| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Educ.
|
| 2026 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2025 | B | conf |
MASS
|
| 2025 | B | conf |
MASS
|
| 2025 | J | jnl |
CoRR
|
| 2025 | Misc | conf |
VTS
|
| 2025 | J | jnl |
High Confid. Comput.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | C | conf |
ICCE
|
| 2025 | C | conf |
ICCE
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
MLCAD
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
CoRR
|
| 2025 | Misc | conf |
VTS
|
| 2024 | C | conf |
ICCE
|
| 2024 | J | jnl |
IEEE Trans. Computers
|
| 2024 | C | conf |
IV
|
| 2024 | — | conf |
ISVLSI
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | — | conf |
ITSC
|
| 2024 | J | jnl |
IEEE Internet Things J.
|
| 2024 | — | conf |
SmartIoT
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | Misc | conf |
FCCM
|
| 2024 | — | conf |
SOCC
|
| 2024 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | — | conf |
ISQED
|
| 2024 | J | jnl |
J. Hardw. Syst. Secur.
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | J | jnl |
IEEE Internet Things J.
|
| 2023 | J | jnl |
IEEE Trans. Computers
|
| 2023 | J | jnl |
AroMa: Evaluating Deep Learning Systems for Stealthy Integrity Attacks on Multi-tenant Accelerators.
ACM J. Emerg. Technol. Comput. Syst.
|
| 2023 | C | conf |
ICCE
|
| 2023 | C | conf |
ICCE
|
| 2023 | C | conf |
ISCAS
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2023 | B | conf |
MobiHoc
|
| 2023 | B | conf |
MobiHoc
|
| 2023 | B | conf |
MobiHoc
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | J | jnl |
IEEE Trans. Computers
|
| 2023 | — | conf |
VTC2023-Spring
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | Misc | conf |
CASES
|
| 2023 | C | conf |
iLRN
|
| 2022 | C | conf |
ICCE
|
| 2022 | — | conf |
ITSC
|
| 2022 | J | jnl |
IEEE Trans. Computers
|
| 2022 | C | conf |
IV
|
| 2022 | — | conf |
ASP-DAC
|
| 2022 | J | jnl |
IEEE Trans. Computers
|
| 2022 | J | jnl |
IEEE Embed. Syst. Lett.
|
| 2022 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2022 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2021 | A | conf |
DATE
|
| 2021 | — | conf |
ITSC
|
| 2021 | C | conf |
ICCE
|
| 2021 | J | jnl |
CoRR
|
| 2021 | — | conf |
ITSC
|
| 2021 | J | jnl |
CoRR
|
| 2021 | — | conf |
AsianHOST
|
| 2021 | A* | conf |
DAC
|
| 2021 | J | jnl |
IACR Cryptol. ePrint Arch.
|
| 2021 | B | conf |
ETS
|
| 2021 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2021 | C | conf |
ICCD
|
| 2021 | — | conf |
ITSC
|
| 2020 | J | jnl |
CoRR
|
| 2020 | — | ed. |
IFIPIoT
|
| 2020 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2019 | — | conf |
ISQED
|
| 2019 | J | jnl |
CoRR
|
| 2019 | — | ch. |
Security and Fault Tolerance in Internet of Things
|
| 2019 | J | jnl |
IEEE Des. Test
|
| 2019 | J | jnl |
ACM Comput. Surv.
|
| 2019 | — | conf |
IFIPIoT
|
| 2019 | C | conf |
ICCE
|
| 2019 | J | jnl |
IEEE Des. Test
|
| 2018 | A* | conf |
DAC
|
| 2018 | — | conf |
ISVLSI
|
| 2018 | — | conf |
ISVLSI
|
| 2018 | J | jnl |
J. Hardw. Syst. Secur.
|
| 2018 | A* | conf |
DAC
|
| 2018 | J | jnl |
Proc. IEEE
|
| 2018 | — | conf |
ASP-DAC
|
| 2017 | C | conf |
ICCD
|
| 2017 | J | jnl |
IEEE Des. Test
|
| 2017 | A* | conf |
DAC
|
| 2017 | J | jnl |
J. Hardw. Syst. Secur.
|
| 2017 | — | conf |
ASP-DAC
|
| 2017 | J | jnl |
IEEE Des. Test
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2017 | — | conf |
CICC
|
| 2017 | A | conf |
ICCAD
|
| 2016 | A* | conf |
DAC
|
| 2016 | A | conf |
DATE
|
| 2016 | A | conf |
ICCAD
|
| 2016 | — | conf |
ISQED
|
| 2016 | — | conf |
ReConFig
|
| 2016 | — | conf |
SoCC
|
| 2016 | Misc | conf |
VTS
|
| 2016 | — | conf |
ReConFig
|
| 2016 | J | jnl |
IEEE Des. Test
|
| 2016 | C | conf |
ICCD
|
| 2016 | A | conf |
DATE
|
| 2016 | J | jnl |
IEEE Trans. Multi Scale Comput. Syst.
|
| 2015 | A | conf |
ICCAD
|
| 2015 | A | conf |
ICCAD
|
| 2015 | A* | conf |
DAC
|
| 2015 | J | jnl |
IEEE Trans. Multi Scale Comput. Syst.
|
| 2015 | A | conf |
ICCAD
|
| 2015 | B | conf |
FMCAD
|
| 2014 | — | conf |
ISQED
|
| 2014 | A | conf |
DATE
|
| 2014 | B | conf |
ITP
|
| 2014 | A* | conf |
DAC
|
| 2014 | — | conf |
ACL2
|
| 2013 | C | conf |
ICCD
|
| 2013 | J | jnl |
J. Electron. Test.
|
| 2013 | A* | conf |
DAC
|
| 2013 | B | conf |
FMCAD
|
| 2013 | C | conf |
ICCD
|
| 2013 | J | jnl |
J. Autom. Reason.
|
| 2012 | A* | conf |
DAC
|
| 2012 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2011 | — | conf |
MTV
|
| 2011 | J | jnl |
J. Autom. Reason.
|
| 2010 | Misc | conf |
VTS
|
| 2010 | — | conf |
ISQED
|
| 2010 | A | conf |
DATE
|
| 2010 | — | book |
|
| 2009 | B | conf |
FMCAD
|
| 2009 | B | conf |
ATVA
|
| 2009 | J | jnl |
J. Appl. Log.
|
| 2008 | J | jnl |
J. Autom. Reason.
|
| 2008 | — | conf |
MTV
|
| 2008 | J | jnl |
J. Funct. Program.
|
| 2008 | B | conf |
FMCAD
|
| 2007 | B | conf |
FMCAD
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2007 | — | conf |
MTV
|
| 2006 | — | conf |
ACL2
|
| 2006 | B | conf |
LPAR
|
| 2004 | A* | conf |
CAV
|
| 2004 | B | conf |
FMCAD
|