Salvatore Lombardo

22 papers Journal 15Unranked 7
YearRankTypeTitle / Venue / Authors
2018 J jnl
Performance increase of tandem amorphous/microcrystalline Si PV devices under variable illumination and temperature conditions.
Microelectron. Reliab.
Fabio Ricco Galluzzo, A. Scuto, Cosimo Gerardi, A. Battaglia, Andrea Canino, Salvatore Lombardo
2017 — conf
Flexible CW-fNIRS system based on Silicon Photomultipliers: In-vivo characterization of sensorimotor response.
IEEE SENSORS
Antonio Maria Chiarelli, Filippo Zappasodi, Francesco di Pompeo, Arcangelo Merla, Massimo Mazzillo, Giorgio Fallica, Sebania Libertino, Salvatore Lombardo
2017 — conf
Silicon photomultipliers with embedded optical filters for wearable healthcare applications.
IEEE SENSORS
Massimo Mazzillo, Domenico Mello, Pietro Paolo Barbarino, Vincenzo Vinciguerra, Giorgio Fallica, Sebania Libertino, Antonella Sciuto, Salvatore Lombardo, Yuri Musienko
2017 — conf
Towards a nanofabricated vacuum cold-emitting triode.
SMACD
Davide Patti, Salvatore Pennisi, Salvatore Lombardo, Giuseppe Nicotra
2016 J jnl
Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks.
Microelectron. Reliab.
Felix Palumbo, Salvatore Lombardo, Moshe Eizenberg
2015 — conf
General features of progressive breakdown in gate oxides: A compact model.
IRPS
Felix Palumbo, Moshe Eizenberg, Salvatore Lombardo
2014 — conf
CY5 fluorescence measured with silicon photomultipliers.
BioCAS
Maria Francesca Santangelo, S. La Cono, P. Vasquez, Giorgio Fallica, Sabrina Conoci, A. C. Busacca, R. Pagano, Emanuele L. Sciuto, Salvatore Lombardo, Sebania Libertino
2014 — conf
Designing a Public Smart Registry for an Innovative and Transparent Governance of European Ground Infrastructures.
IDT/IIMSS/STET
Nunzio Casalino, Marisa Ciarlo, Salvatore Lombardo
2014 — conf
VIRGO: An Innovative Virtual Registry of Underground Infrastructure on Cloud.
EMTC
Salvatore Lombardo, Marisa Ciarlo, Nunzio Casalino
2010 J jnl
Radiation effects in nitride read-only memories.
Microelectron. Reliab.
Sebania Libertino, Domenico Corso, G. Murè, A. Marino, Felix Palumbo, Fabio Principato, G. Cannella, T. Schillaci, S. Giarusso, F. Celi, Michael Lisiansky, Yakov Roizin, Salvatore Lombardo
2009 J jnl
Feasibility Studies on Si-Based Biosensors.
Sensors
Sebania Libertino, Venera Aiello, Antonino Scandurra, Marcella Renis, Fulvia Sinatra, Salvatore Lombardo
2008 J jnl
A novel approach to characterization of progressive breakdown in high-k/metal gate stacks.
Microelectron. Reliab.
R. Pagano, Salvatore Lombardo, Felix Palumbo, Paul Kirsch, S. A. Krishnan, Chadwin D. Young, Rino Choi, Gennadi Bersuker, James H. Stathis
2008 J jnl
Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories.
IEEE Trans. Instrum. Meas.
Calogero Pace, Gino Giusi, Felice Crupi, Salvatore Lombardo
2007 J jnl
Defects induced anomalous breakdown kinetics in Pr
Microelectron. Reliab.
Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri, Salvatore Lombardo, Roberta G. Toro, Graziella Malandrino, Ignazio L. Fragalà
2007 J jnl
Guest Editorial.
Microelectron. Reliab.
Salvatore Lombardo
2007 J jnl
Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage.
Microelectron. Reliab.
Domenico Corso, S. Aurite, E. Sciacca, D. Naso, Salvatore Lombardo, A. Santangelo, M. C. Nicotra, S. Cascino
2007 J jnl
Study of nanocrystal memory integration in a Flash-like NOR device.
Microelectron. Reliab.
Cosimo Gerardi, Salvatore Lombardo, Giuseppe Ammendola, Giovanni Costa, Valentina Ancarani, Domenico Mello, Stella Giuffrida, Maria Cristina Plantamura
2005 J jnl
Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric.
Microelectron. Reliab.
Ester Spitale, D. Corso, Isodiana Crupi, Salvatore Lombardo, Cosimo Gerardi
2005 J jnl
Structure of the oxide damage under progressive breakdown.
Microelectron. Reliab.
Felix Palumbo, G. Condorelli, Salvatore Lombardo, Kin Leong Pey, C. H. Tung, L. J. Tang
2003 J jnl
Reliability of ultra-thin oxides in CMOS circuits.
Microelectron. Reliab.
James H. Stathis, Barry P. Linder, Rosana Rodríguez, Salvatore Lombardo
2002 J jnl
Analysis of the effect of the gate oxide breakdown on SRAM stability.
Microelectron. Reliab.
Rosana Rodríguez, James H. Stathis, Barry P. Linder, Steven P. Kowalczyk, Ching-Te Chuang, Rajiv V. Joshi, Gregory A. Northrop, Kerry Bernstein, Azeez J. Bhavnagarwala, Salvatore Lombardo
2002 J jnl
Dependence of Post-Breakdown Conduction on Gate Oxide Thickness.
Microelectron. Reliab.
Salvatore Lombardo, James H. Stathis, Barry P. Linder