| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | — | conf |
EWDTS
|
| 2024 | J | jnl |
Neural Networks
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2022 | J | jnl |
Neural Networks
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
Microelectron. J.
|
| 2021 | J | jnl |
Microelectron. J.
|
| 2020 | J | jnl |
Neurocomputing
|
| 2020 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2020 | J | jnl |
Microprocess. Microsystems
|
| 2019 | J | jnl |
Turkish J. Electr. Eng. Comput. Sci.
|
| 2019 | J | jnl |
IEEE Trans. Reliab.
|
| 2019 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2019 | J | jnl |
ACM Trans. Model. Perform. Evaluation Comput. Syst.
|
| 2018 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2018 | — | conf |
NoCArc@MICRO
|
| 2018 | J | jnl |
J. Syst. Archit.
|
| 2017 | C | conf |
DSD
|
| 2016 | C | conf |
DSD
|
| 2016 | J | jnl |
Ad Hoc Networks
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
Integr.
|
| 2016 | J | jnl |
Microprocess. Microsystems
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
J. Supercomput.
|
| 2016 | — | conf |
NoCArc@MICRO
|
| 2016 | A | conf |
DATE
|
| 2016 | J | jnl |
Statistical analysis of asynchronous pipelines in presence of process variation using formal models.
Integr.
|
| 2016 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
DFTS
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Integr.
|
| 2015 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2015 | J | jnl |
IET Comput. Digit. Tech.
|
| 2014 | — | conf |
DFT
|
| 2014 | Misc | conf |
VLSID
|
| 2014 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2014 | J | jnl |
Microprocess. Microsystems
|
| 2013 | — | conf |
DTIS
|
| 2013 | J | jnl |
Microprocess. Microsystems
|
| 2013 | J | jnl |
J. Real Time Image Process.
|
| 2013 | C | conf |
IECON
|
| 2013 | C | conf |
DDECS
|
| 2012 | — | conf |
INA-OCMC@HiPEAC
|
| 2012 | A | conf |
DATE
|
| 2012 | C | conf |
ICCD
|
| 2012 | C | conf |
IOLTS
|
| 2012 | — | conf |
IST
|
| 2012 | C | conf |
IJCCI
|
| 2012 | — | conf |
ICONIP (1)
|
| 2012 | C | conf |
DDECS
|
| 2012 | C | conf |
DSD
|
| 2011 | C | conf |
EUC
|
| 2010 | — | conf |
SoC
|
| 2010 | — | conf |
ISVC (2)
|
| 2010 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2010 | — | conf |
ISVLSI
|
| 2009 | Misc | conf |
ICASSP
|
| 2009 | Misc | conf |
VLSI Design
|
| 2009 | Misc | conf |
VLSI Design
|
| 2009 | — | conf |
ISVC (1)
|
| 2008 | C | conf |
ISCAS
|
| 2008 | C | conf |
IOLTS
|
| 2008 | C | conf |
ISCAS
|
| 2008 | J | jnl |
Microelectron. J.
|
| 2008 | — | conf |
SoC
|
| 2008 | C | conf |
IOLTS
|
| 2008 | A | conf |
DATE
|
| 2007 | J | jnl |
IEICE Electron. Express
|
| 2007 | C | conf |
DDECS
|
| 2007 | — | conf |
SoCC
|
| 2007 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2007 | — | conf |
DFT
|
| 2007 | J | jnl |
IEICE Electron. Express
|
| 2007 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2007 | C | conf |
AICCSA
|
| 2007 | C | conf |
DSD
|
| 2007 | — | conf |
ICECS
|
| 2006 | — | conf |
ICECS
|
| 2006 | J | jnl |
Integr.
|
| 2006 | — | conf |
ISDA (3)
|
| 2003 | — | conf |
ISCAS (5)
|
| 2003 | — | conf |
Asian Test Symposium
|