S. Saqib Khursheed

49 papers A 4B 5C 5Journal 23Unranked 11
YearRankTypeTitle / Venue / Authors
2021 — conf
An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults.
DFT
Anuraag Narang, Balaji Venn, S. Saqib Khursheed, Peter Harrod
2021 J jnl
Differential Aging Sensor Using Subthreshold Leakage Current to Detect Recycled ICs.
IEEE Trans. Very Large Scale Integr. Syst.
Turki Alnuayri, S. Saqib Khursheed, Antonio Leonel Hernández Martínez, Daniele Rossi
2021 A conf
Differential Aging Sensor to Detect Recycled ICs using Sub-threshold Leakage Current.
DATE
Turki Alnuayri, S. Saqib Khursheed, Antonio Leonel Hernández Martínez, Daniele Rossi
2021 C conf
IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs.
ISCAS
Srisubha Kalanadhabhatta, Rashi Dutt, S. Saqib Khursheed, Amit Acharyya
2020 J jnl
A Cost-Aware Framework for Lifetime Reliability of TSV-Based 3D-IC Design.
IEEE Trans. Circuits Syst.
Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed
2020 J jnl
LFSR generation for high test coverage and low hardware overhead.
IET Comput. Digit. Tech.
Leonel Hernández Martínez, S. Saqib Khursheed, Sudhakar M. Reddy
2020 C conf
Leveraging CMOS Aging for Efficient Microelectronics Design.
IOLTS
Antonio Leonel Hernández Martínez, S. Saqib Khursheed, Daniele Rossi
2020 — conf
Secure Scan Design with a Novel Methodology of Scan Camouflaging.
ECCTD
Srisubha Kalanadhabhatta, Kiran Kumar Anumandla, S. Saqib Khursheed, Amit Acharyya
2019 — conf
A Framework for TSV Based 3D-IC to Analyze Aging and TSV Thermo-Mechanical Stress on Soft Errors.
ITC-Asia
Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed
2019 — ch.
Fault Tolerance in 3D-ICs.
Security and Fault Tolerance in Internet of Things
Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed
2019 J jnl
Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems.
IET Comput. Digit. Tech.
Antonio Miele, Martin A. Trefzer, S. Saqib Khursheed
2018 J jnl
Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Vasileios Tenentes, Daniele Rossi, S. Saqib Khursheed, Bashir M. Al-Hashimi, Krishnendu Chakrabarty
2018 B conf
Recycled IC detection through aging sensor.
ETS
Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Sudhakar M. Reddy
2017 J jnl
A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs.
IEEE Trans. Very Large Scale Integr. Syst.
Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed
2017 J jnl
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure.
IEEE Trans. Very Large Scale Integr. Syst.
Vasileios Tenentes, Daniele Rossi, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, Steve R. Gunn
2017 J jnl
Improved Wire Length-Driven Placement Technique for Minimizing Wire Length, Area and Timing.
J. Low Power Electron.
Srinivas Sabbavarapu, Basireddy Karunakar Reddy, Amit Acharyya, S. Saqib Khursheed
2017 — conf
Welcome Message.
DFT
Rishad A. Shafik, Qiaoyan Yu, S. Saqib Khursheed, Antonio Miele
2016 C conf
Co-optimization of fault tolerance, wirelength and temperature mitigation in TSV-based 3D ICs.
VLSI-SoC
Yi Zhao, S. Saqib Khursheed, Bashir M. Al-Hashimi, Zhiwen Zhao
2016 J jnl
Guest Editors' Introduction: Robust 3-D Stacked ICs.
IEEE Des. Test
S. Saqib Khursheed, Pascal Vivet, Fabian Hopsch, Erik Jan Marinissen
2016 — conf
Reconfigurable hardware-software codesign methodology for protein identification.
EMBC
Venkateshwarlu Y. Gudur, Sandeep Thallada, Abhinay R. Deevi, Venkata Krishna Gande, Amit Acharyya, Vasundhra Bhandari, Paresh Sharma, S. Saqib Khursheed, Ganesh R. Naik
2016 J jnl
Reliable Power Gating With NBTI Aging Benefits.
IEEE Trans. Very Large Scale Integr. Syst.
Daniele Rossi, Vasileios Tenentes, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi
2015 C conf
Application-specific memory protection policies for energy-efficient reliable design.
RSP
Sheng Yang, Rishad A. Shafik, S. Saqib Khursheed, David Flynn, Geoff V. Merrett, Bashir M. Al-Hashimi
2015 C conf
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories.
IOLTS
Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi
2015 J jnl
DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Vasileios Tenentes, S. Saqib Khursheed, Daniele Rossi, Sheng Yang, Bashir M. Al-Hashimi
2015 B conf
Diagnosis of power switches with power-distribution-network consideration.
ETS
Vasileios Tenentes, Daniele Rossi, S. Saqib Khursheed, Bashir M. Al-Hashimi
2015 B conf
NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating.
ETS
Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi
2015 J jnl
Online Fault Tolerance Technique for TSV-Based 3-D-IC.
IEEE Trans. Very Large Scale Integr. Syst.
Yi Zhao, S. Saqib Khursheed, Bashir M. Al-Hashimi
2014 J jnl
Delay Test for Diagnosis of Power Switches.
IEEE Trans. Very Large Scale Integr. Syst.
S. Saqib Khursheed, Kan Shi, Bashir M. Al-Hashimi, Peter R. Wilson, Krishnendu Chakrabarty
2014 J jnl
Efficient Variation-Aware Delay Fault Simulation Methodology for Resistive Open and Bridge Defects.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi, Wei Zhao
2014 — conf
High Quality Testing of Grid Style Power Gating.
ATS
Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi, Shida Zhong, Sheng Yang
2013 — conf
Impact of PVT variation on delay test of resistive open and resistive bridge defects.
DFTS
Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi
2013 J jnl
Improved State Integrity of Flip-Flops for Voltage Scaled Retention Under PVT Variation.
IEEE Trans. Circuits Syst. I Regul. Pap.
Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, David Flynn, Geoff V. Merrett
2011 J jnl
A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi
2011 — conf
Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation.
Asian Test Symposium
Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Krishnendu Chakrabarty
2011 — conf
Cost-Effective TSV Grouping for Yield Improvement of 3D-ICs.
Asian Test Symposium
Yi Zhao, S. Saqib Khursheed, Bashir M. Al-Hashimi
2011 B conf
Improved DFT for Testing Power Switches.
ETS
S. Saqib Khursheed, Sheng Yang, Bashir M. Al-Hashimi, Xiaoyu Huang, David Flynn
2011 J jnl
Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, David Flynn, Sachin Idgunji
2010 J jnl
Gate-Sizing-Based Single V
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
S. Saqib Khursheed, Bashir M. Al-Hashimi, Krishnendu Chakrabarty, Peter Harrod
2010 A conf
Modeling the impact of process variation on resistive bridge defects.
ITC
S. Saqib Khursheed, Shida Zhong, Robert C. Aitken, Bashir M. Al-Hashimi, Sandip Kundu
2010 A conf
Scan based methodology for reliable state retention power gating designs.
DATE
Sheng Yang, Bashir M. Al-Hashimi, David Flynn, S. Saqib Khursheed
2009 J jnl
Diagnosis of Multiple-Voltage Design With Bridge Defect.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod
2009 J jnl
Process Variation-Aware Test for Resistive Bridges.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Urban Ingelsson, Bashir M. Al-Hashimi, S. Saqib Khursheed, Sudhakar M. Reddy, Peter Harrod
2009 A conf
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing.
DATE
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod
2008 B conf
Bridge Defect Diagnosis for Multiple-Voltage Design.
ETS
S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod
2008 J jnl
Bridging Fault Test Method With Adaptive Power Management Awareness.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
S. Saqib Khursheed, Urban Ingelsson, Paul M. Rosinger, Bashir M. Al-Hashimi, Peter Harrod
2007 J jnl
Efficient test compaction for combinational circuits based on Fault detection count-directed clustering.
IET Comput. Digit. Tech.
Aiman El-Maleh, S. Saqib Khursheed
2007 — conf
Resistive Bridging Faults DFT with Adaptive Power Management Awareness.
ATS
Urban Ingelsson, Paul M. Rosinger, S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod
2006 J jnl
Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Aiman H. El-Maleh, S. Saqib Khursheed, Sadiq M. Sait
2005 — conf
Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation.
Asian Test Symposium
Aiman H. El-Maleh, S. Saqib Khursheed, Sadiq M. Sait