| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE J. Solid State Circuits
|
| 2021 | — | conf |
ASP-DAC
|
| 2020 | Misc | conf |
VTS
|
| 2019 | Misc | conf |
VTS
|
| 2019 | Misc | conf |
Cache Design for Yield-per-Area Maximization: Switchable Spare Columns with Disabling (SSC-Disable).
VTS
|
| 2017 | Misc | conf |
VTS
|
| 2017 | — | conf |
ISQED
|
| 2016 | Misc | conf |
VTS
|
| 2016 | Misc | conf |
VTS
|
| 2016 | Misc | conf |
VTS
|
| 2016 | — | conf |
ISQED
|
| 2015 | Misc | conf |
VTS
|
| 2015 | Misc | conf |
CODES+ISSS
|
| 2015 | Misc | conf |
VTS
|
| 2014 | — | conf |
ATS
|
| 2014 | A | conf |
DATE
|
| 2014 | — | conf |
ISQED
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | — | conf |
ATS
|
| 2014 | A | conf |
ITC
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | Misc | conf |
CODES+ISSS
|
| 2013 | Misc | conf |
VTS
|
| 2013 | C | conf |
ICCD
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | A | conf |
DATE
|
| 2013 | A | conf |
DATE
|
| 2012 | A | conf |
ITC
|
| 2012 | — | conf |
DFT
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | A | conf |
DATE
|
| 2012 | — | conf |
ISQED
|
| 2011 | A | conf |
DATE
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2010 | A | conf |
DATE
|
| 2010 | A | conf |
DATE
|
| 2010 | A | conf |
ITC
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2009 | Misc | conf |
VTS
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2009 | A | conf |
ITC
|
| 2008 | — | conf |
ATS
|
| 2008 | — | conf |
ATS
|
| 2008 | J | jnl |
IEEE Trans. Computers
|
| 2008 | Misc | conf |
VTS
|
| 2008 | C | conf |
ICCD
|
| 2008 | C | conf |
ISPDC
|
| 2008 | — | conf |
CSSE (3)
|
| 2008 | A | conf |
ITC
|
| 2007 | — | conf |
ATS
|
| 2007 | — | conf |
ATS
|
| 2006 | C | conf |
ICCD
|
| 2006 | — | conf |
ATS
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | Misc | conf |
VTS
|
| 2006 | — | conf |
DATE Designers' Forum
|
| 2006 | — | conf |
ATS
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2005 | A | conf |
ITC
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2004 | J | jnl |
IEEE Des. Test Comput.
|
| 2004 | Misc | conf |
VTS
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2004 | A | conf |
ITC
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2003 | Misc | conf |
VTS
|
| 2003 | J | jnl |
IEEE Des. Test Comput.
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2003 | Misc | conf |
VTS
|
| 2003 | Misc | conf |
VTS
|
| 2003 | A | conf |
ITC
|
| 2003 | Misc | conf |
VTS
|
| 2002 | C | conf |
ICCD
|
| 2002 | A | conf |
ITC
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | — | conf |
Asian Test Symposium
|
| 2002 | J | jnl |
J. Electron. Test.
|
| 2002 | J | jnl |
J. Electron. Test.
|
| 2002 | A | conf |
ITC
|
| 2001 | A* | conf |
DAC
|
| 2001 | Misc | conf |
VTS
|
| 2001 | A | conf |
ITC
|
| 2001 | A | conf |
DATE
|
| 2001 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2001 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2001 | A | conf |
ITC
|
| 2001 | Misc | conf |
VTS
|
| 2000 | Misc | conf |
VTS
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | J | jnl |
J. Electron. Test.
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | Misc | conf |
VLSI Design
|
| 2000 | J | jnl |
IEEE Trans. Computers
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | A | conf |
ITC
|
| 1999 | A | conf |
ITC
|
| 1999 | A | conf |
ITC
|
| 1999 | Misc | conf |
VTS
|
| 1999 | A | conf |
ITC
|
| 1999 | A | conf |
ICCAD
|
| 1998 | Misc | conf |
VTS
|
| 1998 | A | conf |
ITC
|
| 1998 | J | jnl |
IEEE Trans. Computers
|
| 1998 | J | jnl |
J. Electron. Test.
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1998 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 1998 | J | jnl |
J. Electron. Test.
|
| 1998 | A* | conf |
DAC
|
| 1998 | — | conf |
DFT
|
| 1998 | A | conf |
DATE
|
| 1998 | A | conf |
ITC
|
| 1997 | A* | conf |
DAC
|
| 1997 | Misc | conf |
VTS
|
| 1997 | A | conf |
ITC
|
| 1997 | A | conf |
ICCAD
|
| 1997 | Misc | conf |
VTS
|
| 1997 | A | conf |
ITC
|
| 1997 | Misc | conf |
VTS
|
| 1996 | A* | conf |
DAC
|
| 1996 | J | jnl |
IEEE Trans. Computers
|
| 1996 | J | jnl |
IEEE Trans. Computers
|
| 1996 | Misc | conf |
VTS
|
| 1996 | A* | conf |
DAC
|
| 1996 | A | conf |
ITC
|
| 1996 | J | jnl |
IEEE Trans. Computers
|
| 1995 | A* | conf |
DAC
|
| 1995 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1994 | — | conf |
EDAC-ETC-EUROASIC
|
| 1994 | A | conf |
ITC
|
| 1994 | — | conf |
EDAC-ETC-EUROASIC
|
| 1994 | A* | conf |
DAC
|
| 1994 | A | conf |
ICCAD
|
| 1994 | Misc | conf |
VTS
|
| 1994 | Misc | conf |
VTS
|
| 1993 | A* | conf |
DAC
|
| 1993 | A | conf |
ITC
|
| 1992 | A | conf |
ITC
|
| 1992 | Misc | conf |
VTS
|
| 1991 | J | jnl |
IEEE Trans. Computers
|
| 1991 | A | conf |
ITC
|
| 1990 | J | jnl |
IEEE Trans. Computers
|
| 1990 | — | conf |
FTCS
|
| 1988 | A | conf |
ITC
|
| 1988 | A | conf |
ITC
|