| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Comput. Electr. Eng.
|
| 2026 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2026 | J | jnl |
Appl. Soft Comput.
|
| 2025 | J | jnl |
Appl. Soft Comput.
|
| 2025 | A* | conf |
AAAI
|
| 2025 | J | jnl |
Trans. Mach. Learn. Res.
|
| 2025 | J | jnl |
Adv. Eng. Informatics
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
ACM Trans. Intell. Syst. Technol.
|
| 2024 | J | jnl |
Neurocomputing
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Trans. Mach. Learn. Res.
|
| 2024 | J | jnl |
J. Ind. Inf. Integr.
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Sensors
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
Pattern Recognit. Lett.
|
| 2023 | J | jnl |
Comput. Vis. Image Underst.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | A | conf |
UAI
|
| 2023 | J | jnl |
Pattern Recognit.
|
| 2023 | J | jnl |
Expert Syst. Appl.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Appl. Intell.
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | A | conf |
BMVC
|
| 2023 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
Expert Syst. Appl.
|
| 2022 | J | jnl |
Sensors
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | C | conf |
IECON
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
Sensors
|
| 2021 | J | jnl |
Expert Syst. Appl.
|
| 2021 | J | jnl |
Expert Syst. Appl.
|
| 2020 | J | jnl |
Int. J. Inf. Manag.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
Artif. Intell. Medicine
|
| 2020 | J | jnl |
Autom.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
APCCAS
|
| 2019 | J | jnl |
Expert Syst. Appl.
|
| 2019 | Misc | conf |
IVCNZ
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Sensors
|
| 2018 | — | conf |
ICFSP
|
| 2018 | J | jnl |
Signal Process.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | — | conf |
ICFSP
|
| 2018 | J | jnl |
Comput. J.
|
| 2018 | J | jnl |
CoRR
|
| 2018 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | — | conf |
ICINCO (1)
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | — | conf |
GCCE
|
| 2017 | J | jnl |
Knowl. Based Syst.
|
| 2017 | J | jnl |
Expert Syst. Appl.
|
| 2017 | — | conf |
EMBC
|
| 2017 | Misc | conf |
MVA
|
| 2017 | — | conf |
SSCI
|
| 2016 | — | conf |
ICIT
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | — | conf |
ICIT
|
| 2016 | C | conf |
IECON
|
| 2016 | J | jnl |
IEEE Trans. Signal Process.
|
| 2016 | C | conf |
ICMLA
|
| 2016 | J | jnl |
Sensors
|
| 2016 | J | jnl |
Signal Process.
|
| 2015 | — | conf |
ECC
|
| 2015 | — | conf |
ICINCO (1)
|
| 2015 | J | jnl |
Sensors
|
| 2015 | — | conf |
ASCC
|
| 2015 | — | conf |
ICINCO (1)
|
| 2015 | J | jnl |
Signal Process.
|
| 2015 | J | jnl |
Signal Process.
|
| 2014 | J | jnl |
Signal Process.
|
| 2014 | — | conf |
UIST (Adjunct Volume)
|
| 2014 | — | conf |
ISIE
|
| 2014 | — | conf |
ISIE
|
| 2014 | J | jnl |
Signal Process.
|
| 2014 | — | conf |
DSP
|
| 2013 | C | conf |
IECON
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | C | conf |
IECON
|
| 2012 | J | jnl |
IEEE Signal Process. Lett.
|
| 2012 | J | jnl |
Expert Syst. Appl.
|
| 2012 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2012 | — | conf |
Improvement of Extraction Method for Inter-turn Fault Detection in IPMSM under Transient Conditions.
ICINCO (2)
|
| 2012 | J | jnl |
EURASIP J. Adv. Signal Process.
|
| 2012 | J | jnl |
Expert Syst. Appl.
|
| 2012 | — | conf |
ICSPCS
|
| 2011 | — | conf |
RAM
|
| 2011 | C | conf |
ICICS
|
| 2011 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2010 | J | jnl |
Signal Process.
|
| 2010 | J | jnl |
Expert Syst. Appl.
|
| 2010 | — | conf |
ICCSA Workshops
|
| 2010 | C | conf |
ICARCV
|
| 2010 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2010 | J | jnl |
IEICE Trans. Electron.
|
| 2010 | J | jnl |
Variable step-size normalized LMS algorithm by approximating correlation matrix of estimation error.
Signal Process.
|
| 2009 | — | conf |
ECC
|
| 2009 | J | jnl |
IEEE Signal Process. Lett.
|
| 2009 | J | jnl |
Signal Process.
|
| 2009 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2009 | — | conf |
ICONS
|
| 2008 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2008 | J | jnl |
IEICE Trans. Commun.
|
| 2008 | — | conf |
FSKD (2)
|
| 2008 | J | jnl |
Signal Process.
|
| 2008 | J | jnl |
Signal Process.
|
| 2008 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2008 | — | conf |
ROBIO
|
| 2007 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2007 | — | conf |
ICINCO-ICSO
|
| 2007 | — | conf |
ICNC (5)
|
| 2007 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2005 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2005 | J | jnl |
IEEE Trans. Signal Process.
|
| 2005 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2003 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2002 | C | conf |
ACC
|
| 2002 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2002 | B | conf |
IEEE Congress on Evolutionary Computation
|
| 2002 | B | conf |
IEEE Congress on Evolutionary Computation
|
| 2001 | J | jnl |
Signal Process.
|
| 2001 | C | conf |
ACC
|
| 1998 | J | jnl |
Autom.
|
| 1994 | J | jnl |
IEEE Trans. Autom. Control.
|
| 1993 | J | jnl |
IEEE Trans. Autom. Control.
|