Sasikumar Cherubal

20 papers A 9B 1Misc 3Journal 3Unranked 4
YearRankTypeTitle / Venue / Authors
2010 J jnl
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices.
J. Electron. Test.
Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam
2007 J jnl
Signature Testing of Analog and RF Circuits: Algorithms and Methodology.
IEEE Trans. Circuits Syst. I Regul. Pap.
Ramakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
2006 A conf
DIBPro: Automatic Diagnostic Program Generation Tool.
ITC
Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal
2005 B conf
Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers.
ETS
Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee
2005 — conf
Challenges in Next Generation Mixed-Signal IC Production Testing.
Asian Test Symposium
Sasikumar Cherubal
2004 Misc conf
Concurrent RF Test Using Optimized Modulated RF Stimuli.
VLSI Design
Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John McLaughlin, Jason L. Smith, David M. Majernik
2004 A conf
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit.
DATE
Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
2004 Misc conf
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams.
VTS
Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee
2004 — conf
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences.
DELTA
Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee
2003 A conf
Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results.
ITC
Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee
2002 A conf
A Signature Test Framework for Rapid Production Testing of RF Circuits.
DATE
Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee
2002 J jnl
Prediction of analog performance parameters using fast transienttesting.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee
2001 A conf
A high-resolution jitter measurement technique using ADC sampling.
ITC
Sasikumar Cherubal, Abhijit Chatterjee
2001 A conf
Test generation based diagnosis of device parameters for analog circuits.
DATE
Sasikumar Cherubal, Abhijit Chatterjee
2000 Misc conf
An Efficient Hierarchical Fault Isolation Technique for Mixed-Signal Boards.
VLSI Design
Sasikumar Cherubal, Abhijit Chatterjee
2000 A conf
Optimal INL/DNL testing of A/D converters using a linear model.
ITC
Sasikumar Cherubal, Abhijit Chatterjee
2000 — conf
Test generation for fault isolation in analog circuits using behavioral models.
Asian Test Symposium
Sasikumar Cherubal, Abhijit Chatterjee
1999 — conf
A Methodology for Efficient Simulation and Diagnosis of Mixed-Signal Systems Using Error Waveforms.
DFT
Sasikumar Cherubal, Abhijit Chatterjee
1999 A conf
Parametric Fault Diagnosis for Analog Systems Using Functional Mapping.
DATE
Sasikumar Cherubal, Abhijit Chatterjee
1997 A conf
Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis.
ITC
Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao