Sandip Halder - RankMe

27 papers C 1Journal 21Unranked 5

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation. SOCC Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
2025	J	`jnl`	Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series. CoRR Bappaditya Dey, Daniel Sorensen, MinJin Hwang, Sandip Halder
2025	J	`jnl`	Unsupervised Anomaly Prediction with N-BEATS and Graph Neural Network in Multi-variate Semiconductor Process Time Series. CoRR Daniel Sorensen, Bappaditya Dey, MinJin Hwang, Sandip Halder
2024	J	`jnl`	Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images. CoRR Bappaditya Dey, Vic De Ridder, Víctor Blanco, Sandip Halder, Bartel Van Waeyenberge
2024	J	`jnl`	Advancing SEM Based Nano-Scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes. CoRR Bappaditya Dey, Matthias Monden, Víctor Blanco, Sandip Halder, Stefan De Gendt
2024	—	`conf`	Advancing SEM Based Nano-scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes. ECCV Workshops (4) Bappaditya Dey, Matthias Monden, Víctor Blanco, Sandip Halder, Stefan De Gendt
2024	J	`jnl`	An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection. CoRR Amit Prasad, Bappaditya Dey, Victor Blanco, Sandip Halder
2024	J	`jnl`	Exploring Machine Learning for Semiconductor Process Optimization: A Systematic Review. IEEE Trans. Artif. Intell. Ying-Lin Chen, Sara Sacchi, Bappaditya Dey, Víctor Blanco, Sandip Halder, Philippe Leray, Stefan De Gendt
2024	J	`jnl`	Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS. CoRR Ying-Lin Chen, Jacob Deforce, Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Philippe Leray
2023	J	`jnl`	A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation. CoRR Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
2023	—	`conf`	Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance. PKDD/ECML Workshops (4) Bappaditya Dey, Anh Tuan Ngo, Sara Sacchi, Víctor Blanco, Philippe Leray, Sandip Halder
2023	J	`jnl`	Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance. CoRR Bappaditya Dey, Anh Tuan Ngo, Sara Sacchi, Víctor Blanco, Philippe Leray, Sandip Halder
2023	J	`jnl`	Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review. CoRR Thibault Lechien, Enrique Dehaerne, Bappaditya Dey, Víctor Blanco, Sandip Halder, Stefan De Gendt
2023	J	`jnl`	Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization. CoRR Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
2023	J	`jnl`	Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE. CoRR Sara Sacchi, Bappaditya Dey, Iacopo Mochi, Sandip Halder, Philippe Leray
2023	J	`jnl`	Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy. CoRR Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Bartel Van Waeyenberge
2023	J	`jnl`	Optimizing YOLOv7 for Semiconductor Defect Detection. CoRR Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
2023	J	`jnl`	SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. CoRR Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge
2023	J	`jnl`	SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation. CoRR Vic De Ridder, Bappaditya Dey, Sandip Halder, Bartel Van Waeyenberge
2023	J	`jnl`	SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering. CoRR MinJin Hwang, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Young-han Shin
2023	J	`jnl`	YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach. CoRR Enrique Dehaerne, Bappaditya Dey, Hossein Esfandiar, Lander Verstraete, Hyo Seon Suh, Sandip Halder, Stefan De Gendt
2022	—	`conf`	A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection. ICECS 2022 Enrique Dehaerne, Bappaditya Dey, Sandip Halder
2022	J	`jnl`	Code Generation Using Machine Learning: A Systematic Review. IEEE Access Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt, Wannes Meert
2022	J	`jnl`	Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach. CoRR Bappaditya Dey, Enrique Dehaerne, Kasem Khalil, Sandip Halder, Philippe Leray, Magdy A. Bayoumi
2022	J	`jnl`	Deep Learning-Based Defect Classification and Detection in SEM Images. CoRR Bappaditya Dey, Dipam Goswami, Sandip Halder, Kasem Khalil, Philippe Leray, Magdy A. Bayoumi
2020	C	`conf`	Using Unsupervised Machine Learning for Plasma Etching Endpoint Detection. ICPRAM Imen Chakroun, Thomas J. Ashby, Sayantan Das, Sandip Halder, Roel Wuyts, Wilfried Verachtert
2011	—	`conf`	In-line metrology and inspection for process control during 3D stacking of IC's. 3DIC Sandip Halder, Ingrid De Wolf, Alain Phommahaxay, Andy Miller, Mireille Maenhoudt, Gerald Beyer, Bart Swinnen, Eric Beyne