Sassan Tabatabaei

26 papers A 5Misc 3Journal 9Unranked 9

Year	Rank	Type	Title / Venue / Authors
2020	—	`conf`	3.7 A 620µW BJT-Based Temperature-to-Digital Converter with 0.65mK Resolution and FoM of 190fJ·K ISSCC Saleh Heidary Shalmany, Kamran Souri, Uaur Sonmez, Kianoush Souri, Michele D'Urbino, Said Hussaini, Darryl Tauro, Sassan Tabatabaei
2017	J	`jnl`	A MEMS-Assisted Temperature Sensor With 20-µK Resolution, Conversion Rate of 200 S/s, and FOM of 0.04 pJK2. IEEE J. Solid State Circuits Meisam Heidarpour Roshan, Samira Zaliasl, Kimo Joo, Kamran Souri, Rajkumar Palwai, Lijun Will Chen, Amanpreet Singh, Sudhakar Pamarti, Nicholas Miller, Joseph C. Doll, Carl Arft, Sassan Tabatabaei, Carl Sechen, Aaron Partridge, Vinod Menon
2016	—	`conf`	11.1 Dual-MEMS-resonator temperature-to-digital converter with 40 K resolution and FOM of 0.12pJK2. ISSCC Meisam Heidarpour Roshan, Samira Zali Asl, Kimo Joo, Kamran Souri, Rajkumar Palwai, Lijun Will Chen, Sudhakar Pamarti, Joseph C. Doll, Nicholas Miller, Carl Arft, Sassan Tabatabaei, Carl Sechen, Aaron Partridge, Vinod Menon
2013	J	`jnl`	A Temperature-to-Digital Converter for a MEMS-Based Programmable Oscillator With < ±0.5-ppm Frequency Stability and < 1-ps Integrated Jitter. IEEE J. Solid State Circuits Michael H. Perrott, James C. Salvia, Fred S. Lee, Aaron Partridge, Shouvik Mukherjee, Carl Arft, Jin-Tae Kim, Niveditha Arumugam, Pavan Gupta, Sassan Tabatabaei, Sudhakar Pamarti, Haechang Lee, Fari Assaderaghi
2012	—	`conf`	A temperature-to-digital converter for a MEMS-based programmable oscillator with better than ±0.5ppm frequency stability. ISSCC Michael H. Perrott, Jim Salvia, Fred S. Lee, Aaron Partridge, Shouvik Mukherjee, Carl Arft, Jin-Tae Kim, Niveditha Arumugam, Pavan Gupta, Sassan Tabatabaei, Sudhakar Pamarti, Haechang Lee, Fari Assaderaghi
2010	J	`jnl`	Silicon MEMS Oscillators for High-Speed Digital Systems. IEEE Micro Sassan Tabatabaei, Aaron Partridge
2009	—	`conf`	Silicon MEMS oscillators for high speed digital systems. Hot Chips Symposium Aaron Partridge, Sassan Tabatabaei
2007	J	`jnl`	Design of a Tunable Differential Ring Oscillator With Short Start-Up and Switching Transients. IEEE Trans. Circuits Syst. I Regul. Pap. A. K. M. K. Mollah, Roberto Rosales, Sassan Tabatabaei, James Cicalo, André Ivanov
2005	A	`conf`	A DDJ calibration methodology for high-speed test and measurement equipments. ITC Touraj Farahmand, Sassan Tabatabaei, Freddy Ben-Zeev, André Ivanov
2005	J	`jnl`	A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices. J. Electron. Test. Baosheng Wang, Andy Kuo, Touraj Farahmand, André Ivanov, Yong B. Cho, Sassan Tabatabaei
2005	J	`jnl`	Crosstalk bounded uncorrelated jitter (BUJ) for high-speed interconnects. IEEE Trans. Instrum. Meas. Andy Kuo, Roberto Rosales, Touraj Farahmand, Sassan Tabatabaei, André Ivanov
2005	A	`conf`	Jitter spectrum analysis using continuous time interval analyzer (CTIA). ITC Sassan Tabatabaei, Freddy Ben-Zeev, Touraj Farahmand
2004	A	`conf`	Jitter Generation and Measurement for Test of Multigbps Serial IO. ITC Sassan Tabatabaei, Michael Lee, Freddy Ben-Zeev
2004	A	`conf`	Jitter Models and Measurement Methods for High-Speed Serial Interconnects. ITC Andy Kuo, Touraj Farahmand, Nelson Ou, André Ivanov, Sassan Tabatabaei
2004	J	`jnl`	Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects. IEEE Des. Test Comput. Nelson Ou, Touraj Farahmand, Andy Kuo, Sassan Tabatabaei, André Ivanov
2003	J	`jnl`	An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Des. Test Comput. Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei
2003	—	`conf`	Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-Offs for High-Speed Interconnect Device Testing. Asian Test Symposium Baosheng Wang, Yong B. Cho, Sassan Tabatabaei, André Ivanov
2002	A	`conf`	An Embedded Core for Sub-Picosecond Timing Measurements. ITC Sassan Tabatabaei, André Ivanov
2002	Misc	`conf`	Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? VTS Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song
2002	J	`jnl`	Embedded Timing Analysis: A SoC Infrastructure. IEEE Des. Test Comput. Sassan Tabatabaei, André Ivanov
2002	Misc	`conf`	Multi-GigaHertz Testing Challenges and Solutions. VTS Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei
2000	—	`conf`	Defect Oriented Testing of an ECL/CMOS Level Converter Circuit. LATW Min-Hsing P. Chen, André Ivanov, Sassan Tabatabaei
1999	Misc	`conf`	A Current Integrator for BIST of Mixed-Signal ICs. VTS Sassan Tabatabaei, André Ivanov
1999	—	`conf`	A built-in current monitor for testing analog circuit blocks. ISCAS (2) Sassan Tabatabaei, André Ivanov
1998	—	`conf`	Testing for Floating Gates Defects in CMOS Circuits. Asian Test Symposium Sumbal Rafiq, André Ivanov, Sassan Tabatabaei, Michel Renovell
1997	—	`conf`	Power supply current monitoring techniques for testing PLLs. Asian Test Symposium Maneesha Dalmia, André Ivanov, Sassan Tabatabaei