Samvel K. Shoukourian

41 papers A 3B 1C 2Misc 5Journal 10Unranked 19
YearRankTypeTitle / Venue / Authors
2025 B conf
European Test Symposium Teams: an Anniversary Snapshot.
ETS
Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2024 — conf
An Approach for Increasing Memory Repair Efficiency.
EWDTS
Karen Amirkhanyan, A. Babayan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2024 — conf
Repair of Resistive Open Defects on Word-Lines and Bit-Lines of SRAMs.
EWDTS
Karen Amirkhanyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian
2024 — conf
Results of Validation Analysis for Multi-Memory Bus BIST Engines.
EWDTS
Armen Babayan, Samvel K. Shoukourian
2023 — conf
Analytics for AI Related Applications of Multidimensional Multitape Finite Automata.
CECNet
Samvel K. Shoukourian, Tigran Grigoryan, Sevak Amirkhanyan
2021 J jnl
Some Results on Regular Events for Multitape Finite Automata: A Preliminary Report.
Bull. EATCS
Alexander Godlevsky, Hayk A. Grigoryan, Tigran Grigoryan, Samvel K. Shoukourian
2020 J jnl
Memory Physical Aware Multi-Level Fault Diagnosis Flow.
IEEE Trans. Emerg. Top. Comput.
Gurgen Harutyunyan, Suren Martirosyan, Samvel K. Shoukourian, Yervant Zorian
2020 J jnl
Polynomial algorithm for equivalence problem of deterministic multitape finite automata.
Theor. Comput. Sci.
Hayk A. Grigoryan, Samvel K. Shoukourian
2019 A conf
Armenia: Communicating to World Community in Electronic Test and Design.
ITC
Samvel K. Shoukourian, Yuri Shoukourian, Vladimir Sahakyan
2019 J jnl
Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2019 Misc conf
Innovative Practices on In-System Test and Reliability of Memories.
VTS
S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan
2019 A conf
Memory FIT Rate Mitigation Technique for Automotive SoCs.
ITC
Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2018 A conf
Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs.
ITC
Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides
2017 — conf
An efficient testing methodology for embedded flash memories.
EWDTS
Suren Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2017 — conf
Automated flow for test pattern creation for IPs in SoC.
EWDTS
D. Sargsyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2017 — conf
Experimental study on Hamming and Hsiao codes in the context of embedded applications.
EWDTS
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2016 — conf
Securing test infrastructure of system-on-chips.
EWDTS
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2015 — conf
A power based memory BIST grouping methodology.
EWDTS
L. Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2015 — conf
An efficient approach for memory repair by reducing the number of spares.
EWDTS
Vrezh Sargsyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Avetik Yessayan
2015 — ed.
Collaboration and Technology - 21st International Conference, CRIWG 2015, Yerevan, Armenia, September 22-25, 2015, Proceedings
CRIWG
Nelson Baloian, Yervant Zorian, Perouz Taslakian, Samvel K. Shoukourian
2015 — conf
Overview study on fault modeling and test methodology development for FinFET-based memories.
EWDTS
Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian
2014 — conf
Extending fault periodicity table for testing faults in memories under 20nm.
EWDTS
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2013 Misc conf
An effective solution for building memory BIST infrastructure based on fault periodicity.
VTS
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2013 — conf
An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters.
EWDTS
T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2013 — conf
Application of defect injection flow for fault validation in memories.
EWDTS
K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2013 — conf
Impact of process variations on read failures in SRAMs.
EWDTS
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2012 J jnl
A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2011 — conf
A Robust Solution for Embedded Memory Test and Repair.
Asian Test Symposium
K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2011 C conf
Generic BIST architecture for testing of content addressable memories.
IOLTS
Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2011 J jnl
Symmetry Measure for Memory Test and Its Application in BIST Optimization.
J. Electron. Test.
Gurgen Harutunyan, Aram Hakhumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2010 C conf
The Equivalence Problem of Deterministic Multitape Finite Automata: A New Proof of Solvability Using a Multidimensional Tape.
LATA
Alexander A. Letichevsky, Arsen S. Shoukourian, Samvel K. Shoukourian
2009 — conf
An approach for formal verification of business processes.
SpringSim
Armen Kostanyan, Vardan Matevosyan, Samvel K. Shoukourian, Anna Varosyan
2008 J jnl
The equivalence problem of multidimensional multitape automata.
J. Comput. Syst. Sci.
Haik Grigorian, Samvel K. Shoukourian
2006 Misc conf
Alternative Combination of Processes.
PDPTA
Levon Hayrapetyan, Samvel K. Shoukourian
2004 Misc conf
A Methodology for Design and Evaluation of Redundancy Allocation Algorithms.
VTS
Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2004 J jnl
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure.
IEEE Des. Test Comput.
Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2003 J jnl
Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield.
IEEE Des. Test Comput.
Yervant Zorian, Samvel K. Shoukourian
2001 — conf
An Approach for Evaluation of Redunancy Analysis Algorithms.
MTDT
Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
1999 — conf
An Approach for Access Differentiation Design in Medical Distributed Applications Built on Databases.
MIE
Samvel K. Shoukourian, A. M. Vasilyan, A. A. Avagyan, A. K. Shukurian
1998 J jnl
A Unified Design Methodology for Offline and Online Testing.
IEEE Des. Test Comput.
Samvel K. Shoukourian
1995 Misc conf
An approach for system tests design and its application.
VTS
Samvel K. Shoukourian, Armen G. Kostanian, Valery A. Margarian, Ayman A. Ashour