Salvador Bracho

21 papers A 1B 1C 1Misc 1Journal 10Unranked 7
YearRankTypeTitle / Venue / Authors
2014 — conf
Modeling of faulty implantable MEMS pressure sensors.
ICM
Jose Angel Miguel, Yolanda Lechuga, Mar Martínez, Salvador Bracho
2013 J jnl
Behavioral model of folded and interpolated ADCs for test evaluation - Case study: Structural DfT method.
Microelectron. J.
Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
2011 C conf
Design-for-Test method for high-speed ADCs: Behavioral description and optimization.
DDECS
Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
2011 J jnl
Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor.
J. Electron. Test.
Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
2010 — conf
Structural DfT Strategy for High-Speed ADCs.
DoCEIS
Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
2010 — conf
Test Based on Built-In Current Sensors for Mixed-Signal Circuits.
DoCEIS
Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
2010 B conf
Test of embedded analog circuits based on a built-in current sensor.
ETS
Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
2007 — conf
Structural DfT Approach on Folded ADCs.
ICECS
Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
2005 — conf
Design of a Microelectronic Circuits Course Using Interactive Methods.
MSE
Mar Martínez, Salvador Bracho
2005 J jnl
Fault Detection in Switched Current Circuits Using Built-in Transient Current Sensors.
J. Electron. Test.
Yolanda Lechuga, Román Mozuelos, Miguel Angel Allende, Mar Martínez, Salvador Bracho
2005 J jnl
Power-mode-controlled power-factor corrector for electronic ballast.
IEEE Trans. Ind. Electron.
Francisco J. Azcondo, Christian Brañas, Rosario Casanueva, Salvador Bracho
2005 J jnl
Test of a switched-capacitor ADC by a built-in charge sensor.
Microelectron. J.
Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
2004 J jnl
Study of output power variation due to component tolerances in LC
IEEE Trans. Ind. Electron.
Christian Brañas, Francisco J. Azcondo, Salvador Bracho
2002 A conf
Built-In Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal Ics.
DATE
Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
2002 — conf
Hard-to-Detect Faults by Dinamic Current Sensor in Analogue Circuits.
LATW
Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
2001 — conf
On Line IC Test Course With Distance Access to Test Equipment.
LATW
Miguel Angel Allende, Román Mozuelos, Mar Martínez, Salvador Bracho
2000 J jnl
Contributions to the design and control of LC
IEEE Trans. Ind. Electron.
Christian Brañas, Francisco J. Azcondo, Salvador Bracho
1999 J jnl
A Method for Designing a Deterministic Test Pattern Generator Based on Cellular Automata.
J. Electron. Test.
María José López, Mar Martínez, Salvador Bracho
1996 J jnl
Signature analysis for fault detection of mixed-signal ICs based on dynamic power-supply current.
J. Electron. Test.
Javier Argüelles, Salvador Bracho
1995 Misc conf
Iddt testing of continuous-time filters.
VTS
Javier Argüelles, María José López, J. Blanco, Mar Martínez, Salvador Bracho
1990 J jnl
Arithmetical logical unit design for a processor with BILBO techniques: Functional simulation and test strategies.
Microprocessing and Microprogramming
M. Martinez, N. P. Cagigal, Salvador Bracho