Sandip Tiwari

15 papers Misc 1Journal 7Unranked 7
YearRankTypeTitle / Venue / Authors
2017 — conf
On the Physical Underpinnings of the Unusual Effectiveness of Probabilistic and Neural Computation.
ICRC
Sandip Tiwari, Damien Querlioz
2015 J jnl
Implications of Scales in Processing of Information.
Proc. IEEE
Sandip Tiwari
2014 J jnl
Inexact computing using probabilistic circuits: Ultra low-power digital processing.
ACM J. Emerg. Technol. Comput. Syst.
Jaeyoon Kim, Sandip Tiwari
2012 J jnl
Adaptive Circuit Design Using Independently Biased Back-Gated Double-Gate MOSFETS.
IEEE Trans. Circuits Syst. I Regul. Pap.
Jaeyoon Kim, Paul Michael Solomon, Sandip Tiwari
2012 — conf
Nanostructure devices for logic and memory and beyond.
ESSDERC
Sandip Tiwari
2011 J jnl
A Single Element Phase Change Memory.
IEICE Trans. Electron.
Sang-Hyeon Lee, Moonkyung Mark Kim, Byung-ki Cheong, Jooyeon Kim, Jo-Won Lee, Sandip Tiwari
2011 — conf
Inexact computing for ultra low-power nanometer digital circuit design.
NANOARCH
Jaeyoon Kim, Sandip Tiwari
2007 Misc conf
Nanoelectronics Device Technologies: CMOS, Beyond and the Mysterious Case of Ockham's Razor.
VLSI Design
Sandip Tiwari
2006 J jnl
Performance advantages of 3-D digital integrated circuits in a mixed SOI and bulk CMOS design space.
IEEE Trans. Circuits Syst. II Express Briefs
Christianto C. Liu, Sandip Tiwari
2005 J jnl
A novel compact circuit for 4-PAM energy-efficient high speed interconnect data transmission and reception.
Microelectron. J.
Uygar Avci, Sandip Tiwari
2005 J jnl
Bridging the Processor-Memory Performance Gapwith 3D IC Technology.
IEEE Des. Test Comput.
Christianto C. Liu, Ilya Ganusov, Martin Burtscher, Sandip Tiwari
2005 — conf
Mapping system-on-chip designs from 2-D to 3-D ICs.
ISCAS (3)
Christianto C. Liu, Jeng-Huei Chen, Rajit Manohar, Sandip Tiwari
2004 — conf
A power-performance adaptive low voltage analog circuit design using independently controlled double gate CMOS technology.
ISCAS (1)
Arvind Kumar, Sandip Tiwari
2004 — conf
Defect tolerance for nanocomputer architecture.
SLIP
Arvind Kumar, Sandip Tiwari
2004 — conf
Testing and Defect Tolerance: A Rent's Rule Based Analysis and Implications on Nanoelectronics.
DFT
Arvind Kumar, Sandip Tiwari