| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2012 | Misc | conf |
VTS
|
| 2012 | — | conf |
ASP-DAC
|
| 2011 | A | conf |
ITC
|
| 2011 | J | jnl |
IEEE Trans. Computers
|
| 2010 | A | conf |
ITC
|
| 2010 | Misc | conf |
Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy.
VTS
|
| 2009 | Misc | conf |
VTS
|
| 2008 | A | conf |
ITC
|
| 2005 | — | conf |
ISCAS (1)
|
| 2005 | J | jnl |
Int. J. Comput. Intell. Appl.
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2005 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2004 | — | conf |
HLDVT
|
| 2004 | — | conf |
Asian Test Symposium
|