked Chip.
IEEE Des. Test
Scott Davidson
2016 J jnl
Good Enough Computing.
IEEE Des. Test
Scott Davidson
2016 J jnl
The Five Stages of Project Grief.
IEEE Des. Test
Scott Davidson
2016 J jnl
The Intestinal Superhighway.
IEEE Des. Test
Scott Davidson
2016 J jnl
Where Are We Going?
IEEE Des. Test
Scott Davidson
2015 J jnl
A 3-D Forward into the Past.
IEEE Des. Test
Scott Davidson
2015 J jnl
Chips That Do Things.
IEEE Des. Test
Scott Davidson
2015 J jnl
Getting Credit.
IEEE Des. Test
Scott Davidson
2015 J jnl
Time Out of Mind.
IEEE Des. Test
Scott Davidson
2014 J jnl
50 Years of DAC Moments.
IEEE Des. Test
Scott Davidson
2014 J jnl
A Truly Wireless Future?
IEEE Des. Test
Scott Davidson
2014 J jnl
Hey, you, get onna my cloud [The Last Byte].
IEEE Des. Test
Scott Davidson
2013 J jnl
Planned Unobsolescence.
IEEE Des. Test
Scott Davidson
2012 J jnl
A World Without Standards.
IEEE Des. Test Comput.
Scott Davidson
2012 J jnl
At the beginning.
IEEE Des. Test Comput.
Scott Davidson
2012 J jnl
Energy Efficiency Like Your Momma Used to Make.
IEEE Des. Test Comput.
Scott Davidson
2012 A conf
Testing high-frequency and low-power designs: Do the standard rules and tools apply?
ITC
Scott Davidson
2012 J jnl
Yield of Black Swans.
IEEE Des. Test Comput.
Scott Davidson
2011 J jnl
All About Liquid Scan Chains - and More [review of "Digital Microfluidic Biochips: Design Automation and Optimization" (Chakrabarty, K. and Xu, T.; 2010)].
IEEE Des. Test Comput.
Scott Davidson
2011 A conf
Transition test bring-up and diagnosis on UltraSPARC
ITC
Liang-Chi Chen, Peter Dahlgren, Paul Dickinson, Scott Davidson
2010 J jnl
About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)].
IEEE Des. Test Comput.
Scott Davidson
2010 J jnl
Concurrent checking for logic [review of "New Methods of Concurrent Checking (Goessel, M., et al; 2008)].
IEEE Des. Test Comput.
Scott Davidson
2009 J jnl
A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)].
IEEE Des. Test Comput.
Scott Davidson
2009 J jnl
Book Review: A book on system test, and testing systems also.
IEEE Des. Test Comput.
Scott Davidson
2009 J jnl
Book Reviews: A guide for the wrapper perplexed.
IEEE Des. Test Comput.
Scott Davidson
2009 J jnl
The Last Byte: Too many reboots.
IEEE Des. Test Comput.
Scott Davidson
2009 A conf
Using transition test to understand timing behavior of logic circuits on UltraSPARC
ITC
Liang-Chi Chen, Paul Dickinson, Peter Dahlgren, Scott Davidson, Olivier Caty, Kevin Wu
2008 J jnl
Guest Editors' Introduction: Progress in Test Compression.
IEEE Des. Test Comput.
Scott Davidson, Nur A. Touba
2008 J jnl
How to make your own processor architecture.
IEEE Des. Test Comput.
Scott Davidson
2008 A conf
Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model.
ITC
Scott Davidson
2008 J jnl
The commonality of vector generation techniques.
IEEE Des. Test Comput.
Scott Davidson
2008 J jnl
With pick and shovel through our data.
IEEE Des. Test Comput.
Scott Davidson
2007 J jnl
A laboratory right under your nose.
IEEE Des. Test Comput.
Scott Davidson
2007 J jnl
A textbook with two target audiences.
IEEE Des. Test Comput.
Scott Davidson
2007 J jnl
Book Reviews: Test Tutorials in Book Form.
IEEE Des. Test Comput.
Scott Davidson
2007 J jnl
How do we train today's students to become tomorrow's engineers?
IEEE Des. Test Comput.
Scott Davidson
2007 J jnl
Losing control.
IEEE Des. Test Comput.
Scott Davidson
2007 J jnl
The Psychology of Electronic Test.
IEEE Des. Test Comput.
Scott Davidson, Helen Davidson
2006 A ed.
2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006
ITC
Scott Davidson, Anne Gattiker
2006 J jnl
All about getting it.
IEEE Des. Test Comput.
Scott Davidson
2006 J jnl
An insider's look at microprocessor design.
IEEE Des. Test Comput.
Scott Davidson
2006 A conf
Behavioral Test Economics.
ITC
Scott Davidson, Anthony P. Ambler, Helen Davidson
2006 J jnl
Book Reviews: A Comprehensive EDA Handbook.
IEEE Des. Test Comput.
Scott Davidson
2006 J jnl
Searching for clues: Diagnosing IC failures.
IEEE Des. Test Comput.
Scott Davidson
2006 J jnl
Who Reads This Stuff Anyway?
IEEE Des. Test Comput.
Scott Davidson
2005 J jnl
BIST the hard way.
IEEE Des. Test Comput.
Scott Davidson
2005 J jnl
Guest Editor's Introduction: ITC Examines How Test Helps the Fittest Survive.
IEEE Des. Test Comput.
Scott Davidson
2005 J jnl
Testing: It's not just pass/fail anymore.
IEEE Des. Test Comput.
Scott Davidson
2005 A conf
The ITC test compression shootout.
ITC
Scott Davidson
2005 Misc conf
Towards an Understanding of No Trouble Found Devices.
VTS
Scott Davidson
2005 A conf
Understanding NTF components from the field.
ITC
Scott Davidson
2005 J jnl
What's the problem?
IEEE Des. Test Comput.
Scott Davidson
2004 J jnl
A practical look at ATPG.
IEEE Des. Test Comput.
Scott Davidson
2004 J jnl
Design illiteracy.
IEEE Des. Test Comput.
Scott Davidson
2004 J jnl
Open-source hardware.
IEEE Des. Test Comput.
Scott Davidson
2004 J jnl
Paperless Design and Test.
IEEE Des. Test Comput.
Scott Davidson
2003 J jnl
All I Know I Learned at ITC.
IEEE Des. Test Comput.
Scott Davidson
2003 A conf
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data.
ITC
Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod
2002 A conf
On Identifying Indistinguishable Path Delay Faults and Improving Diagnosis.
ITC
Ramesh C. Tekumalla, Scott Davidson
2002 A conf
What Can IC Test Teach System Test?
ITC
Scott Davidson
2001 Misc conf
ATPG for Design Errors-Is It Possible?
VTS
Magdy S. Abadir, Scott Davidson, Vijay Nagasamy, Dhiraj K. Pradhan, Prab Varma
2001 Misc conf
An Evaluation of Pseudo Random Testing for Detecting Real Defects.
VTS
Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson
2001 J jnl
Welcome to 2001.
IEEE Des. Test Comput.
Scott Davidson
2000 J jnl
Guest Editors' Introduction: Benchmarking for Design and Test.
IEEE Des. Test Comput.
Scott Davidson, Justin E. Harlow III
2000 J jnl
Testing in 2100.
IEEE Des. Test Comput.
Scott Davidson
2000 J jnl
Twenty Years Ago Today.
IEEE Des. Test Comput.
Scott Davidson
1999 A conf
Changing our Path to High Level ATPG.
ITC
Scott Davidson
1999 J jnl
How Do I Boot Thee? Let Me Check Page 3.
IEEE Des. Test Comput.
Scott Davidson
1999 A conf
ITC'99 Benchmark Circuits - Preliminary Results.
ITC
Scott Davidson
1998 A conf
ASIC jeopardy-diagnosing without a FAB.
ITC
Scott Davidson
1998 J jnl
Minutes Found on a Cave Wall.
IEEE Des. Test Comput.
Scott Davidson
1998 Misc conf
Test Reuse at System Level.
VTS
José M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman
1998 J jnl
The Last Byte.
IEEE Des. Test Comput.
Scott Davidson
1998 J jnl
The Newer Colossus.
IEEE Des. Test Comput.
Scott Davidson
1997 J jnl
George learns test.
IEEE Des. Test Comput.
Scott Davidson
1997 J jnl
Why projects are late.
IEEE Des. Test Comput.
Scott Davidson
1996 J jnl
A test puzzle for a TGIF morning.
IEEE Des. Test Comput.
Scott Davidson
1996 J jnl
Base 1 logic: A method for environmentally friendly PC design.
IEEE Des. Test Comput.
Scott Davidson
1996 J jnl
How to achieve 95% fault coverage without really trying.
IEEE Des. Test Comput.
Scott Davidson
1994 A conf
Is I
ITC
Scott Davidson
1989 J jnl
Guest Editor's Introduction: Software Tools for Hardware Tests.
Computer
Scott Davidson
1986 A conf
ESIM/AFS : A Concurrent Architectural Level Fault Simulator.
ITC
Scott Davidson, James L. Lewandowski
1986 J jnl
Progress im High-Level Microprogramming.
IEEE Softw.
Scott Davidson
1985 — conf
High level design automation tools (session overview).
ACM Conference on Computer Science
Scott Davidson
1984 A conf
Fault Simulation at the Architectural Level.
ITC
Scott Davidson
1981 J jnl
Some Experiments in Local Microcode Compaction for Horizontal Machines.
IEEE Trans. Computers
Scott Davidson, David Landskov, Bruce D. Shriver, Patrick W. Mallett
1981 — conf
Specifying target resources in a machine independent higher level language.
AFIPS National Computer Conference
Scott Davidson, Bruce D. Shriver
1980 — conf
Firmware Engineering - Firmware Engineering.
Firmware Engineering
Bruce D. Shriver, Scott Davidson
1980 J jnl
Local Microcode Compaction Techniques.
ACM Comput. Surv.
David Landskov, Scott Davidson, Bruce D. Shriver, Patrick W. Mallett
1978 J jnl
An Overview of Firmware Engineering.
Computer
Scott Davidson, Bruce D. Shriver
1976 — conf
Testing of microprograms using the lockheed SUE microinstruction simulator.
ANSS
Scott Davidson, William Tao
1975 — conf
A network of dynamically microprogrammable machines.
MICRO (1)
Scott Davidson