Salvatore M. Amoroso

12 papers A 1C 1Journal 4Unranked 5
YearRankTypeTitle / Venue / Authors
2024 — conf
Modeling and Simulation for DRAM and Flash Memory Technology Exploration and Development.
IMW
Xi-Wei Lin, Salvatore M. Amoroso, Ko-Hsin Lee, Meng Hsuan Ke, Tue Gunst, Pavel Tikhomirov, Plamen Asenov
2018 A conf
Progress on carbon nanotube BEOL interconnects.
DATE
Benjamin Uhlig, Jie Liang, Jaehyun Lee, Raphael Ramos, Abitha Dhavamani, Nicole Nagy, Jean Dijon, Hanako Okuno, Dipankar Kalita, Vihar P. Georgiev, Asen Asenov, Salvatore M. Amoroso, Liping Wang, Campbell Millar, F. Konemann, Bernd Gotsmann, Goncalo Goncalves, Bingan Chen, Reeturaj Pandey, R. Chen, Aida Todri-Sanial
2015 J jnl
Comparison of Si < 100 > and < 110 > crystal orientation nanowire transistor reliability using Poisson-Schrödinger and classical simulations.
Microelectron. Reliab.
Louis Gerrer, Vihar P. Georgiev, Salvatore M. Amoroso, Ewan Towie, A. Asenov
2015 — conf
Experimental evidences and simulations of trap generation along a percolation path.
ESSDERC
Louis Gerrer, Razaidi Hussin, Salvatore M. Amoroso, Jacopo Franco, Pieter Weckx, Marko Simicic, N. Horiguchi, Ben Kaczer, Tibor Grasser, Asen Asenov
2015 — conf
Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow.
ESSDERC
Razaidi Hussin, Louis Gerrer, Jie Ding, Liping Wang, Salvatore M. Amoroso, Binjie Cheng, Dave Reid, Pieter Weckx, Marko Simicic, Jacopo Franco, Annelies Vanderheyden, Danielle Vanhaeren, Naoto Horiguchi, Ben Kaczer, Asen Asenov
2015 C conf
Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits.
ISCAS
A. Asenov, Jie Ding, Dave Reid, Plamen Asenov, Salvatore M. Amoroso, Fikru Adamu-Lema, Louis Gerrer
2014 — conf
FDSOI molecular flash cell with reduced variability for low power flash applications.
ESSDERC
Vihar P. Georgiev, Salvatore M. Amoroso, Laia Vila-Nadal, Cristoph Busche, Leroy Cronin, Asen Asenov
2014 J jnl
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review.
Microelectron. Reliab.
Louis Gerrer, Jie Ding, Salvatore M. Amoroso, Fikru Adamu-Lema, Razaidi Hussin, Dave Reid, Campbell Millar, A. Asenov
2014 J jnl
RTN distribution comparison for bulk, FDSOI and FinFETs devices.
Microelectron. Reliab.
Louis Gerrer, Salvatore M. Amoroso, Razaidi Hussin, Asen Asenov
2012 — conf
Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation.
ESSDERC
Salvatore M. Amoroso, Louis Gerrer, Stanislav Markov, Fikru Adamu-Lema, Asen Asenov
2012 J jnl
Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs.
Microelectron. Reliab.
Louis Gerrer, Stanislav Markov, Salvatore M. Amoroso, Fikru Adamu-Lema, Asen Asenov
2012 — —
Modeling of statistical variability in nanoscale charge-trap flash memories.
Salvatore M. Amoroso