Sankaran M. Menon

17 papers C 2Misc 8Journal 4Unranked 3
YearRankTypeTitle / Venue / Authors
2022 Misc conf
Special Session: Closed Chassis Platform Debug of Compute Systems using the Functional Ubiquitous USB Type-C Receptacle.
VTS
Sankaran M. Menon, Rolf Kühnis
2019 — conf
Techniques for Debug of Low Power SoCs.
MTV
Sankaran M. Menon, Ashish Gupta, Chinna Prudvi, Rolf Kühnis, Sukhbinder Singh Takhar, Spencer K. Millican, Eric Rentschler, Pandy Kalimuthu, Preeti Ranjan Panda, Priyadarsan Patra
1997 Misc conf
Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I
VLSI Design
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana
1997 J jnl
Operational and Test Performance in the Presence of Built-in Current Sensors.
VLSI Design
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong
1996 J jnl
Fault Modeling of ECL for High Fault Coverage of Physical Defects.
VLSI Design
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana
1996 — conf
Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits.
Great Lakes Symposium on VLSI
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
1995 C conf
A Novel High-Speed BiCMOS Domino Logic Family.
ISCAS
Anura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon
1995 J jnl
Testable design of BiCMOS circuits for stuck-open fault detection using single patterns.
IEEE J. Solid State Circuits
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Rochit Rajsuman
1994 Misc conf
Input pattern classification for transistor level testing of BiCMOS circuits.
VTS
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
1994 J jnl
Resolution Enhancement in I
VLSI Design
Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong, Sankaran M. Menon
1994 Misc conf
The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance.
VLSI Design
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong
1993 C conf
Test Generation for BiCMOS Circuits.
ISCAS
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
1993 Misc conf
Testable design for BiCMOS stuck-open fault detection.
VTS
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
1992 Misc conf
Behavior of faulty single BJT BiCMOS logic gates.
VTS
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana
1992 Misc conf
On Bridging Faults in ECL Circuits.
VLSI Design
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
1991 Misc conf
Enhancement of resolution in supply current based testing for large ICs.
VTS
Yashwant K. Malaiya, Anura P. Jayasumana, Qiao Tong, Sankaran M. Menon
1991 — conf
Gate level representation of ECL circuits for fault modeling.
Great Lakes Symposium on VLSI
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya