Sami A. Al-Arian

17 papers A 3C 4Misc 2Journal 3Unranked 5
YearRankTypeTitle / Venue / Authors
2000 J jnl
Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI circuits.
IEEE Trans. Very Large Scale Integr. Syst.
Bassam Shaer, David L. Landis, Sami A. Al-Arian
2000 J jnl
Partitioning sequential circuits for pseudoexhaustive testing.
IEEE Trans. Very Large Scale Integr. Syst.
Bassam Shaer, Sami A. Al-Arian, David L. Landis
1999 — conf
Pseudo-Exhaustive Testing of Sequential Circuits.
Great Lakes Symposium on VLSI
Bassam Shaer, Sami A. Al-Arian, David L. Landis
1998 — conf
Partitioning algorithm to enhance VLSI testability.
ACM Southeast Regional Conference
Bassam Shaer, Sami A. Al-Arian, David L. Landis
1997 — conf
A New Heuristic Algorithm for Estimating Signal and Detection Probabilities.
Great Lakes Symposium on VLSI
Musaed A. Al-Kharji, Sami A. Al-Arian
1996 Misc conf
A novel built-in current sensor for I
VTS
Stephan P. Athan, David L. Landis, Sami A. Al-Arian
1994 C conf
Improving the Testability of VLSI Circuits through Partitioning.
ISCAS
Sami A. Al-Arian, Randy E. Bolling
1994 C conf
Reconfigurable Linear Feedback Register Design, Analysis & Applications.
ISCAS
Randy E. Bolling, Sami A. Al-Arian
1993 J jnl
A Method for Consistent Fault Coverage Reporting.
IEEE Des. Test Comput.
Warren H. Debany Jr., Kevin A. Kwiat, Sami A. Al-Arian
1993 Misc conf
Degrading fault model for WSI interconnection lines.
VTS
Hussam Y. Abujbara, Sami A. Al-Arian
1992 C conf
Fault Simulation and Test Generation by Fault Sampling Techniques.
ICCD
Sami A. Al-Arian, Musaed A. Al-Kharji
1991 C conf
A Unique Approach to Built-in-Self-Test Circuit Design.
ICCD
Sami A. Al-Arian, Hussam Y. Abujbara, Jim C. Ruel
1990 — conf
Self-testing and self-reconfiguration architecture for 2-D WSI arrays.
SPDP
Hussam Y. Abujbara, Sami A. Al-Arian
1990 — conf
Three approaches to design fault tolerant programmable logic arrays.
ACM Southeast Regional Conference
Sami A. Al-Arian, Hari P. Kunamneni
1989 A conf
Design and Test in the Universities.
ITC
Sami A. Al-Arian
1988 A conf
Defining a Standard for Fault Simulator Evaluation.
ITC
Sami A. Al-Arian, Kevin A. Kwiat
1984 A conf
Comprehensive Fault Model and Testing of CMOS Circuits.
ITC
Dharma P. Agrawal, Sami A. Al-Arian