Sagar S. Sabade

14 papers A 1Misc 5Journal 5Unranked 3
YearRankTypeTitle / Venue / Authors
2006 J jnl
Estimation of fault-free leakage current using wafer-level spatial information.
IEEE Trans. Very Large Scale Integr. Syst.
Sagar S. Sabade, D. M. H. Walker
2005 J jnl
IC Outlier Identification Using Multiple Test Metrics.
IEEE Des. Test Comput.
Sagar S. Sabade, Duncan M. Hank Walker
2004 Misc conf
Comparison of Effectiveness of Current Ratio and Delta-IDDQ Tests.
VLSI Design
Sagar S. Sabade, D. M. H. Walker
2004 J jnl
I
J. Syst. Archit.
Sagar S. Sabade, D. M. H. Walker
2004 J jnl
I
ACM Trans. Design Autom. Electr. Syst.
Sagar S. Sabade, D. M. H. Walker
2004 Misc conf
On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set.
VTS
Sagar S. Sabade, D. M. H. Walker
2003 — conf
CROWNE: Current Ratio Outliers with Neighbor Estimator.
DFT
Sagar S. Sabade, D. M. H. Walker
2003 Misc conf
Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification.
VLSI Design
Sagar S. Sabade, D. M. H. Walker
2003 Misc conf
Use of Multiple IDDQ Test Metrics for Outlier Identification.
VTS
Sagar S. Sabade, D. M. H. Walker
2002 Misc conf
Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing for Burn-in Reduction.
VTS
Sagar S. Sabade, D. M. H. Walker
2002 — conf
Evaluation of Statistical Outlier Rejection Methods for IDDQ Limit Setting.
ASP-DAC/VLSI Design
Sagar S. Sabade, D. M. H. Walker
2002 J jnl
IDDQ Test: Will It Survive the DSM Challenge?
IEEE Des. Test Comput.
Sagar S. Sabade, D. M. H. Walker
2002 — conf
Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis.
DFT
Sagar S. Sabade, D. M. H. Walker
2001 A conf
Improved wafer-level spatial analysis for I_DDQ limit setting.
ITC
Sagar S. Sabade, D. M. H. Walker