| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Internet Things
|
| 2025 | J | jnl |
J. Appl. Math. Comput.
|
| 2025 | J | jnl |
J. Appl. Math. Comput.
|
| 2024 | J | jnl |
Int. J. Inf. Sec.
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
Secur. Priv.
|
| 2023 | J | jnl |
Comput. Networks
|
| 2023 | J | jnl |
Internet Technol. Lett.
|
| 2023 | J | jnl |
J. Electron. Test.
|
| 2023 | J | jnl |
Int. J. Inf. Sec.
|
| 2023 | J | jnl |
IEEE Internet Things J.
|
| 2023 | J | jnl |
On Securing Cryptographic ICs against Scan-based Attacks: A Hamming Weight Distribution Perspective.
ACM J. Emerg. Technol. Comput. Syst.
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2022 | — | conf |
ECC
|
| 2021 | C | conf |
TENCON
|
| 2021 | C | conf |
TENCON
|
| 2021 | Misc | conf |
VLSID
|
| 2021 | — | conf |
TALE
|
| 2021 | C | conf |
TENCON
|
| 2021 | — | conf |
ATS
|
| 2021 | J | jnl |
J. Appl. Math. Comput.
|
| 2021 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2021 | J | jnl |
Fragmented software-based self-test technique for online intermittent fault detection in processors.
IET Comput. Digit. Tech.
|
| 2021 | C | conf |
I4CS
|
| 2021 | B | conf |
ML for IEEE 802.15. 4e/TSCH: Energy Efficient Approach to Detect DDoS Attack Using Machine Learning.
IWCMC
|
| 2021 | C | conf |
TENCON
|
| 2021 | B | conf |
ETS
|
| 2021 | J | jnl |
J. Sched.
|
| 2021 | J | jnl |
J. Electron. Test.
|
| 2021 | B | conf |
SMC
|
| 2020 | C | conf |
TENCON
|
| 2020 | C | conf |
TENCON
|
| 2020 | J | jnl |
J. Electron. Test.
|
| 2020 | — | conf |
VDAT
|
| 2020 | — | conf |
IEEE ANTS
|
| 2020 | C | conf |
I4CS
|
| 2020 | — | conf |
IEEE ANTS
|
| 2020 | C | conf |
I4CS
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | — | conf |
MWSCAS
|
| 2020 | — | conf |
ISVLSI
|
| 2020 | C | conf |
TENCON
|
| 2020 | — | conf |
ICECS
|
| 2020 | C | conf |
I4CS
|
| 2020 | C | conf |
I4CS
|
| 2020 | B | conf |
SMC
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2019 | Misc | conf |
VLSID
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2019 | — | conf |
ANTS
|
| 2019 | J | jnl |
IEEE CAA J. Autom. Sinica
|
| 2019 | J | jnl |
Microprocess. Microsystems
|
| 2019 | — | conf |
MED
|
| 2019 | — | conf |
ANTS
|
| 2019 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2019 | Misc | conf |
VLSID
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2019 | — | conf |
PReMI (2)
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2018 | J | jnl |
Int. J. Wirel. Inf. Networks
|
| 2018 | J | jnl |
Future Gener. Comput. Syst.
|
| 2018 | J | jnl |
Int. J. Wirel. Inf. Networks
|
| 2018 | J | jnl |
J. Electron. Test.
|
| 2018 | J | jnl |
Int. J. Syst. Sci.
|
| 2018 | — | conf |
ECC
|
| 2018 | J | jnl |
J. Netw. Comput. Appl.
|
| 2018 | J | jnl |
J. Circuits Syst. Comput.
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2017 | A | conf |
DATE
|
| 2017 | J | jnl |
Autom.
|
| 2017 | J | jnl |
Fault-Tolerant Preemptive Aperiodic RT Scheduling by Supervisory Control of TDES on Multiprocessors.
ACM Trans. Embed. Comput. Syst.
|
| 2017 | J | jnl |
IEEE CAA J. Autom. Sinica
|
| 2017 | J | jnl |
Microelectron. J.
|
| 2017 | C | conf |
ACC
|
| 2017 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2017 | — | conf |
VDAT
|
| 2016 | — | conf |
HPCC/SmartCity/DSS
|
| 2016 | B | conf |
SMC
|
| 2016 | C | conf |
IOLTS
|
| 2016 | C | conf |
IOLTS
|
| 2016 | B | conf |
SMC
|
| 2016 | — | conf |
ANTS
|
| 2016 | — | conf |
ANTS
|
| 2016 | J | jnl |
Secur. Commun. Networks
|
| 2016 | J | jnl |
Int. J. Mach. Learn. Cybern.
|
| 2016 | B | conf |
SMC
|
| 2016 | B | conf |
SMC
|
| 2016 | B | conf |
MASCOTS
|
| 2016 | — | conf |
HPCC/SmartCity/DSS
|
| 2015 | J | jnl |
Microelectron. J.
|
| 2015 | J | jnl |
VLSI Design
|
| 2015 | J | jnl |
Int. J. Control
|
| 2015 | — | conf |
MED
|
| 2015 | — | conf |
IEEE ANTS
|
| 2015 | J | jnl |
IEEE Commun. Lett.
|
| 2015 | B | conf |
SMC
|
| 2015 | J | jnl |
Int. J. Bifurc. Chaos
|
| 2015 | B | conf |
SMC
|
| 2015 | B | conf |
SMC
|
| 2015 | — | conf |
MED
|
| 2015 | — | conf |
VDAT
|
| 2015 | — | conf |
COMPUTE
|
| 2015 | — | conf |
MED
|
| 2014 | — | conf |
IEEE ANTS
|
| 2014 | — | conf |
MED
|
| 2014 | Misc | conf |
COMSNETS
|
| 2013 | J | jnl |
CoRR
|
| 2013 | B | conf |
SMC
|
| 2013 | J | jnl |
Secur. Commun. Networks
|
| 2012 | B | conf |
TrustCom
|
| 2012 | — | conf |
SERE
|
| 2012 | C | conf |
SIN
|
| 2012 | J | jnl |
Comput. Electr. Eng.
|
| 2011 | — | conf |
CICS
|
| 2011 | B | conf |
SMC
|
| 2011 | C | conf |
SIN
|
| 2011 | — | conf |
BWCCA
|
| 2011 | J | jnl |
Secur. Commun. Networks
|
| 2011 | Misc | conf |
COMSNETS
|
| 2011 | Misc | conf |
COMSNETS
|
| 2010 | — | conf |
SoCC
|
| 2010 | — | conf |
AST/UCMA/ISA/ACN
|
| 2010 | J | jnl |
Int. J. Syst. Sci.
|
| 2010 | — | conf |
RSCTC
|
| 2010 | A | conf |
FPGA
|
| 2010 | — | conf |
ICCA
|
| 2010 | J | jnl |
Discret. Event Dyn. Syst.
|
| 2010 | B | conf |
ARES
|
| 2010 | — | conf |
ICDEM
|
| 2008 | — | conf |
ICIIS
|
| 2008 | J | jnl |
J. Circuits Syst. Comput.
|
| 2006 | C | conf |
DDECS
|
| 2006 | — | conf |
LATW
|
| 2006 | C | conf |
ACC
|
| 2005 | J | jnl |
A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and Implementation.
J. Electron. Test.
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2004 | — | conf |
SMC (2)
|
| 2004 | C | conf |
IOLTS
|