| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | C | conf |
DSD
|
| 2025 | — | conf |
CCMCC
|
| 2024 | Misc | conf |
VLSID
|
| 2024 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2024 | — | conf |
ATS
|
| 2023 | — | conf |
ASP-DAC
|
| 2023 | — | conf |
NEWCAS
|
| 2022 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2022 | C | conf |
VLSI-SoC
|
| 2022 | C | conf |
DSD
|
| 2020 | C | conf |
ISCAS
|
| 2019 | — | conf |
NANOARCH
|
| 2019 | — | conf |
ISVLSI
|
| 2018 | — | conf |
ISMVL
|
| 2018 | — | conf |
ISVLSI
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | — | — |
|
| 2017 | J | jnl |
Computer
|
| 2017 | A | conf |
GECCO
|
| 2017 | A | conf |
DATE
|
| 2017 | J | jnl |
Integr.
|
| 2016 | A* | conf |
DAC
|
| 2016 | — | conf |
GECCO (Companion)
|
| 2016 | A | conf |
DATE
|
| 2016 | C | conf |
DDECS
|
| 2015 | A | conf |
GECCO
|
| 2013 | J | jnl |
J. Electron. Test.
|